Spectroscopic characterization techniques for semiconductor technology III : 14-15 March 1988, Newport Beach, California | 東京工業大学附属図書館蔵書検索

>> Google Books

所蔵情報QRコード

Spectroscopic characterization techniques for semiconductor technology III : 14-15 March 1988, Newport Beach, California / Orest J. Glembocki, Fred H. Pollak, Fernando Ponce, chairs/editors ; sponsored by Optical Society of America, SPIE--the International Society for Optical Engineering ; cooperating organization, the Metallurgical Society

資料種別:

図書

出版情報:

Bellingham, Wash., U.S.A. : The Society, c1988

形態:

viii, 234 p. ; 28 cm

シリーズ名:

Proceedings / SPIE -- the International Society for Optical Engineering ; v. 946 <BA0022700X>

著者名:

Glembocki, Orest J. <DA05870178>

Pollak, Fred H. <DA0587019X>

Ponce, Fernando A. <DA03833079>

Optical Society of America <DA00534515>

Society of Photo-optical Instrumentation Engineers <DA00848546>

Metallurgical Society (U.S.) <DA02608725>

さらに 1 件

ISBN:

9780892529810 [0892529814]

書誌ID:

BA10254803

子書誌情報

フルテキスト

Loading contents information

所蔵情報

Loading availability information

他の版・巻

書誌詳細

注記:	Includes bibliographies and index
主題:	Semiconductors--Testing--Congresses; Spectrum analysis--Congresses
言語:	英語

東工大ブックレビュー

Loading review information

類似資料:

1 図書 Spectroscopic characterization techniques for semiconductor technology IV : 25-26 March 1992, Somerset, New Jersey Glembocki, Orest J., Society of Photo-optical Instrumentation Engineers SPIE	7 電子ブック Spectroscopic Characterization Techniques for Semiconductor Technology V Glembocki SPIE Digital Library Proceedings
2 図書 Modern optical characterization techniques for semiconductors and semiconductor devices : 26-27 March, 1987, Bay Point, Florida (pbk.) Glembocki, Orest J., Pollak, Fred H., Song, J. J., Society of Photo-optical Instrumentation Engineers, Metallurgical … SPIE	8 図書 Growth of compound semiconductor structures : second in a series : 15-16 March 1988, Newport Beach, California Madhukar, A., Optical Society of America, Society of Photo-optical Instrumentation Engineers SPIE
3 図書 Spectroscopic characterization techniques for semiconductor technology V : 25-26 January 1994, Los Angeles, California Glembocki, Orest J., Society of Photo-optical Instrumentation Engineers SPIE	9 図書 Optical spectroscopic techniques and instrumentation for atmospheric and space research : 25-27 July 1994, San Diego, California (pbk.) Wang, Jinxue, Hays, Paul B. (Paul Byron), Society of Photo-optical Instrumentation Engineers SPIE
4 図書 Ultrafast Laser Probe Phenomena in Bulk and Microstructure Semiconductors II : a special international conference of invited speakers : 14-15 March 1988, … Alfano, R. R., Optical Society of America, Society of Photo-optical Instrumentation Engineers, Metallurgical Society … SPIE	10 図書 Advanced Processing of Semiconductor Devices II : 17-18 March 1988, Newport Beach, California Craighead, Harold G., Narayan, J. (Jaydish), Society of Photo-optical Instrumentation Engineers, Metallurgical Society … SPIE
5 図書 Spectroscopic characterization techniques for semiconductor technology II : January 21-22, 1985, Los Angeles, California Pollak, Fred H., Society of Photo-optical Instrumentation Engineers SPIE -- the International Society for Optical Engineering	11 電子ブック Spectroscopic Characterization Techniques for Semiconductor Technology IV Glembocki SPIE Digital Library Proceedings
6 電子ブック Spectroscopic Characterization Techniques for Semiconductor Technology III Glembocki SPIE Digital Library Proceedings, SPIE	12 図書 Spectroscopic characterization techniques for semiconductor technology : 9-10 November 1983, Cambridge, Massachusetts Pollak, Fred H., Bauer, Robert S., Society of Photo-optical Instrumentation Engineers SPIE -- the International Society for Optical Engineering

1

2

3

4

5

6

7

8

9

10

11

12