Polarimetry and ellipsometry : 20-23 May, 1996, Kazimierz Dolny, Poland | 東京工業大学附属図書館蔵書検索

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Polarimetry and ellipsometry : 20-23 May, 1996, Kazimierz Dolny, Poland / Maksymilian Pluta, Tomasz R. Woliński, chairs/editors ; Mariusz Szyjer, co-editor ; organized by, SPIE Poland Chapter, Institute of Applied Optics, Warsaw (Poland) ; sponsored by SPIE--the International Society for Optical Engineering, State Committee for Scientific Research (Poland)

資料種別:

図書

出版情報:

Bellingham, Wash., USA : SPIE, c1997

形態:

xviii, 374 p. ; 28 cm

シリーズ名:

Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3094 <BA0022700X>

著者名:

Pluta, Maksymilian

Woliński, Tomasz R.

Szyjer, Mariusz

Society of Photo-optical Instrumentation Engineers. Poland Chapter

Institute of Applied Optics (Poland)

Komitet Badań Naukowych (Poland)

Society of Photo-optical Instrumentation Engineers

さらに 2 件

ISBN:

9780819425096 [0819425095]

書誌ID:

BA41023758

子書誌情報

フルテキスト

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所蔵情報

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他の版・巻

書誌詳細

注記:	Includes bibliographical references and index
主題:	Ellipsometry--Congresses; Polarimetry--Congresses; Polarization (Light)--Congresses
言語:	英語

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