Advanced materials and devices for sensing and imaging : 17-18 October 2002, Shanghai, China | 東京工業大学附属図書館蔵書検索

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Advanced materials and devices for sensing and imaging : 17-18 October 2002, Shanghai, China / Jianquan Yao, Yukihiro Ishii, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering [and] COS--Chinese Optical Society ; cooperating organizations, Shanghai Jiaotong University (China) ... [et al.] ; supported by National Natural Science Foundation of China ... [et al.]

資料種別:

図書

出版情報:

Bellingham, Wash., USA : SPIE, c2002

形態:

xiii, 548 p. ; 28 cm

シリーズ名:

Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4919 <BA0022700X>

著者名:

Advanced Materials and Devices for Sensing and Imaging

Ishii, Yukihiro

Society of Photo-optical Instrumentation Engineers <DA00848546>

Chinese Optical Society <DA04252785>

上海交通大学 <DA10697673>

National Natural Science Foundation of China <DA04495550>

さらに 2 件

ISBN:

9780819447081 [0819447080]

書誌ID:

BA85967751

子書誌情報

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書誌詳細

注記:	Includes bibliographical references and index
著者名ヨミ:	シャンハイコウツウダイガク shang hai jiao tong da xue
主題:	Detectors--Materials--Congresses; Metrology--Congresses; Optical fiber detectors--Materials--Congresses; Optoelectronic devices--Materials--Congresses; Photonics--Congresses
言語:	英語

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