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1.

図書

図書
Kenneth W. Tobin, Jr., Fabrice Meriaudeau, chairs/editors ; sponsored by UT-Battelle ... [et al.] in cooperation with IEEE Signal Processing Society, SPIE--the International Society for Optical Engineering, [and] Machine Vision Association of SME--Society of Manufacturing Engineers (USA)
出版情報: Bellingham, Wash., USA : SPIE, c2003  xii, 594 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 5132
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2.

図書

図書
David Fofi, Fabrice Meriaudeau,editors ; organized by Le2i UMR CNSR 5158, Le Creusot (France) ; sponsored by Le Site Universitaire Creusotin : Centre Universitaire Condoret et IUT Le Creusot (France) ... [et al.] in cooperation with IEEE France Section (France), SPIE Europe, Biomaterials Network
出版情報: Bellingham, Wash., USA : SPIE, c2007  1 v. (various pagings) ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 6356
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3.

図書

図書
Bruce G. Batchelor, Susan Snell Solomon, Frederick M. Waltz, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash. : SPIE, c1995  x, 326 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 2597
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4.

図書

図書
Susan S. Solomon, Bruce G. Batchelor, Frederick M. Waltz, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
出版情報: Bellingham, WA : SPIE, c1996  x, 274 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 2908
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5.

図書

図書
Susan Snell Soloman, Bruce G. Batchelor, John W.V. Miller, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; endorsed by MVA/SME--Machine Vision Association of the Society of Manufacturing Engineers ; cooperating organizations, NIST--National Institute of Standards and Technology, CIMS--Coalition for Intelligent Manufacturing Systems, [and] A-CIMS--Academic Coalition for Intelligent Manufacturing Systems
出版情報: Bellingham, Wash., USA : SPIE, c1997  xi, 296 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3205
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6.

図書

図書
Martin A. Hunt, chair/editor ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering ; published by SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash., USA : SPIE, c2001  vii, 272 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4301
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7.

図書

図書
Martin A. Hunt, chair/editor ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering ; published by SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Washington : SPIE, c2002  v, 208 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4664
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8.

図書

図書
Jeffery R. Price, Fabrice Mériaudeau, chairs/editors ; sponsored ... by IS & T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash., USA : SPIE, c2004  vi, 204 p. ; 28 cm
シリーズ名: Proceedings of Electronic Imaging Science and Technology
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 5303
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9.

図書

図書
Jeffery R. Price, Fabrice Meriaudeau, chairs/editors ; sponsored and published by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash. : SPIE , Springfield, Va. : IS&T, c2005  viii, 302 p. ; 28 cm
シリーズ名: Proceedings of Electronic Imaging Science and Technology
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 5679
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10.

図書

図書
Fabrice Meriaudeau, Kurt S. Niel, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash. : SPIE , Springfield, Va. : IS&T, c2006  1 v. (various pagings) ; 28 cm
シリーズ名: Proceedings of Electronic Imaging Science and Technology
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 6070
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