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Laser metrology and inspection : 14-15 June 1999, Munich, Germany / Hans J. Tiziani, Pramod K. Rastogi, chairs/editors ; sponsored by EOS, SPIE, WLT

資料種別:
図書
出版情報:
Bellingham, Wash. : SPIE, c1999
形態:
vii, 298 p. ; 28 cm
シリーズ名:
Proceedings EurOpt series <BA31190072>
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3823 <BA0022700X>
著者名:
ISBN:
9780819433091 [0819433098]
書誌ID:
BA8605365X
子書誌情報
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