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1.

図書
図書
1. 1999 IEEE AUTOTESTCON proceedings, IEEE Systems Readiness Technology Conference, August 30-September 2, 1999 : test technology for the new millennium (: soft. ; : case.)
sponsored by the Institute of Electrical and Electronics Engineers, Aerospace and Electronics Systems Society, Instrumentation and Measurement Society, IEEE Central Texas Section
出版情報: Piscataway, NJ : IEEE Service Center, c1999  xxix, 830 p. ; 28 cm
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2.

図書
図書
2. 1998 IEEE AUTOTESTCON proceedings, IEEE Systems Readiness Technology Conference : test technology for the 21st century (: soft. ; : case.)
sponsored by the Institute of Electrical and Electronics Engineers, Aerospace and Electronics Systems Society, Instrumentation and Measurement Society, IEEE Los Angels Council
出版情報: Piscataway, NJ : IEEE Service Center, c1998  xxvi, 669 p. ; 28 cm
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3.

図書
図書
3. 1997 IEEE AUTOTESTCON proceedings, IEEE Systems Readiness Technology Conference : systems readiness supporting global needs and awareness in the 21st century : AUTOTESTCON '97, September 22-25, 1997, Anaheim, California, Disneyland Hotel (: soft. ; : case.)
sponsored by the Institute of Electrical and Electronics Engineers, Aerospace and Electronics Systems Society, Instrumentation and Measurement Society, IEEE Los Angels Council
出版情報: Piscataway, NJ : IEEE Service Center, c1997  x, 703 p. ; 28 cm
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4.

図書
図書
4. Conference Record : AUTOTESTCON '95, August 8-10, 1995, Atlanta, Georgia : "Systems Readiness: Test Technology for the 21st Century" (: soft. ; : case.)
sponsored by: the Institute of Electrical and Electronics Engineers, Aerospace and Electronics Systems Society, Instrumentation and Measurement Society
出版情報: Piscataway : IEEE Service Center, c1995  587 p. ; 28 cm
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5.

図書
図書
5. Conference Record : AUTOTESTCON '96, September 16-19, 1996, Dayton, Ohio : "Test technology and commercialization" (: soft. ; : case.)
sponsored by the Institute of Electrical and Electronics Engineers, Aerospace and Electronics Systems Society, Instrumentation and Measurement Society
出版情報: Piscataway : IEEE Service Center, c1996  488 p. ; 28 cm
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