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1.

図書

図書
A. Ravishankar Rao, Ning Chang, chairs/editors ; sponsored by IS & T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash., USA : SPIE, c1996  vii, 284 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 2665
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2.

図書

図書
Kenneth W. Tobin, Ning S. Chang, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash. : SPIE, c1999  ix, 262 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3652
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3.

図書

図書
Martin A. Hunt, Jeffery R. Price, chair/editor ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash. : SPIE, c2003  vii, 324 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 5011
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4.

図書

図書
A. Ravishankar Rao, Ning Chang, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash., USA : SPIE, c1998  v, 158 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3306
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目次情報: 続きを見る
Automatic blemish detection in liquid crystal flat panel displays / W.K. Pratt, S.S. Sawkar, K. O'Reilly
Automated optical inspection technology for HDD head suspension / S. Sakai, H. Oka, M. Ando
Machine vision system applied to the characterization of a powder stream : application to the laser cladding process / F. Meriaudeau ... [et al.]
Comparison of several artificial neural network classifiers for CT images of hardwood logs / D.L. Schmoldt, J. He, A.L. Abbott
Fuzzy logic connectivity in semiconductor defect clustering / T.P. Karnowski, S.S. Gleason, K.W. Tobin, Jr
New algorithm to calculate the center of laser reflections / D. Yang ... [et al.]
Development of high-speed 3D inspection system for solder bumps / Y. Nishiyama ... [et al.]
Detection of small or low-contrast defects in web inspection / J. Laitinen
Automated detection of Karnal bunt teliospores / K.D. Linder ... [et al.]
Rule-based inspection of printed green ceramic tape / D.R. Patek ... [et al.]
Shift-, rotation-, and scale-invariant shape recognition system using an optical Hough transform / V. Schmid, G. Bader, E.H. Lueder
High-speed optoelectric image processing unit for industrial inspection / G. Cheng .. [et al.]
Adaption of the fuzzy k-nearest neighbor classifier for manufacturing automation / K.W. Tobin, Jr., S.S. Gleason, T.P. Karnowski
Representing the object model for automatic visual inspection using a description language / R. Sablatnig, C. Menard
Optoelectronic morphological processor for industrial online inspection / H. Liu ... [et al.]
Machine vision system for inner-wall surface inspection / B.H. Zhuang, W.W. Zhang
Automatic blemish detection in liquid crystal flat panel displays / W.K. Pratt, S.S. Sawkar, K. O'Reilly
Automated optical inspection technology for HDD head suspension / S. Sakai, H. Oka, M. Ando
Machine vision system applied to the characterization of a powder stream : application to the laser cladding process / F. Meriaudeau ... [et al.]
5.

図書

図書
Kenneth W. Tobin, Jr., chair/editor ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash. : SPIE, c2000  ix, 396 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3966
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