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1.

図書
図書
1. Defect recognition and image processing in semiconductors 1997 : proceedings of the Seventh International Conference on Defect Recognition and Image Porcessing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September, 1997
edited by J. Donecker and I. Rechenberg
出版情報: Bristol : Institute of Physics, c1998  xx, 524 p. ; 24 cm
シリーズ名: Institute of Physics conference series ; no. 160
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2.

図書
図書
2. Defect recognition and image processing in semiconductors 1995 : proceedings of the sixth International Conference, held in Boulder, Colorado, 3-6 December 1995
edited by A.R. Mickelson
出版情報: Bristol ; Philadelphia : Institute of Physics Pub., c1996  xii, 369 p.
シリーズ名: Institute of Physics conference series ; no. 149
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3.

図書
図書
3. Defect recognition and image processing in semiconductors and devices : proceedings of the fifth international conference, Santander, Spain, 6-10 September 1993
edited by J. Jiménez
出版情報: Bristol : Institute of Physics Pub., 1994  xx, 417 p. ; 24 cm
シリーズ名: Institute of Physics conference series ; no. 135
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