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1.

図書

図書
editors, John Cumings ... [et al.]
出版情報: Warrendale, Pa. : Materials Research Society , Cambridge ; New York : Cambridge University Press, 2011  xi, 205 p. ; 24 cm
シリーズ名: Materials Research Society symposium proceedings ; v. 1318
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Preface
Acknowledgments
Materials Research Society Symposium Proceedings
AdVanced Imaging And Scattering Techniques For In Situ Studies
In situ Imaging at the NIST Neutron Imaging Facility / David L. Jacobson ; Daniel S. Hussey ; Eli Baltic
Low Energy Ne Scattering Spectroscopy for Insulators, and Materials in the Electric/Magnetic Fields / Kenji Umezawa ; Shigemitsu Nakanishi ; Hideki Hayashi ; Hideaki Higashitsutsumi ; Hiroki Nagasawa ; Eisuke Narihiro ; and Keiko Ogai
Electron Phase Microscopy of Magnetic Fields in Ferromagnets and Superconductors / Akira Tonomura
Effect of Oxygen Pressure on the Initial Oxidation Behavior of Cu and Cu-Au Alloys / Langli Luo ; Yihong Kang ; Zhenyu Liu ; Judith C. Yang ; Guangwen Zhou
Automated Crystallite Orientation and Phase Mapping in a Transmission Electron Microscope / Sergei Rouvimov ; Peter Moeck ; Ines Häusler ; Wolfgang Neumann ; Stavros Nicolopoulos
In Situ X-Ray Synchrotron Radiation Spectroscopies In Energy-Related Materials Science And Heterogeneous Catalysis
Electronic Structures of Non-Pt Carbon Alloy Catalysts for Polymer Electrolyte Membrane Fuel Cells Revealed by Synchrotron Radiation Analyses / Masaharu Oshima ; Hideharu Niwa ; Makoto Saito ; Masaki Kobayashi ; Koji Horiba ; Yoshihisa Harada ; Kiyoyuki Terakura ; Takashi Ikeda ; Jun-ichi Ozaki ; Yuta Nabae ; Seizo Miyata
Quantum Rods and Dots-based Structures & Devices: Low Cost Aqueous Synthesis and Bandgap Engineering for Solar Hydrogen and Solar Cells Applications / Lionel Vayssieres
Real-Time Studies Of Evolving Thin Films And Interfaces
Formation of Irregular Al Islands by Room-Temperature Deposition on NiAl(110) / Dapeng Jing ; Yong Han ; Baris ; Ünal ; J.W. Evans ; P.A. Thiel
In-situ TEM Observation of Formation-Retraction-Fracture Experiment of Liquid-Like Silicon Nanocontact / Tadashi Ishida ; Kuniyuki Kakushima ; Hiroyuki Fujita
Observation of Real-Time Thin Film Evolution Using Microcantilever Sensors / Alan M. Schilowitz ; Dalia G. Yablon
X-Ray Study of Strained and Strain Balanced Superlattice Material / Natee Johnson ; Ruth Choa ; Liwei Cheng ; Fow-Sen Choa
In-situ XRD and FIB Microscopy Studies of the Dynamics of Intermetallic Phase Formation in Thin Layer Cu/Sn Films for Low-temperature Isothermal Diffusion Soldering / Harald Etschmaier ; Jirí Novák ; Hannes Eder ; Peter Hadley
Stochastic Models of Epitaxial Growth / Dionisios Margetis ; Paul N. Patrone ; T.L. Einstein
Characterisation of Organic Semiconductor Growth using Real-time Electron Spectroscopy / D. Andrew Evans ; Owain R. Roberts ; Gruffudd T. Williams ; David P. Langstaff
The Electrical Conduction at Early Stages of Cluster-Assembled Films Growth / Emanuele Barborini ; Gabriele Corbelli ; Paolo Milani
Spreading Kinetics at a Molecular Level / Jean-Luc Buraud ; Olivier Noel ; Dominique Ausserre
Novel Development And Applications Of Scanning Probe Microscopy
Multiparameter Imaging and Understanding the Role of the Tip - Atomic Resolution Images of Rutile Ti02 (110) / S.J. O'Brien ; H. Ozgur Ozer ; G.L.W. Cross ; J.B. Pethica
Experimental and Theoretical Study of the New Image Force Microscopy Principle / H. Kumar Wickramasinghe ; Indrajith Rajapaksa
Crystallographic Processing of Scanning Tunneling Microscopy Images of Cobalt Phthalocyanines on Silver and Graphite / P. Moeck ; J. Straton ; M. Toader ; M. Hietschold
Scanning Thermal Lithography as a Tool for Highly Localized Nanoscale Chemical Surface Functionalization / Joost Duvigneau ; Holger Schönherr ; G. Julius Vancso
Digital Pulsed Force Mode AFM and Confocal Raman Microscopy in Drug-Eluting Coatings Research / G. Haugstad ; K. Wormuth
Measurement of Piezoelectric Transverse and Longitudinal Displacement with Atomic Force Microscopy for PZT Thick Films / Yuta Kashiwagi ; Takashi Iijima ; Tom Aiso ; Takashi Yamamoto ; Ken Nishida ; Hiroshi Funakubo ; Takashi Nakajima ; Soichiro Okamura
Circular AFM Mode: A New AFM Mode for Investigating Surface Properties / Pierre-Emmanuel Mazeran ; Hussein Nasrallah
Scanning Probe Microscopy with Diamond Tip in Tribo-nanolithography / Oleg Lysenko ; Vladimir Grushko ; Evgeni Mitskevich ; Athanasios Mamalis
Photoinduced Temporal Change of Surface-Potential Undulation on AIq3 Thin Films Observed by Kelvin Probe Force Microscopy / Kazunari Ozasa ; Hiromi Ito ; Mizuo Maeda Masahiko Hara
Atomic force microscopy based quantitative mapping of elastic moduli in phase separated polyurethanes and silica reinforced rubbers across the length scales / Peter Schön ; Kristóf Bagdi ; Molnár ; Patrick Markus ; Saurabh Dutta ; Morteza Shirazi ; Jacques Noordermeer ; Béla Pukánszky
In Situ Chemical Functionalization of a Single Carbon Nanotube Functionalized AFM Tip using a Correlated Optical and Atomic Force Microscope / Ifat Kaplan-Ashiri ; Eric J. Titus ; Katherine A. Willets
Author Index
Subject Index
Preface
Acknowledgments
Materials Research Society Symposium Proceedings
2.

図書

図書
Raju V. Datla, Leonard M. Hanssen, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash., USA : SPIE, c1998  vi, 270 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3425
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3.

図書

図書
Leonard M. Hanssen, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash., USA : SPIE, c2000  ix, 188 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4103
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4.

図書

図書
sponsored by ASTM Committee E-42 on Surface Analysis, American Society for Testing and Materials, Cleveland, Ohio, 28 Feb.-1 March, 1978 ; T. L. Barr, L. E. Davis, editors
出版情報: Philadelphia, Pa. : ASTM, c1980  207 p. ; 24 cm
シリーズ名: ASTM special technical publication ; 699
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5.

図書

図書
guest editors, B. Lindman, G. Olofsson, and P. Stenius
出版情報: Darmstadt : Steinkopff, c1985  126 p. ; 28 cm
シリーズ名: Progress in colloid & polymer science ; vol. 70
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6.

図書

図書
sponsored by ASTM Subcommittee E02.02 on Surface Analysis of ASTM Committee E-2 on Emission Spectroscopy, American Society for Testing and Materials, Cleveland, Ohio, 4 March 1975 ; R. S. Carbonara and J. R. Cuthill, editors
出版情報: Philadelphia : ASTM, 1976  148 p. ; 23 cm
シリーズ名: ASTM special technical publication ; 596
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7.

図書

図書
Guest editors, Peter Mark and Jules D. Levine
出版情報: Amsterdam : North-Holland Pub. Co., 1971  223 p ; 25 cm
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8.

図書

図書
R.F. Howe, R.N. Lamb, K. Wandelt, (eds.)
出版情報: Berlin ; Tokyo : Springer-Verlag, c1993  xii, 301 p. ; 25 cm
シリーズ名: Springer proceedings in physics ; v. 73
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