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1.

図書

図書
edited by D. T. Clark and W. J. Feast
出版情報: Chichester ; New York : Wiley, c1978  xvi, 441 p. ; 24 cm
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2.

図書

図書
editors, Lawrence T. Drzal ... [et al.]
出版情報: Pittsburgh : Materials Research Society, 1995  ix, 254 p. ; 24 cm
シリーズ名: Materials Research Society symposium proceedings ; v. 385
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3.

図書

図書
editors, Benjamin M. DeKoven, Andrew J. Gellman, Robert Rosenberg
出版情報: Pittsburgh, Pa. : Materials Research Society, c1989  xiii, 426 p. ; 24 cm
シリーズ名: Materials Research Society symposium proceedings ; v. 153
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4.

図書

図書
Buddy D. Ratner, editor, Vladimir V. Tsukruk, editor
出版情報: Washington, DC : American Chemical Society, c1998  xii, 367 p. ; 24 cm
シリーズ名: ACS symposium series ; 694
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目次情報: 続きを見る
Preface
Introduction
Scanning Probe Microscopy in Polymers: Introductory Notes / Ren'e M. Overney ; Vladimir V. Tsukruk1:
Polymer Morphology and Structure: Crystals to Fibers
Morphology, Folding, and the Structure of Polymer Single Crystals / D. H. Reneker ; I. Chun2:
Atomic Force Investigations of Epitaxially Crystallized Tactic Poly(propylenes / Wolfgang Stocker et al3:
Morphology Chain Packing, and Conformation in Uniaxially Oriented Polymers Studied / Scanning Force Microscopy ; G. J. Vansco ; H. Sch"onherr ; D. Sn'etivy4:
The Formation of Fibrillar Structures from Biopolymers / M. C. Goh et al5:
Polymer Morphology and Structure: Composites and Biopolymers
Deformation Induced Changes in Surface Properties of Polymers Investigated by Scanning Force Microscopy / S. Hild ; A. Rosa ; O. Marti6:
Scanning Probe Microscopy: a Useful Tool for the Analysis of Carbon Black-Filled Polymer Blends / Ph. Lecl`ere et al7:
Effect of Thermal and Solvent Treatments upon Thermoplastic Olefin Surface Morphology and Composition Studied with Surface-Sensitive Techniques / M. P. Everson ; M. Mikulec ; P. Schmitz8:
Scanning Force Microscopy of Conjugated Anisotropic Thin Films Grown in High-Vacuum / Fabio Biscarini9:
Atomic Force Microscopy of Soft Samples / Gelatin and Living Cells ; Jan Domke et al10:
Atomic Force-, Confocal Laser Scanning-, and Scanning Electron Microscopy Characterization of the Surface Degradation of a Polymer, Ch / Bourban et al.11:
Polymer Morphology and Structure: Molecular Films and Interfaces
Scanning Force Microscopy of Surface Structure and Surface Mechanical Properties of Organotrichlorosilane Monolayers Prepared / Langmuir Method ; Atsushi Takahara et al12:
Optical and Structural Properties of Langmuir-Blodgett Films at the Air-Water and the Air-Solid Interface / L. M. Eng13:
Atomic Force Microscopy of Langmuir-Blodgett Films Polymerized as a Floating Monolayer / Jouko Peltonen ; Tapani Viitala14:
Probing of Local Surface Properties of Polymers
Quantitative Probing in Atomic Force Microscopy of Polymer Surfaces / Valery N. Bliznyuk et al15:
Stretching a Network of Entangled Polymer Chains with a Nanotip / 16:
Correlating Polymer Viscoelastic Properties with Friction Measures by Scanning Probe Microscopy / Jon A. Hammerschmidt et al17:
SPM Techniques: Current Trends
Resolution Limits of Force Microscopy / R. L"uthi et al18:
Chemical Force Microscopy: Probing and Imaging Interactions between Functional Groups / Dmitri V. Vezenov ; Aleksandr Noy ; Charles M. Lieber19:
pH Variations of Surface Forces as Probed by Chemically Modified Tips / Valery N. Bliznyuk ; John Wu20:
Recognition and Nanolithography with the Atomic Force Microscope / T. Boland et al21:
Indexes
Author Index
Subject Index
Preface
Introduction
Scanning Probe Microscopy in Polymers: Introductory Notes / Ren'e M. Overney ; Vladimir V. Tsukruk1:
5.

図書

図書
edited by Edward Sacher
出版情報: New York : Kluwer Academic/Plenum Publishers, 2002-  v.
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目次情報: 続きを見る
New Instrumentation
Surface Analysis Using Confocal Raman Micro-spectroscopy / C. Hyett ; D.-Q. Yang ; T.H. Ellis ; E. Sacher1.:
Ellipsometric Characterization of the Optical Constants of Metals: Thin Film versus Nanoparticle / D. Dalacu ; L. Martinu2.:
Ultra Thin Film Analysis Using the Thermo VG Scientifics Thetaprobe Instrument / R.K. Champaneria ; J. Wolstenholme3.:
Nanoindentation of Microsprings and Microcantilevers / M. Seto ; B. Dick ; M. Brett4.:
Low Permittivity Materials
Physical and Interfacial Properties of Low Permittivity Polymers: Cyclotene, SiLK and Ultra-Low K / D. Frye ; J.J. Waeterloos ; M. Simmonds ; T. Stokich ; J. Im5.:
Mechanical Properties of Cured Silk Low-K Dielectric Films / P.H. Townsend ; J. Curphy ; C. Karas ; E.O. Shaffer II6.:
Plasma-Polymerized Fluoropolymer Thin Films for Microelectronic Applications / M. Silverstein ; R. Chen ; L. Sandrin7.:
Polymer Metallization
Fundamental Aspects of Polymer Metallization / F. Faupel ; V. Zaporojtchenko ; T. Strunskus ; J. Erichsen ; K. Dolgner ; A. Thran ; M. Keine8.:
The Study of Copper Clusters on Dow Cyclotene and Their Stability / 9.:
Adsorption of Noble Metal Atoms on Polymers / J. Zekonyte10.:
Nucleation and Growth of Vapor-Deposited Metal Films on Self-Assembled Monolayers Studied by Multiple Characterization Probes / A.V. Walker ; G.L. Fisher ; A.E. Hooper ; T. Tighe ; R. Opila ; N. Winograd ; D.L. Allara11.:
Barrier Layers
Morphological Investigations of Low-k Polymer/Diffusion Barrier Interfaces for IC Metallization / S. Sankaran ; R.E. Geer12.:
Chemistry in the Initial Formation of Nitride Barriers on Low-K Dielectrics / P. Abramowitz ; J. Liu ; P.S. Ho13.:
Capabilities and Limitations of RBS to Characterize Hyper-Thin Silicon Compound on Various Polymeric Substrates / G. Dennler ; A. Houdayer ; P. Raynaud ; Y. Segui ; M.R. Wertheimer14.:
Adhesion Enhancement
Surface Modifications by Ion-Assisted Reactions / S.K. Koh ; J.S. Cho ; S. Han ; K.H. Kim ; Y.W. Beag15.:
Plasma and VUV Pretreatments of Polymer Surfaces for Adhesion Enhancement of Electrolessly Deposited Ni or Cu Films / M. Romand ; M. Charbonnier ; Y. Goepfert16.:
Index
New Instrumentation
Surface Analysis Using Confocal Raman Micro-spectroscopy / C. Hyett ; D.-Q. Yang ; T.H. Ellis ; E. Sacher1.:
Ellipsometric Characterization of the Optical Constants of Metals: Thin Film versus Nanoparticle / D. Dalacu ; L. Martinu2.:
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