>> Google Books
所蔵情報QRコード

Microindentation techniques in materials science and engineering : a symposium / sponsored by ASTM Committee E-4 on Metallography and by the International Metallographic Society, Philadelphia, PA, 15-18 July 1984 ; Peter J. Blau and Brian R. Lawn, editors

資料種別:
図書
出版情報:
Philadelphia, PA : International Metallographic Society : American Society for Testing and Materials, c1985
形態:
303 p. ; 24 cm
シリーズ名:
ASTM special technical publication ; 889 <BA00068096>
著者名:
ISBN:
9780803104419 [0803104413]
書誌ID:
BA0115784X
子書誌情報
Loading
フルテキスト
Loading contents information
所蔵情報
Loading availability information
他の版・巻

類似資料:

American Society for Testing and Materials. Committee E-4 on Metallography, International Metallographic Society

ASTM : IMS

International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in …

SPIE

Abrams, Halle, Maniar, G. N., American Society for Testing and Materials. Committee E-4 on Metallography, Symposium on …

The Society

Symposium on Stereology and Quantitative Metallography, American Society for Testing and Materials. Subcommittee 11 on …

American Society for Testing Materials

International Workshop on New Approaches to High-Tech Materials--Nondestructive Testing and Computer Simulations in …

SPIE

Symposium on Applications of Modern Metallographic Techniques, American Society for Testing and Materials. Committee E-4 …

American Society for Testing and Materials

American Society for Testing and Materials. Committee E-28 on Mechanical Testing, Symposium on Recent Development in …

The Society

Symposium on Surface Analysis Techniques for Metallurgical Applications, Carbonara, Robert S., Cuthill, J. R., American …

ASTM

International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, Melker, Alexander …

SPIE

Gray, Robert J., McCall, James L., International Metallographic Society

American Elsevier Pub. Co

International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, Melker, Alexander …

SPIE

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12