| 1.
図書 |
図書
|
Symposium on Applications of Modern Metallographic Techniques ; American Society for Testing and Materials. Committee E-4 on Metallography ; American Society for Metals
|
||||||
| 2.
図書 |
図書
|
sponsored by ASTM Committee E-4 on Metallography, American Society for Testing and Materials, Houston, Tex., 3-5 April 1978 ; Halle Abrams ... [et al.], editors
|
||||||
| 3.
図書 |
図書
|
Halle Abrams ... [et al.], editors
|
||||||
| 4.
図書 |
図書
|
American Society for Testing and Materials. Committee E-4 on Metallography ; Annual Meeting American Sciety for Testing Materials
|
||||||
| 5.
図書 |
図書
|
sponsored by ASTM Committee E-4 on Metallography and by the International Metallographic Society, Orlando, Fla., 18-19 July 1982
|
||||||
| 6.
図書 |
図書
|
sponsored by ASTM Committee E-4 on Metallography and by the International Metallographic Society, Philadelphia, PA, 15-18 July 1984 ; Peter J. Blau and Brian R. Lawn, editors
|
||||||
| 7.
図書 |
図書
|
J.C. Russ, coordinator
|
||||||
| 8.
図書 |
図書
|
Halle Abrams and G. N. Maniar, symposium cochairmen ; [Committee E-4 on Metallography sponsored the symposium]
|
||||||
| 9.
図書 |
図書
|
American Society for Testing and Materials ; American Society for Testing and Materials. Committee E-4 on Metallography
|
||||||
| 10.
図書 |
図書
|
Symposium on Advances in electron Metallography ; American Society for Testing and Materials. Committee E-4 on Metallography
|
||||||
| 11.
図書 |
図書
|
sponsored by ASTM Committee E-4 on Metallography, Philadelphia, Pa., 15-16 May 1986 ; B.L. Bramfitt ... [et al.], editors
|
||||||
| 12.
図書 |
図書
|
Symposium on Advances in electron Metallography ; American Society for Testing and Materials. Committee E-4 on Metallography
|
||||||
| 13.
図書 |
図書
|
sponsored by Subcommittee XI on Electron Microstructure of ASTM Committee E-4 on Electron Metallography
|
||||||
| 14.
図書 |
図書
|
sponsored by Subcommittee XI on Electron Microstructure of Metals of ASTM Committee E-4 on Electron Metallography
|
||||||
| 15.
図書 |
図書
|
Symposium on Advances in electron Metallography ; American Society for Testing and Materials. Committee E-4 on Metallography
|
