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1.

図書

図書
Aftab A. Mufti, Andrew L. Gyekenyesi, Peter J. Shull, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cosponsored by ASME--American Society of Mechanical Engineers ; cooperating organizations, Intelligent Materials Forum (Japan), Jet Propulsion Laboratory (USA), National Science Foundation (USA)
出版情報: Bellingham, Wash. : SPIE, c2006  1 v. (various pagings) ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 6176
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2.

図書

図書
Aaron A. Diaz ... [et al.], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash. : SPIE, c2005  v, 172 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 5769
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3.

図書

図書
Steven R. Doctor, Yoseph Bar-Cohen, A. Emin Aktan, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash. : SPIE, c2003  viii, 146 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 5048
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4.

図書

図書
Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash., USA : SPIE, c2005  ix, 214 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 5770
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5.

図書

図書
Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cosponsored by ASME--American Society of Mechanical Engineers (USA) ; cooperating organizations, Intelligent Materials Forum (Japan), Jet Propulsion Laboratory (USA), [and] National Science Foundation (USA)
出版情報: Bellingham, Wash. : SPIE, c2006  1 v. (various pagings) ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 6179
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6.

図書

図書
[edited by] Shiraz D. Tayabji and Erland O. Lukanen
出版情報: West Conshohocken, PA : ASTM, 2000  x, 535 p. ; 24 cm
シリーズ名: ASTM special technical publication ; 1375
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目次情報: 続きを見る
Overview
Pavement Testing and Backcalculation Technologies--Challenges for the 21[superscript st] Century / J. P. Mahoney
Will Nonlinear Backcalculation Help? / P. Ullidtz
Integrating Ground Penetrating Radar and Falling Weight Deflectometer Technologies in Pavement Evaluation / T. Scullion ; T. Saarenketo
Deflection Testing and Backcalculation of AC Pavements
Small-scale Dynamic Devices for the Measurement of Elastic Stiffness Modulus on Pavement Foundations / P. R. Fleming
Nevada's Approach to the Backcalculation Process / P. E. Sebaaly ; S. Bemanian ; S. Lani
Evaluation of Laboratory Determined and Nondestructive Test Based Resilient Modulus Values from WesTrack Experiment / S. Seeds ; S. Alavi ; W. Ott ; M. Mikhail ; J. Mactutis
Prediction of Pavement Deterioration Based on FWD Results / J. W. Maina ; H. Yokota ; D. A. Mfinanga ; S. Masuda
Deflection Testing and Backcalculation--Seasonal Variations
Variations in Backcalculated Pavement Layer Moduli in LTPP Seasonal Monitoring Sites / R. C. Briggs ; E. O. Lukanen
Seasonal Variations in Backcalculated Pavement Layer Moduli in Minnesota / J. M. Ovik ; B. Birgisson ; D. E. Newcomb
Seasonal Trends and Causes in Pavement Structural Properties / H. Ali ; O. Selezneva
Comparison of Backcalculated and Laboratory Measured Moduli on AC and Granular Base Layer Materials / H. Zhou
DCP Testing
Comparison of the Dynamic Cone Penetrometer with Other Tests During Subgrade and Granular Base Characterization in Minnesota / J. A. Siekmeier ; D. Young ; D. Beberg
The Israeli Experience with the Regular and Extended Dynamic Cone Penetrometer for Pavement and Subsoil-Strength Evaluation / M. Livneh ; N. A. Livneh ; I. Ishai
Use of Instrumented Dynamic Cone Penetrometer in Pavement Characterization / S. Nazarian ; V. Tandon ; K. Crain ; D. Yuan
Deflection Testing and Backcalculation--PCC Pavements
Characterization of Transverse Cracks in Jointed Concrete Pavements (JCP's) Using Nondestructive Test (NDT) Methods / M. A. Frabizzio ; N. J. Buch
LTPP Rigid Pavement FWD Deflection Analysis and Backcalculation Procedure / L. Khazanovich ; T. J. Mcpeak ; S. D. Tayabji
Closed-Form and Semi-Closed-Form Algorithms for Backcalculation of Concrete Pavement Parameters / T. F. Fwa ; K. H. Tan ; S. Li
Evaluation of Concrete Pavement Conditions and Design Features Using LTPP FWD Deflection Data / Y. J. Jiang
GPR and Newer NDT
A New Backcalculation Procedure Based on Dispersion Analysis of FWD Time-History Deflections and Surface Wave Measurements Using Artificial Neural Networks / Y. R. Kim ; B. Xu ; Y. Kim
Pavement Characterization Using Ground Penetrating Radar: State of the Art And Current Practice / K. R. Maser
Seismic Pavement Analyzer Vs. Falling Weight Deflectometer for Pavement Evaluation: Comparative Study / K. Tawfiq ; J. Armaghani ; J. Sobanjo
Use of Seismic Pavement Analyzer in Forensic Studies in Texas / M. Mcdaniel ; D. H. Chen
Dynamic Analysis of Deflection Data
Effect of Frequency-dependent Asphalt Concrete Layer Moduli on Pavement Response / K. Chatti ; Tk. Kim
Use of Multifrequency Backcalculation for Determining Moduli of a Pavement Structure / Y. V. Kang
Dynamic Analysis of FWD Test Results for Rigid Pavements
Dynamic Backcalculation and Overlay Design Based on FWD Data
Rolling Weight Deflectometer
Continuous Profiling of Flexible and Rigid Highway and Airport Pavements With the Rolling Dynamic Deflectometer / J. A. Bay ; K. H. Stokoe, II
A Comparison of the Rolling Weight Deflectometer with the Falling Weight Deflectometer / R. F. Johnson ; R. N. Stubstad ; L. Pierce
Development of a Laser-Based High Speed Deflectograph / G. Hildebrand ; S. Rasmussen ; R. Andres
Comparative Studies of Backcalculated Results from FWDs with Different Loading Duration / K. Matsui ; Y. Kikuta ; T. Nishizawa ; A. Kasahara
Noteworthy Papers not presented at Symposium
Prediction of Remaining Life of Flexible Pavements with Artificial Neural Networks Models / I. Abdallah ; C. Ferregut ; O. M. Lucero
Estimation of Design Season Modulus for Overlay Design / N. M. Jackson ; J. W. Andrew ; E. C. Drumm
Flexible Pavement Condition Evaluation Using Deflection Basin Parameters And Dynamic Finite Element Analysis Implemented by Artificial Neural Networks / Y.-C. Lee ; S. R. Ranjithan
Author Index
Subject Index
Overview
Pavement Testing and Backcalculation Technologies--Challenges for the 21[superscript st] Century / J. P. Mahoney
Will Nonlinear Backcalculation Help? / P. Ullidtz
7.

図書

図書
editors, George Y. Baaklini ... [et al.]
出版情報: Warrendale, Pa. : Materials Research Society, c2000  xiii, 322 p. ; 24 cm
シリーズ名: Materials Research Society symposium proceedings ; v. 591
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Preface
Acknowledgments
Materials Research Society Symposium Proceedings
Process Control and Deformation Behavior VIA X-ray Techniques
Optimization of X-ray Techniques for Nondestructive Characterization of Single Crystal Turbine Blades / J.M. Winter, Jr. ; K.G. Lipetzky ; R.E. Green, Jr.
In Situ Observation of Oxidization Process at the Most Upper Surfaces by X-ray Surface Propagation Waves / Toshihisa Horiuchi ; Kenji Ishida ; Kazumi Matsushige
Three-Dimensional, Nondestructive Imaging of Low Density Materials / J.H. Kinney ; D.L. Haup ; J.D. Lemay
Image-Guided Failure Assessment of Porous Materials / M. Tantillo ; R. Muller
X-ray Microtomography of Fatigue Crack Closure as a Function of Applied Load In Al-Li 2090 T8E41 Samples / R. Morano ; S.R. Stock ; G.R. Davis ; J.C. Elliott
Interfacial Diffusion in a MOCVD Grown Barium Titanate Film / A. Datta ; Soma Chattopadhyay ; A.G. Richter ; J. Kmetko ; C.B. Lee
High-Frequency Stroboscopic X-ray Topography Under Surface Acoustic Wave Excitation / E. Zolotoyabko
NDE for Fracture Fatigue and Corrosion
Scanning Acoustic Microscopy and X-ray Diffraction Investigation of Near Crack Tip Stresses / S. Sathish ; R.W. Martin
Development of Nondestructive Method for Prediction of Crack Instability / J.L. Schroeder ; D. Eylon ; E.B. Shell ; T.E. Matikas
Nondestructive Characterization of Corrosion Protective Coatings on Aluminum Alloy Substrates / J. Hoffmann ; M. Khobaib ; N. Meyendorf ; U. Netzelmann
Nondestructive Evaluation of Fatigue in Titanium Alloys / H. Rosner
Real-Time Monitoring of Acoustic Linear and Nonlinear Behavior of Titanium Alloys During Cyclic Loading / J. Frouin ; J. Maurer ; J.K. Na
Electric and Dielectric NDE
Impedance Spectroscopy Investigation on the Low-Temperature Degradation of Tetragonal Zirconia: Influence of Measurement Conditions / A.P. Santos ; R.Z. Domingues
Electrically Based Non-Destructive Microstructural Characterization of All Classes of Materials / Rosario A. Gerhardt
Non-Destructive Dielectric Assessment of Water Permeation in Composite Structures / P. Boinard ; E. Boinard ; R.A. Pethrick ; W.M. Banks ; R.L. Crane
Nondestructive Damage Evaluation of Electro-Mechanical Components Using a Hybrid, Computational and Experimental Approach / C. Furlong ; R.J. Pryputniewicz
Structure-Sensitive Properties for NDE Characterization
The Role of Structure-to-Property-Relationships in Materials Characterization / W. Morgner
Nonlinear Ultrasonic Parameter in Precipitate-Hardened Steels / D.C. Hurley ; D. Balzar ; P.T. Purtscher
Infrared Evaluation of Heat Generation During the Cyclic Deformation of a Cellular Al Alloy / A. Rabiei ; J.W. Hutchinson ; A.G. Evans
Microscopic Techniques for Characterization of Magnetic Layers / I. Altpeter ; W. Nichtl-Pecher ; H. Grimm
Giant Magnetoresistance Imaging for NDE of Conductive Materials / E.S. Boltz ; S.G. Albanna ; A.R. Stallings ; Y.H. Spooner ; J.P. Abeyta
Non-Destructive Evaluation of Mechanical Properties of Magnetic Materials / Kevin P. Kankolenski ; Susan Z. Hua ; David X. Yang ; G.E. Hicho ; L.J. Swartzendruber ; Z. Zang ; Harsh Deep Chopra
Non-Destructive Evaluation of 304 Stainless Steels Using a Scanning Hall-Sensor Microscope: Visualization of Strain-Induced Austenite-Phase Breakdown / A. Oota ; K. Miyake ; D. Sugiyama ; H. Aoki ; 163
Dual Band Infrared Thermography as a NDT Tool for the Characterization of the Building Materials and Conservation Performance in Historic Structures / A. Moropoulou ; N.P. Avdelidis ; M. Koui ; N.K. Kanellopoulos
Characterization of Hydrogen in Concrete by Cold Neutron Prompt Gamma-Ray Activation Analysis and Neutron Incoherent Scattering / Rick L. Paul ; H. Heather Chen-Mayer ; Richard M. Lindstrom ; Menno Blaauw
NDE For Silicon Wafers and Thin Films
Quantitative Contact Spectroscopy and Imaging by Atomic-Force Acoustic Microscopy / W. Arnold ; S. Amelio ; S. Hirsekorn ; U. Rabe
Precise Determination of Thin Metal Film Thickness With Laser-Induced Acoustic Grating Technique / A.A. Maznev ; M.J. Banet ; M. Gostein ; R.B. Hanselman ; M.A. Joffe ; R. Sacco ; K.A. Nelson
Quantitative Measurement of Local Carrier Concentration of Semiconductor From Displacement Current-Voltage Curve Using a Scanning Vibrating Tip / Yutaka Majima ; Yutaka Oyama ; Mitsumasa Iwamoto
Characterization of Nitrided Silicon-Silicon Dioxide Interfaces / M.L. Polignano ; M. Alessandri ; D. Brazzelli ; B. Crivelli ; G. Ghidini ; R. Zonca ; A.P. Caricato ; M. Bersani ; M. Sbetti ; L. Vanzetti ; G.C. Xing ; G.E. Miner ; N. Astici ; S. Kuppurao ; D. Lopes
IR Tomography of the Lifetime and Diffusion Length of Charge Carriers in Semiconductor Silicon Ingots / V.D. Akhmetov ; N.V. Fateev
Monitoring Silicon Quality From Diffusion Furnaces Using In-Line Measurements / Matt Stoker ; Kelvin Catmull ; Greg Horner ; Brian Letherer
Small Signal AC-Surface Photovoltage Technique for Non-Contact Monitoring of Near Surface Doping and Recombination-Generation in the Depletion Layer / D. Marinskiy ; J. Lagowski ; M. Wilson ; A. Savtchouk ; L. Jastrzebski ; D. DeBusk
Method and Instrumentation for Nondestructive Characterization of Surface Area and Pore Size Distribution of Thin Films in Their Deposited State / D.J. Taylor
Experimental Simulation of Contamination Arising From Electro Rocket Engine-Jet on Surface of Spacecraft Units / A. Chirov ; A. Nadiradze ; V. Shaposhnikov ; V. Egorov
Thermal Penetration Times as a Nondestructive Measure of Orientation in Polyimide Film / C. Chandler ; N.E. Mathis ; R.J. Samuels
Photoelastic Imaging of Process Induced Defects in 300mm-Silicon Wafers / H.D. Geiler ; W. Kurner ; O. Storbeck
IRS and ESR Characterizations of Nanocomposite Thin Films Derived From Alkanethiolates and Gold Nanoparticles / W.X. Zheng ; F.L. Leibowitz ; M.M. Maye ; D.C. Gilbert ; D.C. Doetschman ; C.J. Zhong
Optical and Infrared Techniques
In Situ Spectroscopic Ellipsometry for the Real Time Process Control of Plasma Etching of Silicon Nitride / I.G. Rosen ; T. Parent ; B. Fidan ; A. Madhukar
Characterization of Ni- and Ni(Pt)-Silicide Formation on Narrow Polycrystalline Si Lines by Raman Spectroscopy / P.S. Lee ; D. Mangelinck ; K.L. Pey ; J. Ding ; T. Osipowicz ; C.S. Ho ; G.L. Chen ; L. Chan
Raman Characterization of Composition and Strain in Si[subscript 1-x]Ge[subscript x]/Si Heterostructures / Ran Liu ; B. Tillack ; P. Zaumseil
Nondestructive Measurement of In-Plane Residual Stress in Silicon Strips / Tieyu Zheng ; Steven Danyluk
Characterization of Copper Surfaces Used in Electronic Circuit Boards by Reflectance FT-IR / James M. Sloan ; Charles G. Pergantis
In Situ Spectroscopic Ellipsometry Study of the Oxide Etching and Surface Damaging Processes on Silicon Under Hydrogen Plasma / I.M. Vargas ; J.Y. Manso ; J.R. Guzman ; B.R. Weiner ; G. Morell
In Situ Monitoring of MOCVD of Aluminum Nitride by Optical Spectroscopies / S.C. Allen ; H.H. Richardson
Real-Time Optical Characterization and Control of Heteroepitaxial Ga[subscript x]In[subscript 1-x]P Growth by P-Polarized Reflectance / N. Dietz ; K. Ito ; I. Lauko ; V. Woods
Nondestructive Characterization of GaN Films Grown at Low and High Temperatures / C.H. Yan ; H.W. Yao ; J.M. Van Hove ; A.M. Wowchak ; P.P. Chow ; J. Han ; J.M. Zavada
Author Index
Subject Index
Preface
Acknowledgments
Materials Research Society Symposium Proceedings
8.

図書

図書
sponsored by the Pressure Vessels and Piping Division, Materials and Fabrication Committee ... [et al.] ; contributing editors, C.E. Jaske ... [et al.] ; volume coordinating editor, C.E. Jaske ; general proceedings editor, S.J. Brown
出版情報: New York, N.Y. : American Society of Mechanical Engineers, c1985  ix, 284 p. ; 28 cm
シリーズ名: Proceedings of the 1985 Pressure Vessels and Piping Conference : presented at the 1985 Pressure Vessels and Piping Conference and Exhibition, New Orleans, Louisiana, June 23-26, 1985 / sponsored by Pressure Vessels and Piping Division ; general proceedings editor, S.J. Brown ; v. 1
PVP ; vol. 98-1
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9.

図書

図書
sponsored by the Pressure Vessels and Piping Division, ASME ; edited by Chiaki Miyasaka
出版情報: New York, N.Y. : American Society of Mechanical Engineers, c2003  vi, 163 p. ; 28 cm
シリーズ名: PVP ; v. 456
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10.

図書

図書
sponsored by the Pressure Vessels and Piping Division, ASME ; principal editor, Frederick W. Brust ; contributing editors, Pingsha Dong ... [et al.]
出版情報: New York, N.Y. : American Society of Mechanical Engineers, c2003  vii, 239 p. ; 28 cm
シリーズ名: PVP ; v. 464
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