| Preface |
| Materials Research Society Symposium Proceedings |
| Grain Boundaries in Oxides |
| Effects of Y and Zr Dopants on Grain Boundary Structure in Creep Resistant Polycrystalline Alumina / G.S. Cargill III ; C.M. Wang ; J.M. Rickman ; H.M. Chan ; M.P. Harmer |
| Atomic and Electronic Structure of Symmetric Tilt Boundaries in ZnO / Fumiyasu Oba ; Shigeto R. Nishitani ; Hirohiko Adachi ; Isao Tanaka ; Masanori Kohyama ; Shingo Tanaka |
| The Origin of Electrical Activity at Grain Boundaries in Perovskites and Related Materials / S.J. Pennycook ; M. Kim ; G. Duscher ; N.D. Browning ; K. Sohlberg ; S.T. Pantelides |
| Simulation of a Grain Boundary in Zirconia / Michael W. Finnis ; Anthony T. Paxton |
| High-Resolution Electron Microscopy of Grain Boundary Structures in Yttria-Stabilized Cubic Zirconia / K.L. Merkle ; L.J. Thompson ; G.-R. Bai ; J.A. Eastman |
| Atomic Scale Characterization of Oxygen Vacancy Segregation at SrTiO[subscript 3] Grain Boundaries / R.F. Klie |
| Interfaces in Composites and Multilayers |
| Interfacial Structure of BaRuO[subscript 3] Thin Films Grown on (111) SrTiO[subscript 3] / W. Tian ; M.K. Lee ; C.B. Eom ; X.Q. Pan |
| Channeling Studies of CeO[subscript 2] and Ce[subscript 1-x]Zr[subscript x]O[subscript 2] Films on Yttria-Stabilized ZrO[subscript 2](111) / V. Shutthanandan ; S. Thevuthasan ; Y.J. Kim ; C.H.F. Peden |
| Atomic Force Microscopy Studies of Fracture Surfaces From Oxide/Polymer Interfaces / Maura Jenkins ; Jeffrey Snodgrass ; Aaron Chesterman ; Reinhold H. Dauskardt ; John C. Bravman |
| Poster Session |
| Interface Reactions in LiNbO[subscript 3] Based Optoelectronics Devices / Hirotoshi Nagata ; Yasuyuki Miyama ; Kaoru Higuma ; Yoshihiro Hashimoto ; Futoshi Yamamoto ; Yuuji Yamane ; Miki Yatsuki |
| Oxygen Exchange on a Highly Oriented Thin Film Electrode / Y.L. Yang ; C.L. Chen ; G.P. Luo ; C.W. Chu ; A.J. Jacobson |
| Microscopic Structure and Energetics of the Pd/SrTiO[subscript 3] (001) Interface / Thorsten Ochs ; Sibylle Kostlmeier ; Christian Elsasser |
| Activation of an Al-Zn-Mg-Li Alloy by the Presence of Precipitates to be Used as Sacrificial Anode / S. Valdez ; M.A. Talavera ; J. Genesca ; J.A. Juarez-Islas |
| Atomic Force and Electron Microscopy Studies of Tin Dioxide Films Prepared From Solutions With High Fluorine Content / Dwight R. Acosta ; Rebeca Castanedo ; Walter Estrada ; Rosario Avila-Godoy |
| Oxides Influence on Electrical Properties of Si and A[superscript 2]B[superscript 6] Materials / Andrii M. Andrukhiv ; Galina Khlyap ; Mikhail Andrukhiv ; Violetta Belosertseva |
| Influence of Oxidation on Boron Segregation to Grain Boundaries of In Situ Fractured Ni[subscript 3]Al Alloys / S.A. Koch ; D.T.L. van Agterveld ; G. Palasantzas ; J.Th.M. De Hosson |
| Influence of Fe on the Morphology of Spinel in the System MgO-Al[subscript 2]O[subscript 3]-Fe[subscript 2]O[subscript 3] / O.V. Kharissova ; U. Ortiz ; M. Hinojosa |
| The Interfacial Reaction Products and Mechanical Properties With Oxidized Layer Thickness of SiC Particle in 2014Al/SiC Composites / Youngman Kim ; Jong-Hoon Jeong ; Jae-Chul Lee |
| Segregation of Yttrium at Grain Boundaries in [alpha]-Al[subscript 2]O[subscript 3] / Stefan Nufer ; Wolfgang Kurtz ; Manfred Ruhle |
| Origin of Voids at the Interface of Wafer Bonded Sapphire on Sapphire / Stephan Senz ; Pascal Kopperschmidt ; Nikolai Dimitri Zakharov |
| Misfit Accommodation Mechanisms at Moving Reaction Fronts During the Initial Growth Stage of La[subscript 2]Zr[subscript 2]O[subscript 7]-Based Pyrochlore on (001)YSZ / C.J. Lu ; S. Senz ; D. Hesse |
| Segregation of Fission Products to Surfaces of UO[subscript 2] / C.R. Stanek ; Robin W. Grimes ; Mark R. Bradford |
| Ellipsometry as a Sensitive Technique to Probe Film-Substrate Interfaces: Al[subscript 2]O[subscript 3] on Si(100) / M.P. Singh ; G. Raghavan ; A.K. Tyagi ; S.A. Shivashankar |
| Microstructure of Sputter Deposited TiO[subscript 2]/SiO[subscript 2] Multilayer Optical Coatings / E. Sutter (Mateeva) ; P. Sutter ; J.J. Moore |
| Relationships Between Film Chemistry, Structure, and Mechanical Properties in Titanium Oxide / M. Pang ; D.E. Eakins ; M.G. Norton ; D.F. Bahr |
| Microstructural Effects in the Thermochromic Behavior of VO[subscript 2]/Al/Si Thin Film Heterostructures / K. Dovidenko ; S. Beasor ; A. Topol ; H. Efstathiadis ; S. Oktyabrsky ; S. Shokhor ; S. Naar ; A.E. Kaloyeros |
| Influence of Pre-Gate Cleaning on Si/SiO[subscript 2] Interface and Electrical Performance of CMOS Gate Oxide / X. Duan ; K. Kisslinger ; L. Mayes ; S. Ruby ; J. Barrett |
| Effect of Substrate Surface Structure and Deposition Conditions on the Microstructure of Tin Dioxide Thin Films Synthesized by Femtosecond Pulsed Laser Deposition / J.E. Dominguez ; L. Fu ; P.A. Van Rompay ; Z.Y. Zhang ; J.A. Nees ; P.P. Pronko |
| Characterization of Oxide Layers of Bulk Si[subscript 1-x]Ge[subscript x] / W. Suzukake ; S. Nemoto ; T. Iida ; Y. Takanashi ; S. Sakuragi |
| Metal-Oxide Interfaces |
| In Situ TEM Analysis of Nanometre-Sized Oxide Precipitates in a Metal Matrix / Bart J. Kooi ; Jeff Th.M. De Hosson |
| Electronic Structure and Bonding at the Al-Terminated Al(111)/[alpha]-Al[subscript 2]O[subscript 3](0001) Interface: A First Principles Study / Donald J. Siegel ; Louis G. Hector, Jr. ; James B. Adams |
| Classical Interatomic Potential for Nb-Alumina Interfaces / K. Albe ; R. Benedek ; D.N. Seidman ; R.S. Averback |
| Atomistic Simulation and Density Functional Analysis of Ni(111)-ZrO[subscript 2](100)(Cubic) and NiO(111)-Ni(111)- ZrO[subscript 2](100)(Cubic) Interfaces / Chang-Xin Guo ; Donald E. Ellis ; Vinayak P. Dravid ; Luke Brewer |
| Non-Equilibrium Wetting at Aluminium-Sapphire Interfaces / George Levi ; Wayne D. Kaplan |
| Semiempirical Correlation Between the Optical Band Gap of Oxides and Hydroxides and the Electronegativity of Their Constituents / Francesco Di Quarto ; Monica Santamaria ; Salvatore Piazza ; Carmelo Sunseri |
| A Subnanoscale Study of Segregation at CdO/Ag(Au) Heterophase Interfaces / Jason T. Sebastian ; Olof C. Hellman ; David N. Seidman |
| Time Dependent Debonding of Aluminum/Alumina Interfaces Under Cyclic and Static Loading / J.J. Kruzic ; J.M. McNaney ; R.M. Cannon ; R.O. Ritchie |
| Surfaces |
| Understanding Metal Oxide Surfaces at the Atomic Scale: STM Investigations of Bulk-Defect Dependent Surface Processes / Ulrike Diebold |
| Calculations of Perovskite Surface Relaxation / E. Heifets ; E.A. Kotomin ; R.I. Eglitis ; R.E. Cohen |
| Exudation of Silicate Liquid From Polycrystalline Alumina / N. Ravishankar ; Jeffrey K. Farrer ; C. Barry Carter |
| Electronic Structure of Titanium Oxide Crystal Surface With Lithium Atom on the Surface / M. Oshikiri ; F. Aryasetiawan ; M. Boero |
| Structure-Property Relationships |
| Electrical Properties of Doped Tin Dioxide Thin Films Deposited Using Femtosecond Pulsed Laser Ablation |
| Photochemical Reduction and Oxidation Reactions on Barium Titanate Surfaces / Jennifer L. Giocondi ; Gregory S. Rohrer |
| Nanoporous Ceria Films Prepared From Colloidal Suspension / Vladimir Petrovsky ; Brian Gorman ; Harlan U. Anderson ; Tatiana Petrovsky |
| Structure-Property Relationships of Tin Dioxide Thin Films Grown on Sapphire Substrates by Femtosecond Pulsed Laser Deposition |
| Al Doped Ta[subscript 2]O[subscript 5] Thin Films for Microelectronic Applications / P.C. Joshi ; M.W. Cole ; C.W. Hubbard ; E. Ngo |
| Author Index |
| Subject Index |
| Preface |
| Materials Research Society Symposium Proceedings |
| Grain Boundaries in Oxides |
| Effects of Y and Zr Dopants on Grain Boundary Structure in Creep Resistant Polycrystalline Alumina / G.S. Cargill III ; C.M. Wang ; J.M. Rickman ; H.M. Chan ; M.P. Harmer |
| Atomic and Electronic Structure of Symmetric Tilt Boundaries in ZnO / Fumiyasu Oba ; Shigeto R. Nishitani ; Hirohiko Adachi ; Isao Tanaka ; Masanori Kohyama ; Shingo Tanaka |
| The Origin of Electrical Activity at Grain Boundaries in Perovskites and Related Materials / S.J. Pennycook ; M. Kim ; G. Duscher ; N.D. Browning ; K. Sohlberg ; S.T. Pantelides |
