Kenneth W. Tobin, Jr., Fabrice Meriaudeau, chairs/editors ; sponsored by UT-Battelle ... [et al.] in cooperation with IEEE Signal Processing Society, SPIE--the International Society for Optical Engineering, [and] Machine Vision Association of SME--Society of Manufacturing Engineers (USA)
出版情報:
Bellingham, Wash., USA : SPIE, c2003 xii, 594 p. ; 28 cm
David Fofi, Fabrice Meriaudeau,editors ; organized by Le2i UMR CNSR 5158, Le Creusot (France) ; sponsored by Le Site Universitaire Creusotin : Centre Universitaire Condoret et IUT Le Creusot (France) ... [et al.] in cooperation with IEEE France Section (France), SPIE Europe, Biomaterials Network
出版情報:
Bellingham, Wash., USA : SPIE, c2007 1 v. (various pagings) ; 28 cm
Bruce G. Batchelor, Susan Snell Solomon, Frederick M. Waltz, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
Susan S. Solomon, Bruce G. Batchelor, Frederick M. Waltz, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
Susan Snell Soloman, Bruce G. Batchelor, John W.V. Miller, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; endorsed by MVA/SME--Machine Vision Association of the Society of Manufacturing Engineers ; cooperating organizations, NIST--National Institute of Standards and Technology, CIMS--Coalition for Intelligent Manufacturing Systems, [and] A-CIMS--Academic Coalition for Intelligent Manufacturing Systems
出版情報:
Bellingham, Wash., USA : SPIE, c1997 xi, 296 p. ; 28 cm
Martin A. Hunt, chair/editor ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering ; published by SPIE--the International Society for Optical Engineering
出版情報:
Bellingham, Wash., USA : SPIE, c2001 vii, 272 p. ; 28 cm
Martin A. Hunt, chair/editor ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering ; published by SPIE--the International Society for Optical Engineering
出版情報:
Bellingham, Washington : SPIE, c2002 v, 208 p. ; 28 cm
Jeffery R. Price, Fabrice Mériaudeau, chairs/editors ; sponsored ... by IS & T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering
出版情報:
Bellingham, Wash., USA : SPIE, c2004 vi, 204 p. ; 28 cm
Jeffery R. Price, Fabrice Meriaudeau, chairs/editors ; sponsored and published by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering
出版情報:
Bellingham, Wash. : SPIE , Springfield, Va. : IS&T, c2005 viii, 302 p. ; 28 cm
Fabrice Meriaudeau, Kurt S. Niel, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering
出版情報:
Bellingham, Wash. : SPIE , Springfield, Va. : IS&T, c2006 1 v. (various pagings) ; 28 cm
A. Ravishankar Rao, Ning Chang, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering
A. Ravishankar Rao, Ning Chang, chairs/editors ; sponsored by IS & T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering
出版情報:
Bellingham, Wash., USA : SPIE, c1996 vii, 284 p. ; 28 cm
Rolf-Jürgen Ahlers, Donald W. Braggins, Gary W. Kamerman, chairs/editors ; sponsored by the Commission of the European Communities, Directorate General for Science, Research, and Development, EOS--the European Optical Society, SPIE--the International Society for Optical Engineering
出版情報:
Bellingham, Wash., USA : SPIE, c1994 ix, 524 p. ; 28 cm
Three-dimensional contouring by an optical radar system (ORAS) / Heinrich Hoefler ; Gerhard Schmidtke
Development, analysis and performance tests of a chirped laser radar with optoelectronic signal demodulation / Hubertus A. Luebbers ; Jan M. Mrosik ; Christo G. Stojanoff
Frequency-modulated continuous-wave (FMCW) lidar with tunable twin-guide laser diode / Andreas Dieckmann ; Markus-Christian Amann
Linear frequency modulation continusous-wave (LFM-CW) lidar for remote detection of saturated hydrocarbons / Ravil R. Agishev ; Lev Aybatov ; Yury E. Pol'Sky
Laser doppler device for air pollution detection / Hiie Hinrikus ; Kalju Meigas
Laser radar for wide-area fire detection / Alphonsus J. Fennelly ; Edward L. Fry ; Muamer Zukic ; Michele M. Wilson ; Douglas G. Torr
Laser tracking in the refractive eye microsurgery / Vasyl V. Molebny
Optoelectronic processing of wide-bandwidth coherent laser radar signals / Stuart Fowler ; Tim A. Patterson ; Howard W. Halsey ; D. G. Lawson ; Kerry B. Whittle ; Gary W. Kamerman
Principles of the formation of laser radar image being observed through a sea surface and water thickness / Alexander G. Luchinin
Spatial-modulated laser signal adaptive development out of the isoplanatic zone / Alexander V. Helvas ; Valery M. Nikitin
Three-dimensional imaging laser scanner for the inspection of tunnels / Richard Wissler ; Christoph Froehlich
Resolving power adaptive correction in multichannel laser measuring systems / Roman V. Pavlovich ; Vladimir N. Fomin
Three-dimensional robot guidance with the Perceptron Lasar System / Peter Fornoff
High-accuracy laser rangefinders for industrial applications / Yury G. Popov ; V. A. Yakovlev
Optical 3D coordinate measurements and applications / Hans Steinbichler ; Armin Maidhof ; Thomas Franz ; Thomas Roth
Flexible 3D vision system for industrial inspection / Simon J. Tomlinson
Three-dimensional vision industrial system / Pedro I. Ereno ; Angel Castillo Lizundia ; Javier Garcia-Tejedor ; Pablo de Isusi ; Jone Etxazarra
Optical system for robot-based one-of-a-kind manufacturing / Ulrich Berger ; Achim Schmidt ; Henning G. Wolf
Rapid prototyping with optical 3D measurement systems / J. Gaessler ; G. N. Blount ; R. M. Jones
Automatic inspection of workpieces at the shop floor using imaging sensors / Ulrich Luebbert
Optical 3D tube measurement system for quality control in industry / K. Sinnreich ; Werner Boesemann
Imetrics TP200: a system for high accuracy 3D image metrology / Horst A. Beyer
Inspection of free-form surfaces using dense range data / Edvaldo M. Bispo ; Robert B. Fisher
Three-dimensional imaging system combining vision and ultrasonics / Catherine Wykes ; Tsung N. Chou
Combined measurement of complex vibrational modes and surface form for noise radiation prediction / David P. Towers ; Clive H. Buckberry ; B. C. Stockley ; M. P. Jones
Reconstruction of curved surface using isodensity maps based on stereo vision system / Masahiro Mizutani ; Yasuhiko Numagami ; Osamu Nakamura ; Toshi Minami
High-speed variable-scan CCD camera for machine vision and direct computer interface / Brian C. Doody ; William D. Washkurak ; P. Tom Jenkins ; Mike Miethig ; S. J. Hood ; N. D. Prince
Fiber optical hand microscope with integrated image capturing device / Reinhard Jenny ; Rolf-Juergen Ahlers
High-speed high-resolution color line scan camera for machine vision / David J. Litwiller
FIPS/IQIS: a new program system for image processing in manufacturing / M. Hou ; B. Knappe
Agile automated vision / Juergen Fandrich ; Lorenz A. Schmitt
Morphological image processing for the recognition of surface defects / Sabine Mueller ; Bertram Nickolay
High-speed web inspection using intelligent time delay and integration (TDI) cameras / Jim W. Roberts ; S. D. Rose ; Graham A. Jullien ; L. Nichols ; Savvas G. Chamberlain ; Gerhard Maroscher
Surface inspection of flat products by means of texture analysis: on-line implementation using neural networks / Carlos Fernandez ; Carlos Platero ; Pascual Campoy Cervera ; Rafael Aracil
Automated inspection of ground metallic components / F. D. Schroeder ; Horst-Artur Crostack
Classification system for pieces of Porcelanatto based on computer vision / Jose A. Penaranda ; Angel P. del Pobil ; Miguel A. Serna
Fourier transforms and fractals in the food and agricultural industry / Reyer Zwiggelaar ; Christine R. Bull
Wood industrial application for quality control using image processing / M. J. Ferreira ; J. A. Neves
Neural network classification of Fraunhofer diffraction patterns for inspection of fine pitch electronic components / David J. Search ; Clifford A. Hobson ; John T. Atkinson ; Jeremy D. Pearson
Contour analysis algorithms for high-speed inspection / Knut Kille
Inspection of wear particles in oils by using a fuzzy classifier / Jari J. Hamalainen ; Petri Enwald
Lighting for automated visual inspection: theory and practice for transparent and glossy objects / Finn Johannessen
Description and industrial applications of a standard machine vision system not requiring task-specific development / Wolfgang Bruehl
Classification techniques based on AI application to defect classification in cast aluminum
Color machine vision in industrial process control: case limestone mine / Pekka Parnanen ; Guy F. Lemstrom ; Seppo Koskinen
Applications of hybrid optical methods in mineral processing control systems / Jacek Galas ; Stanislaw Lenczowski ; Marek Daszkiewicz
Automated visual inspection of printed circuit board soldering / Jordi Ojeda ; Ramon Castella ; Josep Amat
Experimental recognition using spatial filtering in a linear joint transform optical correlator / Santiago R. Vallmitjana ; Arturo Carnicer ; Estela Martin-Badosa ; Ignacio P. Juvells
Why visual primitive structure is important in multi-images analysis systems / Rachid Gherbi
Development, manufacturing, adjustment, and installation of high-performance objectives / Jakob Bleicher ; Werner Kroeninger ; Joachim Koenig ; Hans-Georg Heckmann
Visual object recognition for automatic micropropagation of plants / Thorsten Brendel ; Joerg Schwanke ; Peter F. Jensch
Personal identificaton through facial image based on isodensity maps / Kenji Fujimoto
Description and classification of facial expression based on isodensity maps / Mineo Seki
Automatic visual inspection of centering marks engraved on ophthalmic lenses / Xavier Fernandez ; Salvador Bosch
Three-dimensional contouring by an optical radar system (ORAS) / Heinrich Hoefler ; Gerhard Schmidtke
Development, analysis and performance tests of a chirped laser radar with optoelectronic signal demodulation / Hubertus A. Luebbers ; Jan M. Mrosik ; Christo G. Stojanoff
Frequency-modulated continuous-wave (FMCW) lidar with tunable twin-guide laser diode / Andreas Dieckmann ; Markus-Christian Amann
Sabry F. El-Hakim, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organization, ISPRS--International Society for Photogrammetry and Remote Sensing
Bruce G. Batchelor, Susan Snell Solomon, Frederick M. Waltz, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
出版情報:
Bellingham, Wash., USA : SPIE, c1994 x, 446 p. ; 28 cm
Donald W. Braggins, chair/editor ; sponsored by European Optical Society (EOS), IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering
出版情報:
Bellingham, Wash., USA : SPIE, c1993 ix, 422 p. ; 28 cm
Machine vision for the automated inspection of web materials / Leonard Norton-Wayne ; Mark Bradshaw ; Christopher Sanby
Flaw detection on galvanized metallic strips in real time by adaptive thresholding / Ludovic Macaire ; J. G. Postaire
On-line surface inspection for continuous cast aluminum strip / Carlos Fernandez ; Pascual Campoy Cervera ; Carlos Platero ; Jose M. Sebastian ; Rafael Aracil
Performance analysis of CCD cameras for industrial inspection / Horst A. Beyer
Class of algorithms for real-time subpixel registration / Robert W. Frischholz ; Klaus P. Spinnler
Evaluation of machine vision systems for six-sigma environment / Peter Cencik
Procedure for image-acquisition design / Jari Miettinen ; Ari K. Harkonen
Color vision system for industrial applications / Michel Ollivier ; Martial Grimm ; Jean-Philippe Igersheim ; Sylvain Rion ; Serge Weber
Applications of intelligent cameras / Alastair McLeod ; Tord Braband ; Steinar Smastuen ; Roy Nicklasson ; Arne Sommerfelt ; Bjorn Lillekjendlie ; Eivind Strom
Evaluation of a stereovision sensor system for the control of an autonomous guided vehicle / Bernard F. Buxton ; D. A. Castelow ; M. J. dell
Visual guidance of mobile platforms / Rodney J. Blissett
Evaluation of an obstacle detection technique based on stereovision / Serge de Paoli ; Renaud Zigmann ; T. Skordas ; H. H. Soudain
Color vision for road scene interpretation / Frederic Sandt ; Didier Aubert ; Laurence Festas
Dynamic vision for precise depth measurement and robot control / Volker Graefe ; Klaus P. Wershofen ; Johannes Huber
Inspection methods for geometric and symbolic shape features / Bruce G. Batchelor ; A. David Marshall ; Ralph R. Martin
Automatic processing of ultrasound images for nondestructive testing / Leon Goodfriend
Real-time defect detection using multiaperture fiber optic sensors and machine learning / Hendrik Rothe ; Angela Duparre ; Peter Riedel ; Monika Timm
Study of Fourier descriptors statistical features / Ahmed M. Darwish ; Emad-Eldin H. Mohamed
Computer vision system for the automatic measurement of volumes of wood / Bento A. Correia ; Roger Davies ; Fernando D. Carvalho ; Fernando C. Rodrigues
Automatic surface inspection and classification systems / H. Stiefvater
BRICORK: a vision system for automating the manufacture of cork stoppers / Luis Ferreira
Automated video surveillance: teaching an old dog new tricks
Statistical method for segmentation of fingerprint images for an image retrieval system / Charles Hawkins ; David Holburn
Pattern classification of RGB color images using a BP neural network classifier / Jiancheng Jia
Leather texture classification for car industry using neural network development methodology / Gerard Yahiaoui ; Bertrand Borocco
Neural network application for classification of profiles / Nathalie Saulnier
Artificial intelligence for networks recognition in remote sensing images / Jean-Marc Gilliot ; Jean-Louis Amat
Seed maize quality inspection with machine vision
Standard machine vision systems used in different industrial applications / Wolfgang Bruehl
Practical applications of optical profile sensors for adaptive welding / J. A. Appels ; A. J. Versteege
Computer vision methods for the three-dimensional measurement of manufactured parts / John T. Atkinson ; Clifford A. Hobson ; Shirish P. Kshirsagar ; Francis Lilley ; Jeremy D. Pearson
Three-dimensional digitizer for the footwear industry / Francisco Gonzalez ; Francisco Penafiel
Line-scan vision systems / Simon X. Godber ; Max Robinson ; J. Paul O. Evans
Programmable optical grids: new possibilities for 2D and 3D image processing / Henning G. Wolf
Industrial applications of a vision system for undersea robots / John Turner
3D measurement by digital photogrammetry / Carl T. Schneider
On-line and off-line applications of photogrammetric stations / Henrik G. Haggren
Knowledge-based object recognition and model generation / Dietrich W. Paulus ; Andraes Winzen ; Heinrich Niemann
Microprocessor open vision environment (MOVE) / Pavel Grossmann ; R. Horaud ; Rachid Deriche ; Patrick Courtney ; A. Chehikian
Optical implementation of binary image morphological transformations using a liquid crystal light valve (LCLV) / Shifu Yuan ; Shi-Jie Zhao ; Xueru Zhang ; Lixue Chen
Coarse-to-fine strategy for motion estimation / E. Degremont
Machine vision for the automated inspection of web materials / Leonard Norton-Wayne ; Mark Bradshaw ; Christopher Sanby
Flaw detection on galvanized metallic strips in real time by adaptive thresholding / Ludovic Macaire ; J. G. Postaire
On-line surface inspection for continuous cast aluminum strip / Carlos Fernandez ; Pascual Campoy Cervera ; Carlos Platero ; Jose M. Sebastian ; Rafael Aracil
Scott S. Breidenthal, Alan A. Desrochers, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering in cooperation with Automated Imaging Association ... [et al.]
Bruce G. Batchelor, Susan Snell Solomon, Frederick M. Waltz, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering in cooperation with Automated Imaging Association ... [et al.]
出版情報:
Bellingham, Wash., USA : SPIE, c1993 vii, 408 p. ; 28 cm
Sabry F. El-Hakim, chair/editor ; organized by ISPRS--International Society for Photogrammetry and Remote Sensing, NRCC--National Research Council Canada ; cooperating organizations, SPIE--the International Society for Optical Engineering, ASPRS--the American Society for Photogrammetry and Remote Sensing
出版情報:
Bellingham, Wash. : SPIE, c1991 viii, 203 p. ; 28 cm
Bruce G. Batchelor, Michael J.W. Chen, Frederick M. Waltz, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
Bruce G. Batchelor, Susan Snell Solomon, Frederick M. Waltz, chairs/editors ; sponsored and published by SPIE-the International Society for Optical Engineering
出版情報:
Bellingham, Wash. : SPIE, c1992 ix, 367 p. ; 28 cm
Robert J. Bieringer, Kevin G. Harding, editors ; cosponsored by SPIE--the International Society for Optical Engineering and ESD--the Engineering Society ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... [et al.]
出版情報:
Bellingham, Wash., USA : SPIE, c1988 x, 267 p. ; 28 cm
Kenneth W. Tobin, Ning S. Chang, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering
出版情報:
Bellingham, Wash. : SPIE, c1999 ix, 262 p. ; 28 cm
Martin A. Hunt, Jeffery R. Price, chair/editor ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering
出版情報:
Bellingham, Wash. : SPIE, c2003 vii, 324 p. ; 28 cm
chairs/editors: Bruce G. Batchelor, John W.V. Miller, Susan Snell Soloman ; sponsored by SPIE - the International Society for Optical Engineering ; endorsed by MVA/SME - Machine Vision Association of the Society of Manufacturing Engineers
A. Ravishankar Rao, Ning Chang, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering
出版情報:
Bellingham, Wash., USA : SPIE, c1998 v, 158 p. ; 28 cm
Kenneth W. Tobin, Jr., chair/editor ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering
出版情報:
Bellingham, Wash. : SPIE, c2000 ix, 396 p. ; 28 cm
Kevin G. Harding, John W.V. Miller, Bruce G. Batchelor, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
出版情報:
Bellingham, Wash. : SPIE, c2001 vii, 296 p. ; 28 cm
Fabrice Meriaudeau, Kurt S. Niel, editors ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering
出版情報:
Bellingham, Wash. : SPIE , Springfield, Va. : IS&T, c2007 1 v. (various pagings) ; 28 cm
図書
