1.
図書 |
Longin Jan Latecki, David M. Mount, Angela Y. Wu, chairs/editors ; sponsored ... by IS & T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering
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2.
図書 |
Longin Jan Latecki, David M. Mount, Angela Y. Wu, chairs/editors ; sponsored and published by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering
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3.
図書 |
Bruce G. Batchelor, Heinz Hügli, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering
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4.
図書 |
Kevin G. Harding, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering ; technical cosponsor, IEICE Communications Society (Japan) ; in cooperation with IEICE Electronics Society (Japan)
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5.
図書 |
Jacques G. Verly, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering
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6.
図書 |
Bruce G. Batchelor, Susan Snell Solomon, Frederick M. Waltz, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
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7.
図書 |
Phillipe Réfrégier, chair/editor ; sponsored by CNRS, Centre national de la recherche scientifique ... [et al.]
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8.
図書 |
Susan S. Solomon, Bruce G. Batchelor, Frederick M. Waltz, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
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9.
図書 |
Susan Snell Soloman, Bruce G. Batchelor, John W.V. Miller, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; endorsed by MVA/SME--Machine Vision Association of the Society of Manufacturing Engineers ; cooperating organizations, NIST--National Institute of Standards and Technology, CIMS--Coalition for Intelligent Manufacturing Systems, [and] A-CIMS--Academic Coalition for Intelligent Manufacturing Systems
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10.
図書 |
10. Imaging and illumination for metrology and inspection : 2-4 November 1994, Boston, Massachusetts
Donald J. Svetkoff, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering
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