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1.

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1. Measurement for progress in science and technology : acta IMEKO 1979 : proceedings of the 8th IMEKO Congress of the International Measurement Confederation held from the 21st to the 27th May 1979, Moscow, USSR (v. 1 ; v. 2 ; v. 3)
general editor Gy. Striker ; editors, Judit Solt, T. Kemény
出版情報: Amsterdam ; New York : North-Holland, 1980  3 v. ; 25 cm
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2. Laser dimensional metrology : recent advances for industrial application : 5-7 October 1993, Brighton, United Kingdom (pbk.)
M. J. Downs, chair/editor ; organized by Sira Communications, Ltd. ; sponsored by Advanced Optics Group of the Institute of Physics ... [et al.]
出版情報: Bellingham, Wash., USA : SPIE, c1994  ix, 216 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 2088
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3. Interferometry VI : applications : 14-15 July 1993, San Diego, California
Ryszard J. Pryputniewicz, Gordon M. Brown, Werner P.O. Jüptner, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cosponsored by SEM--Society for Experimental Mechanics
出版情報: Bellingham, Wash., USA : SPIE, c1994  x, 362 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 2004
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4.

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4. Ultimate limits of fabrication and measurement
edited by M.E. Welland and J.K. Gimzewski
出版情報: Dordrecht ; Boston : Kluwer Academic, c1995  x, 254 p. ; 25 cm
シリーズ名: NATO ASI series ; Series E . Applied sciences ; no. 292
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5. Optical testing and metrology III : recent advances in industrial optical inspection : 8-13 July 1990, San Diego, California (: pt. 1 ; : pt. 2)
C.P. Grover, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash., USA : SPIE, c1990  2 v. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 1332
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6. Metrology at the frontiers of physics and technology
edited by L. Crovini and T.J. Quinn
出版情報: Amsterdam ; Tokyo : North-Holland, 1992  xviii, 646 p. ; 25 cm
シリーズ名: Rendiconti della Scuola internazionale di fisica "Enrico Fermi" ; course 110
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7. Optical testing and metrology II : 27-30 June 1988, Dearborn, Michigan
C.P. Grover, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering and ESD--the Engineering Society
出版情報: Bellingham, Wash., USA : SPIE, c1989  viii, 725 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 954
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8. 2nd Symposium of the Technical Committee, Measurement of Electrical Quantities--TC4 on industrial measurement of electrical and electronic components and equipment : Warsaw, Poland, May 26-28, 1987 : proceedings
International Measurement Confederation ; [edited by Tamás Kemény & Karolina Havrilla]
出版情報: Commack, N.Y. : Nova Science Publishers, [1988]  347 p. ; 25 cm
シリーズ名: IMEKO TC ; no. 19
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9. Sensors and transducers
general editor, Gy. Striker ; editors, Karolina Havrilla, Judit Solt, T. Kemény
出版情報: Amsterdam : North-Holland, 1983  xiii, 493 p. ; 25 cm
シリーズ名: Technological and methodological advances in measurement : ACTA IMEKO 1982 : proceedings of the 9th IMEKO Congress of the International Measurement Confederation held from the 24th to the 28th May 1982, Berlin-West ; v. 1
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10. Measurement of mechanical and physical quantities, metrology
general editor, Gy. Striker ; editors, Karolina Havrilla, Judit Solt, T. Kemény
出版情報: Amstrerdam : North-Hollsnd, 1983  ix, 575 p ; 25 cm
シリーズ名: Technological and methodological advances in measurement : ACTA IMEKO 1982 : proceedings of the 9th IMEKO Congress of the International Measurement Confederation held from the 24th to the 28th May 1982, Berlin-West ; v. 2
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11.

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11. Data processing and system aspects
general editor, Gy. Striker ; editors, Karolina Havrilla, Judit Solt, T. Kemény
出版情報: Amsterdam : North-Holland, 1983  ix, 550 p. ; 25 cm
シリーズ名: Technological and methodological advances in measurement : ACTA IMEKO 1982 : proceedings of the 9th IMEKO Congress of the International Measurement Confederation held from the 24th to the 28th May 1982, Berlin-West ; v.3
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12. Integrated circuit metrology : May 4-5, 1982, Arlington, Virginia (pbk.)
Diana Nyyssonen, chairman/editor ; cooperating organization, National Bureau of Standards
出版情報: Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1982  vi, 132 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 342
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13. Integrated circuit metrology II : May 3-4, 1984, Arlington, Virginia (pbk.)
Diana Nyyssonen, chairman/editor ; cooperating organization, National Bureau of Standards
出版情報: Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1984  vi, 172 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 480
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14.

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14. Measurement and instrumentation : Acta IMEKO 1973 : proceedings of the 6th Congress of the International Measurement Confederation (set: N. Holland - v. 3: Elsevier)
edited under the guidance of Gy. Striker by Judit Solt, E. Nika, T. Kemény
出版情報: Amsterdam : North-Holland Pub. Co. , New York : American Elsevier, 1974  3 v. ; 25 cm
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15. Three-dimensional image capture and applications II : 25-26 January 1999, San Jose, California
Joseph H. Nurre, Brian R. [i.e., D.] Corner, chairs/editors ; sponsored by IS&T--The Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash., USA : SPIE, c1999  v, 256 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3640
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16. Machine vision applications in industrial inspection XI :proceedings of electronic imaging science and technology 2003 : 22-24 January 2003, Santa Clara, California, USA
Martin A. Hunt, Jeffery R. Price, chair/editor ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash. : SPIE, c2003  vii, 324 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 5011
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17. VECIMS'03 : 2003 IEEE International Symposium on Virtual Environments, Human-Computer Interfaces and Measurement Systems : Università della Svizzera Italiana, Lugano, Switzerland, 17-29 July, 2003
sponsored by the IEEE Instrumentation and Measurement Scoiety ... [et al.] ; with the technical cooperation of: IEEE Computer Society--Technical Committee on Visualization and Graphics ... [et al.]
出版情報: Piscataway, New Jersey : IEEE, c2003  x, 217 p. ; 28 cm
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18. CIMSA'03 : 2003 IEEE International Symposium on Computational Intelligence for Measurement Systems and Applications : Università della Svizzera Italiana, Lugano, Switzerland, 29-31 July, 2003
sponsored by IEEE Instrumentation and Measurement Society ... [et al.] ; with the technical cooperation of European Neural Networks Society ... [et al.]
出版情報: Piscataway, New Jersey : IEEE, c2003  xi, 235 p. ; 28 cm
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19.

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19. Astrophysics, clocks and fundamental constants (: pbk)
S.G. Karshenboim, E. Peik (eds.)
出版情報: Berlin ; New York : Springer, c2004  xviii, 346 p. ; 25 cm
シリーズ名: Lecture notes in physics ; 648
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目次情報: 続きを見る
An Introduction to Varying Fundamental Constants / Savely G. Karshenboim ; Ekkehard Peik
Introduction / 1：
Fundamental Constants / 2：
Variability of Fundamental Constants / 3：
'Fundamentality' of the Fundamental Constants / 3.1：
'Constancy' of the Fundamental Constants / 3.2：
Intercorrelations Between the Fundamental Constants / 3.3：
Variability of Fundamental Constants and Equivalence Principle / 3.4：
Astrophysical and Geophysical Search for a Variability of Constants / 4：
New Frequency Standards and Constraints on Variation of Fundamental Constants / 5：
Summary: Results and Open Questions / 6：
Astrophysics / Part I：
Time and the Universe / Gerhard Börner
The Cosmological Models
The History of the Universe
The Cosmic Microwave Background
The Inflationary Model
Variation of the Fine Structure Constant
Conclusions / 7：
Millisecond Pulsars as Tools of Fundamental Physics / Michael Kramer
Pulsars
Pulsars as Neutron Stars / 2.1：
Pulsars as Radio Sources / 2.2：
A Pulsar's Life
Normal Pulsars
Millisecond Pulsars
Pulsars as Clocks
Time Transfer / 4.1：
Pulsar Timing / 4.2：
Applications of Pulsars
PPN Parameters / 5.1：
Tests Using Double Neutron Stars / 5.2：
Tests Using Profile Structure Data / 5.3：
Recent Discoveries / 5.4：
The Double-Pulsar
Conclusions and Outlook
Fundamental Units: Physics and Metrology / Lev B. OkunPart II：
Fundamental Parameters and Units
Planck Units
c, h, G - Units
Planck Units Are Impractical
Units of Stoney
Atomic Clocks and c
Towards a Kilogram Based on h / 8：
Kilogram as Frequency νκ / 9：
Electromagnetism and Relativity / 10：
Concluding Remarks / 11：
Constants, Units and Standards / Jeff Flowers ; Brian Petley
Early Measurements / 1.1：
The Fundamental Physical Constants / 1.2：
Units and Standards
Use of the Fundamental Constants to Form Systems of Units
Are the Constants Really Constant?
The CODATA Evaluations / 2.3：
Changing Accuracy / 2.4：
Accuracy of Realization of the SI Units
Practical Realizations of the SI Units and the Involvement of Fundamental Constants
The Josephson Effect Voltage Standard
The Quantised Hall Resistance
The Calculable Capacitor / 4.3：
The Moving Coil Watt Realization of Kibble / 4.4：
The Kilogram / 4.5：
The Anomalous g-Factor of the Electron / 4.6：
The Rydberg Constant / 4.7：
The Newtonian Constant of Gravitation / 4.8：
Underpinning of the SI by the Fundamental Physical Constants
The Importance of the Fine Structure Constant in Metrology
Conclusion
Future / 6.1：
Summary
Grand Unification and Quantum Gravity / Part III：
Time Varying Fundamental Constants, Extra Dimensions and the Renormalization Group / William J. Marciano
Dirac Revisited - The Hierarchy Problem
Fundamental Constants from a Modern Perspective
Extra Dimensions
Renormalization Group Connections
Examples
Discussions
Fundamental Constants and Their Possible Time Dependence / Harald Fritzsch
Variation of Fundamental Constants and Grand Unification
Quantum Gravity and Fundamental Constants / Claus Kiefer
Quantum General Relativity
Superstring Theory ('M-theory')
Kaluza-Klein Theories
Astrophysical and Geochemical Search / Part IV：
Constraining Variations in the Fine-Structure Constant, Quark Masses and the Strong Interaction / Michael T. Murphy ; Victor V. Flambaum ; John K. Webb ; Vladimir V. Dzuba ; Jason X. Prochaska ; Arthur M. Wolfe
Varying α from Quasar Absorption Lines
Quasar Absorption Lines
The Many-Multiplet (MM) Method
Spectral Analysis and Updated Results
Recent Criticisms of the MM Method
Isotopic Abundance Variations / 2.5：
Varying α and mq/ΛQCD from Atomic Clocks
Nuclear Magnetic Moments, α and mq/ΛQCD
Results
Astrophysical Constraints on Hypothetical Variability of Fundamental Constants / Sergei A. Levshakov
Methods to Constrain Δα/α from QSO Absorption Spectra
The Alkali-Doublet (AD) Method
The Many Multiplet (MM) Method
The Regression MM Method
Constraints on the Proton to Electron Mass Ratio
Conclusions and Future Prospects
Oklo Constraint on the Time-Variability of the Fine-Structure Constant / Yasunori Fujii
What Is the Oklo Phenomenon?
How Did Shlyakhter Probe Δα?
How Good Is It?
How Can It Be Consistent with the QSO Result?
Bound on Δα/α from the Coulomb-Only Estimate / A：
Distant Migration of the Higher Resonances / B：
Another 3-Parameter Fit with an Offset / C：
Precision Frequency Measurements with Neutral Atoms / Part V：
Cold Atom Clocks, Precision Oscillators and Fundamental Tests / S. Bize ; P. Wolf ; M. Abgrall ; L. Cacciapuoti ; A. Clairon ; J. Grünert ; Ph. Laurent ; P. Lemonde ; A.N. Luiten ; I. Maksimovic ; C. Mandache ; H. Marion ; F. Pereira Dos Santos ; P. Rosenbusch ; C. Salomon ; G. Santarelli ; Y. Sortais ; M.E. Tobar ; C. Vian ; S. Zhang
Test of Local Position Invariance. Stability of Fundamental Constants
Theory
Experiments with 87Rb and 133Cs Fountain Clocks
Tests of Local Lorentz Invariance
Experimental Results
Conclusion and Outlook
Precision Spectroscopy of Atomic Hydrogen and Variations of Fundamental Constants / M. Fischer ; N. Kolachevsky ; M. Zimmermann ; R. Holzwarth ; Th. Udem ; T.W. Hänsch ; P. Laurent
Hydrogen Spectrometer
Frequency Measurement
Determination of Drift Rates
An Optical Frequency Standard with Cold and Ultra-cold Calcium Atoms / Fritz Riehle ; Carsten Degenhardt ; Christian Lisdat ; Guido Wilpers ; Harald Schnatz ; Tomas Binnewies ; Hardo Stoehr ; Uwe Sterr
Methods and Experimental Realization
Properties of the Calcium Standard
Production of Cold Ca Atoms (T ≈ 3 mK)
Production of Ultra-cold Atoms
Interrogation of the Clock Transition
Uncertainty of the Optical Ca Frequency Standard
Residual First-order Doppler Shifts
Other Phase Shifts
Frequency Shifts Due to External Fields
Influence of Cold and Ultra-cold Atomic Collisions
Uncertainty Budget / 3.5：
Frequency Measurements
Prospects of the Ca Optical Frequency Standard
Frequency Standards with a Single Trapped Ion / Part VI：
Trapped Ion Optical Frequency Standards for Laboratory Tests of Alpha-Variability / Christian Tamm ; Tobias Schneider
The Single Ion as a Reference in an Optical Clock
Spectroscopy of the 435.5 nm Clock Transition of 171Yb+
Absolute Transition Frequency and Frequency Comparison Between Two Ions
Search for Temporal Variation of the Fine-Structure Constant
Nuclear Optical Frequency Standard with Th-229
An Optical Frequency Standard Based on the Indium Ion / Petrissa Eckle ; Mario Eichenseer ; Alexander Y. Nevsky ; Christian Schwedes ; Joachim von Zanthier ; Herbert Walther
Cooling of the Indium Ion
New Cooling Laser System
High-Resolution Spectroscopy
Absolute Frequency Measurements
High-Resolution Molecular Spectroscopy / Part VII：
Applications of Femtosecond Laser Comb to Nonlinear Molecular Spectroscopy / Jun Ye ; R. Jason Jones ; Lisheng Chen ; Kevin W. Holman ; David J. Jones
Introduction to Femtosecond Optical Frequency Comb
Molecular Spectroscopy Aided by Femtosecond Optical Frequency Comb
I2 Hyperfine Interactions, Optical Frequency Standards and Clocks
Extend Phase-Coherent fs Combs to the Mid-IR Spectral Region
Femtosecond Lasers and External Optical Cavities
Ultracold Trapped Molecules: Novel Systems for Tests of the Time-Independence of the Electron-to-Proton Mass Ratio / U. Fröhlich ; B. Roth ; P. Antonini ; C. Lämmerzahl ; A. Wicht ; S. Schiller
Molecular Tests of Constancy of Electron-to-Nucleon Mass Ratios
Sympathetic Cooling of Molecular Ions and Spectroscopy
Quantum Jump Spectroscopy
Space Missions and General Relativity / Part VIII：
35 Years of Testing Relativistic Gravity: Where Do We Go from Here? / Slava G. Turyshev ; James G. Williams ; Kenneth Nordtvedt, Jr. ; Michael Shao ; Thomas W. Murphy, Jr.
Scientific Motivation
PPN Parameters and Their Current Limits
Motivations for Precision Gravity Experiments
Lunar Laser Ranging: A Unique Laboratory in Space
LLR History and Scientific Background
Equivalence Principle Tests
LLR Tests of the Equivalence Principle
LLR Tests of Other Gravitational Physics Parameters
APOLLO Contribution to the Tests of Gravity
New Test of Relativity: The LATOR Mission
Overview of LATOR
The Expected Results from LATOR
Search for New Physics with Atomic Clocks / Lute Maleki ; John Prestage
The Instrument
Temperature Induced Frequency Shifts
Mission Design
Index
An Introduction to Varying Fundamental Constants / Savely G. Karshenboim ; Ekkehard Peik
Introduction / 1：
Fundamental Constants / 2：
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20. Three-dimensional image capture and applications III : 24-25 January 2000, San Jose, California
Brian D. Corner, Joseph H. Nurre, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash. : SPIE, c2000  vii, 272 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3958
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21.

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21. Machine vision applications in industrial inspection VIII : 24-26 January 2000, San Jose, California
Kenneth W. Tobin, Jr., chair/editor ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash. : SPIE, c2000  ix, 396 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3966
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22.

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22. Advances in metrology for x-ray and EUV optics : 2-3 August 2005, San Diego, California, USA
Lahsen Assoufid, Peter Z. Takacs, John S. Taylor, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash. : SPIE, c2005  1 v. (various pagings) ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 5921
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23.

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23. Advances in metrology for x-ray and EUV optics II : 30 August 2007, San Diego, California, USA
Lahsen Assoufid, Peter Z. Takacs, Masaru Ohtsuka, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash. : SPIE, c2007  1 v. (various pagings) ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 6704
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24. Fertigungsmesstechnik und Qualitätssicherung : Fachkongreß zur MICROTECNIC '90, 18. und 19. Oktober 1990
VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik
出版情報: Düsseldorf : VDI-Verlag, c1990  236 p. ; 23 cm
シリーズ名: VDI-Berichte ; 836
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25.

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25. Fertigungsmesstechnik und Qualitätssicherung : Fachkongreß zur MICROTECNIC '92, 22. und 23. Oktober 1992
VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik
出版情報: Düsseldorf : VDI-Verlag, c1992  212 p. ; 23 cm
シリーズ名: VDI-Berichte ; 1006
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26.

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26. Fertigungsmesstechnik und Qualitätssicherung : Fachkongreß zur MICROTECNIC '94, 20. und 21. Oktober 1994
VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik
出版情報: Düsseldorf : VDI-Verlag, c1994  128 p. ; 23 cm
シリーズ名: VDI-Berichte ; 1155
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