| Preface |
| Materials Research Society Symposium Proceedings |
| Magnetic Materials |
| Microstructural Characterization of Longitudinal Magnetic Recording Media / Robert Sinclair ; Dong-Won Park ; Claus Habermeier ; Kai Ma |
| Electron Holography of Nanostructured Magnetic Materials / R.E. Dunin-Borkowski ; B. Kardynal ; M.R. McCartney ; M.R. Scheinfein ; David J. Smith |
| Flux Mapping and Magnetic Behavior of Grain Boundaries in Nd-Fe-B Magnets / V.V. Volkov ; Yimei Zhu |
| Crystallography and Defects |
| LEEM Investigations of bcc Metals Grown Heteroepitaxially on Sapphire / W. Swiech ; M. Ondrejeck ; R.S. Appleton ; C.S. Durfee ; M. Mundschau ; C.P. Flynn |
| Electron Backscatter Diffraction: A Powerful Tool for Phase Identification in the SEM / J.R. Michael ; R.P. Goehner |
| Measuring the Thin Film Strain Tensor Near Aluminum Grain Boundaries via a New Image Processing Approach to CBED HOLZ Patterns / J. Inoue ; A.F. Schwartzman ; L.B. Freund |
| Controlled Environment Transmission Electron Microscopy / I.M. Robertson |
| Analysis of the Atomic Scale Defect Chemistry in Oxygen Deficient Materials by STEM / Y. Ito ; S. Stemmer ; R.F. Klie ; N.D. Browning ; A. Sane ; T.J. Mazanec |
| Energy Dispersive X-ray Spectrometry With the Transition Edge Sensor Microcalorimeter: A Revolutionary Advanced in Materials Microanalysis / Dale Newbury ; David Wollman ; Kent Irwin ; Gene Hilton ; John Martinis |
| Surface Sensitivity Effects With Local Probe Scanning Auger-Scanning Electron Microscopy / D.T.L. van Agterveld ; G. Palasantzas ; J.Th.M. De Hosson |
| X-ray Elemental Mapping of Multi-Component Steels / Adam J. Papworth ; David B. Williams |
| High Sensitivity Convergent Beam Electron Diffraction for the Determination of the Tetragonal Distortion of Epitaxial Films / C. Schuer ; M. Leicht ; T. Marek ; H.P. Strunk |
| Determination of Coherency Strain Fields Around Coherent Particles in Ni-Al Alloys by HREM and CBED / H.A. Calderon ; L. Calzado ; C. Kisielowski ; C.Y. Wang ; R. Kilaas |
| An Electron Microscope Study of Diffusion Assisted Dislocation Processes in Intermetallic Gamma TiAl / F. Appel ; U. Lorenz ; M. Oehring |
| Specimen Current Imaging of Delamination in Ceramic Films on Metal Substrates in the SEM / S. Rangarajan ; A.H. King |
| In Situ Observation of Melting and Solidification / H. Saka ; S. Arai ; S. Muto ; H. Miyai ; S. Tsukimoto |
| Site Occupancy Determination by ALCHEMI of Nb and Cr in [gamma]-TiAl and Their Effects on the [alpha] to [gamma] Massive Phase Transformation / T.M. Miller ; L. Wang ; W.H. Hofmeister ; J.E. Wittig ; I.M. Anderson |
| Electron Channeling X-ray Microanalysis for Cation Configuration in Irradiated Magnesium Aluminate Spinel / S. Matsumura ; T. Soeda ; N.J. Zaluzec ; C. Kinoshita |
| In Situ Study of Zirconia Stabilization by Anion Exchange (N for O) Using High-Temperature, Controlled Atmosphere Electron Diffraction / Renu Sharma ; Eberhard Schweda ; Dirk Naedele |
| Environmental Scanning Electron Microscopy as a Tool to Study Shrinkage Microcracks in Cement-Based Materials / J. Bisschop ; J.G.M. van Mier |
| Microcharacterization of Heterogeneous Specimens Containing Tire Dust / Marina Camatini ; Gaia M. Corbetta ; Giovanni F. Crosta ; Tigran Dolukhanyan ; Giampaolo Giuliani ; Changmo Sung |
| Microelectronic Materials |
| Experimental Methods and Data Analysis for Fluctuation Microscopy / P.M. Voyles ; M.M.J. Treacy ; J.M. Gibson ; H-C. Jin ; J.R. Abelson |
| Microdiffraction, EDS, and HREM Investigation for Phase Identification With the Electron Microscope / P. Ruterana ; A. Redjaimia |
| Energy-Loss Filtered Imaging of Segregation-Induced Interface Broadening in SiGe/Si p-Channel MOSFET Device Structures / D.J. Norris ; A.G. Cullis ; T.J. Grasby ; E.H.C. Parker |
| Atomic-Scale Imaging of Dopant Atom Distributions Within Silicon [delta]-Doped Layers / R. Vanfleet ; D.A. Muller ; H.J. Gossmann ; P.H. Citrin ; J. Silcox |
| In Situ Annealing Transmission Electron Microscopy Study of Pd/Ge/Pd/GaAs Interfacial Reactions / F. Radulescu ; J.M. McCarthy ; E.A. Stach |
| Incoherent High-Resolution Z-Contrast Imaging of Silicon and Gallium Arsenide Using HAADF-STEM / Y. Kotaka ; T. Yamazaki ; Y. Kikuchi ; K. Watanabe |
| The Atomic Structure of Mosaic Grain Boundary Dislocations in GaN Epitaxial Layers / V. Potin ; G. Nouet ; R.C. Pond |
| Interface Structure and Zn Diffusion in the CdTe/ZnTe/Si System Grown by MBE / S-C. Y. Tsen ; P.A. Crozier ; S. Rujirawat ; G. Brill ; S. Sivananthan |
| Relationship Between Structure and Luminescent Properties of Epitaxial Grown Y[superscript 2]O[superscript 3]:Eu Thin Films on LaAlO[superscript 3] Substrates / H-J. Gao ; G. Duscher ; X.D. Fan ; S.J. Pennycook ; D. Kumar ; K.G. Cho ; P.H. Holloway ; R.K. Singh |
| Partially Ordered and Nanophase Materials |
| Imaging Heterophase Molecular Materials in the Environmental SEM / B.L. Thiel ; A.M. Donald ; D.J. Stokes ; I.C. Bache ; N. Stelmashenko |
| A New Approach Towards Property Nanomeasurements Using In Situ TEM / Z.L. Wang ; P. Poncharal ; W.A. de Heer ; R.P. Gao |
| Electron Microscopy of Single Molecules / D.E. Luzzi ; B.W. Smith |
| Nanocrystal Thickness Information From Z-STEM: 3-D Imaging in One Shot / A.V. Kadavanich ; T. Kippeny ; M. Erwin ; S.J. Rosenthal |
| Epitaxy and Atomic Structure Determination of Au/TiO[superscript 2] Interfaces by Combined EBSD and HRTEM / F. Cosandey ; P. Stadelmann |
| Theoretical Explanation of Pt Trimers Observed by Z-Contrast STEM / Karl Sohlberg ; Sokrates T. Pantelides ; Stephen J. Pennycook |
| Ion-Implanted Amorphous Silicon Studied by Variable Coherence TEM / J-Y. Cheng ; D.C. Jacobson |
| Analytical High-Resolution TEM Study on Au/TiO[superscript 2] Catalysts / T. Akita ; K. Tanaka ; S. Tsubota ; M. Haruta |
| High-Resolution Scanning Electron Microscopy and Microanalysis of Supported Metal Catalysts / Jingyue Liu |
| On-Particle EDS Analysis of Bimetallic, Carbon-Supported Catalysts / Deborah L. Boxall ; Edward A. Kenik ; Charles M. Lukehart |
| Interfaces in Metals and Ceramics |
| Structure Refinement of S-Phase Precipitates in Al-Cu-Mg Alloys by Quantitative HRTEM / V. Radmilovic ; U. Dahmen |
| Quantitative Mapping of Concentrations and Bonding States by Energy Filtering TEM / J. Mayer ; J.M. Plitzko |
| Combined HRTEM and EFTEM Study of Precipitates in Tungsten and Chromium-Containing TiB[superscript 2] / W. Mader ; B. Freitag ; K. Kelm ; R. Telle ; C. Schmalzried |
| High Spatial Resolution X-ray Microanalysis of Radiation-Induced Segregation in Proton-Irradiated Stainless Steels / E.A. Kenik ; J.T. Busby ; G.S. Was |
| Investigation of Copper Segregation to the [Sigma]5(310)/[001] Symmetric Tilt Grain Boundary in Aluminum / Jurgen M. Plitzko ; Geoffrey H. Campbell ; Wayne E. King ; Stephen M. Foiles |
| STEM Analysis of the Segregation of Bi to [Sigma]19a Grain Boundaries in Cu / W. Sigle ; L-S. Chang ; W. Gust ; M. Ruhle |
| Investigating Atomic Scale Phenomena at Materials Interfaces With Correlated Techniques in STEM/TEM / A.W. Nicholls ; E.M. James ; I. Arslan ; Y. Xin ; K. Kishida |
| Atomic Scale Analysis of Cubic Zirconia Grain Boundaries / E.C. Dickey ; X. Fan ; M. Yong ; S.B. Sinnott |
| SEM/EDX Spectrum Imaging and Statistical Analysis of a Metal/Ceramic Braze / Paul G. Kotula ; Michael R. Keenan ; Ian M. Anderson |
| Characterization of the Interface Between Lanthanum Hexa-Aluminate and Sapphire by Exit Wave Reconstruction / B. Wessler ; A. Steinecker |
| Atomic and Electronic Structure Analysis of [Sigma]=3, 9 and 27 Boundary, and Multiple Junction in [beta]-SiC / M. Kohyama |
| Electronic Effects on Grain Boundary Structure in bcc Metals / James Belak ; John A. Moriarty |
| Structural Study of a [100] 45[degree] Twist Plus 7.5[degree] Tilt Grain Boundary in Aluminium by HREM / M. Shamsuzzoha ; P.A. Deymier |
| Atomic Structure of Gold and Copper Boundaries / C.J.D. Hetherington |
| Formation of AlN Films on Ti/TiN Arc-Layer Interface With Al-0.5%Cu Interconnects Evaluated by XPS and Energy-Filtered-TEM / J. Gazda ; J. Zhao ; P. Smith ; R.A. White |
| Effects of "As Deposited" and Alloying Temperatures on the Distribution of Cu in 0.5%Cu-Al Films / P.L. Smith |
| Interfacial Interaction Between Cr Thin Films and Oxide Glasses / N. Jiang |
| Characterization of Intergranular Phases in Doped Zirconia Polycrystals / N.D. Evans ; P.H. Imamura ; J. Bentley ; M.L. Mecartney |
| The Effect of Different Oxidizing Atmospheres on the Initial Kinetics of Copper Oxidation as Studied In Situ UHV-TEM / Mridula D. Bharadwaj ; Anu Gupta ; J. Murray Gibson ; Judith C. Yang |
| Bonding in Ion-Implanted Carbon Films Characterized by TEM Spectrum Lines and Energy-Filtered Imaging / K.C. Walter |
| Author Index |
| Subject Index |
| Preface |
| Materials Research Society Symposium Proceedings |
| Magnetic Materials |
図書
