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IEEE VLSI Test Symposium, IEEE Computer Society. Technical Committee on Test Technology, Institute of Electrical and …
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Barr, T. L. (Tery Lynn), 1939-, Davis, L. E., ASTM Committee E-42 on Surface Analysis, Pittsburgh Conference on …
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Vinogradov, A. V., Society of Photo-optical Instrumentation Engineers
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Datla, Raju V., Hanssen, Leonard M., Society of Photo-optical Instrumentation Engineers
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Hanssen, Leonard M., Society of Photo-optical Instrumentation Engineers
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Symposium on the Application of Surface Analysis Methods to Environmental/Material Interactions, Baer, D. R. (Donald …
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International Conference on Hyperfine Interactions, 4th, Drew University, 1977, Raghavan, R. S. (Ramaswamy Srinivasa), …
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Ultrasonic Symposium, 1978, Cherry Hill, New Jersey,1978.9.25-27
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