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1.

図書
図書
1. Principles of crystal structure determination
[by] Gene B. Carpenter
出版情報: New York : W.A. Benjamin, 1969  xii, 237 p. ; 24 cm
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2.

図書
図書
2. Crystal structures of clay minerals and their X-ray identification. [New ed.]
edited by G.W. Brindley and G. Brown
出版情報: London : Mineralogical Society, 1980  495 p. ; 23 cm
シリーズ名: Mineralogical Society monograph ; no. 5
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3.

図書
図書
3. Lattice defects in ice crystals : X-ray topographic observations
Akira Higashi, editor
出版情報: Sapporo : Hokkaido University Press, 1988  viii, 156 p. ; 30 cm
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4.

図書
図書
4. Crystal structure determination
Werner Massa ; translated into English by Robert O. Gould
出版情報: New York : Springer, 2000  xi, 206 p. ; 24 cm
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目次情報: 続きを見る
Introduction / 1：
Crystal Lattices / 2：
The Lattice / 2.1：
The Unit Cell / 2.1.1：
Atom Parameters / 2.1.2：
The Seven Crystal Systems / 2.1.3：
The Fourteen Bravais Lattices / 2.2：
The Hexagonal, Trigonal and Rhombohedral Systems / 2.2.1：
The Reduced Cell / 2.2.2：
The Geometry of X-Ray Diffraction / 3：
X-Rays / 3.1：
Interference by a One-Dimensional Lattice / 3.2：
The Laue Equations / 3.3：
Lattice Planes and hkl-Indices / 3.4：
The Bragg Equation / 3.5：
Higher Orders of Diffraction / 3.6：
The Quadratic Form of the Bragg Equation / 3.7：
The Reciprocal Lattice / 4：
From the Direct to the Reciprocal Lattice / 4.1：
The Ewald Construction / 4.2：
Structure Factors / 5：
Atom Formfactors / 5.1：
Atom Displacement Factors / 5.2：
Crystal Symmetry / 5.3：
Simple Symmetry Elements / 6.1：
Coupling of Symmetry Elements / 6.1.1：
Combination of Symmetry Elements / 6.1.2：
Symmetry Directions / 6.2：
Symmetry Elements Involving Translation / 6.3：
Combination of Translation with Other Symmetry Elements / 6.3.1：
Coupling of Translation with Other Symmetry Elements / 6.3.2：
The 230 Space Groups / 6.4：
Space-group Notation in International Tables for Crystallography / 6.4.1：
Centrosymmetric Crystal Structures / 6.4.2：
The Asymmetric Unit / 6.4.3：
Space Group Types / 6.4.4：
Group-Subgroup Relationships / 6.4.5：
Visible Effects of Symmetry / 6.5：
Microscopic Structure / 6.5.1：
Macroscopic Properties and Crystal Classes / 6.5.2：
Symmetry of the Lattice / 6.5.3：
Symmetry of the Diffraction Pattern--The Laue Groups / 6.5.4：
Determination of the Space Group / 6.6：
Determination of the Laue Group / 6.6.1：
Systematic Absences / 6.6.2：
Transformations / 6.7：
Experimental Methods / 7：
Growth, Choice and Mounting of a Single Crystal / 7.1：
Measuring the Diffraction Pattern of Single Crystals / 7.2：
Film Methods / 7.2.1：
The Four-circle (serial) Diffractometer / 7.2.2：
Reflection profile and scan type / 7.2.3：
Area Detector Systems / 7.3：
Data Reduction / 7.4：
Lp correction / 7.4.1：
Standard Uncertainty / 7.4.2：
Absorption Correction / 7.4.3：
Other Diffraction Methods / 7.5：
Neutron Scattering / 7.5.1：
Electron Scattering / 7.5.2：
Structure Solution / 8：
Fourier Transforms / 8.1：
Patterson Methods / 8.2：
Symmetry in Patterson Space / 8.2.1：
Structure Solution Using Harker Peaks / 8.2.2：
Patterson shift methods / 8.2.3：
Direct Methods / 8.3：
Harker-Kasper Inequalities / 8.3.1：
Normalized Structure Factors / 8.3.2：
The Sayre Equation / 8.3.3：
The Triplet Relationship / 8.3.4：
Origin Fixation / 8.3.5：
Strategies of Phase Determination / 8.3.6：
Structure Refinement / 9：
The Method of Least Squares / 9.1：
Refinement Based on F[subscript o] or F[superscript 2 subscript o] Data / 9.1.1：
Weights / 9.2：
Crystallographic R-Values / 9.3：
Refinement Techniques / 9.4：
Location and Treatment of Hydrogen Atoms / 9.4.1：
Restricted Refinement / 9.4.2：
Damping / 9.4.3：
Symmetry Restrictions / 9.4.4：
Residual Electron Density / 9.4.5：
Rietveld Refinement / 9.5：
Additional Topics / 10：
Disorder / 10.1：
Site Occupancy Disorder / 10.1.1：
Positional and Orientational Disorder / 10.1.2：
One- and Two-Dimensional Disorder / 10.1.3：
Modulated Structures / 10.1.4：
Quasicrystals / 10.1.5：
Anomalous Dispersion and "Absolute Structure" / 10.2：
Chiral and Polar Space Groups / 10.2.1：
Extinction / 10.3：
The Renninger Effect / 10.4：
The [lambda]/2-Effect / 10.5：
Thermal Diffuse Scattering (TDS) / 10.6：
Errors and Pitfalls / 11：
Wrong Atom-Types / 11.1：
Twinning / 11.2：
Classification by the Twin-Element / 11.2.1：
Classification According to Macroscopic Appearance / 11.2.2：
Classification According to Origin / 11.2.3：
Diffraction Patterns of Twinned Crystals and their Interpretation / 11.2.4：
Twinning or Disorder? / 11.2.5：
False Unit Cells / 11.3：
Space Group Errors / 11.4：
Misplaced Origins / 11.5：
Poor Atom Displacement Parameters / 11.6：
Interpretation and Presentation of Results / 12：
Bond Lengths and Bond Angles / 12.1：
Best Planes and Torsion Angles / 12.2：
Structural Geometry and Symmetry / 12.3：
Structural Diagrams / 12.4：
Electron Density / 12.5：
Crystallographic Databases / 13：
The Inorganic Crystal Structure Database (ICSD) / 13.1：
The Cambridge Structural Database (CSD) / 13.2：
The Metals Crystallographic Data File (CRYST-MET) / 13.3：
Other Collections of Crystal Structure Data / 13.4：
Deposition of Structural Data in Data Bases / 13.5：
Crystallography on the Internet / 13.6：
Outline of a Crystal Structure Determination / 14：
Worked Example of a Structure Determination / 15：
Bibliography
Index
Introduction / 1：
Crystal Lattices / 2：
The Lattice / 2.1：
5.

図書
図書
5. Crystal structure analysis : a primer (: hrd ; : pbk.)
[by] Jenny Pickworth Glusker [and] Kenneth N. Trueblood
出版情報: New York : Oxford University Press, 1972  xv, 192 p. ; 23 cm
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6.

図書
図書
6. The Rotation method in crystallography : data collection from macromolecular crystals
edited by U. W. Arndt and A. J. Wonacott
出版情報: Amsterdam ; New York : North-Holland Pub. Co., 1977 , New York : sole distributors for the U.S.A. and Canada, Elsevier/North-Holland, 1977  xvii, 275 p. ; 25 cm
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7.

図書
図書
7. Interpretation of X-Ray powder diffraction patterns
H. Lipson, H. Steeple
出版情報: London : Macmillan , New York : St Martin's Press, 1970  viii, 335 p., 3 p. of plates ; 24 cm
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8.

図書
図書
8. Low-temperature X-ray diffraction : apparatus and techniques
Reuben Rudman
出版情報: New York ; London : Plenum Press, c1976  xvi, 344 p. ; 24 cm
シリーズ名: Monographs in low-temperature physics
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9.

図書
図書
9. Structure determination by X-ray crystallography. 2nd ed (pbk.)
M.F.C. Ladd and R.A. Palmer
出版情報: New York : Plenum Press, c1985  xxii, 502 p. ; 24 cm.
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目次情報: 続きを見る
Physical Constants and Other Numerical Data
Notation
Crystal Morphology and Crystal Symmetry / Chapter 1：
Introduction / 1.1：
The Crystalline State / 1.2：
Stereographic Projection / 1.3：
External Symmetry of Crystals / 1.4：
Bibliography
Problems
Lattices and Space-Group Theory / Chapter 2：
Lattices / 2.1：
Families of Planes and Interplanar Spacings / 2.3：
Reciprocal Lattice-Geometrical Treatment / 2.4：
Unit-Cell Transformation / 2.5：
Rotational Symmetries of Lattices / 2.6：
Space Groups / 2.7：
Matrix Representation of Symmetry Operations / 2.8：
Diffraction Symbols / 2.9：
I X-rays, X-ray Diffraction, and Structure Factors II Intensities and Intensity Statistics / Chapter 3：
X-rays, X-ray Diffraction, and Structure Factors / I：
Generation and Properties of X-rays / 3.1：
X-ray Scattering / 3.2：
Scattering by Regular Arrays of Atoms / 3.3：
Reciprocal Lattice-Analytical Treatment / 3.4：
Scattering by a Crystal Structure / 3.5：
Using the Structure Factor Equation / 3.6：
Limiting Conditions and Systematic Absences / 3.7：
Practical Determination of Space Groups from Diffraction Data / 3.8：
Intensities and Intensity Statistics / II：
Intensity Expressions and Factors Affecting Intensities / 3.9：
Intensity Statistics / 3.10：
I Optical and X-ray Examination of Crystals II Measurement of Intensity Data from Single Crystals / Chapter 4：
Optical and X-ray Examination of Crystals
Polarized Light / 4.1：
Optical Classification of Crystals / 4.3：
Single-Crystal X-ray Techniques / 4.4：
Recognition of Crystal System / 4.5：
Measurement of Intensity Data from Single Crystals
Intensity Measurements on Photographs / 4.6：
Single-Crystal X-ray Diffractometry / 4.7：
Area Detectors (Position-Sensitive Detectors) / 4.8：
Monochromators / 4.9：
Focusing Mirrors / 4.10：
Twinning / 4.11：
Fourier Series and Fourier Transforms / Chapter 5：
Image Formation and Focusing / 5.1：
Fourier Series / 5.2：
Fourier Series in X-ray Crystallography / 5.3：
Holes and Atoms / 5.4：
Generalized Fourier Transform / 5.5：
Practice with Transforms / 5.6：
Some General Properties of Transforms / 5.7：
Convolution / 5.8：
Structure Solution in Brief / 5.9：
Fourier Techniques in X-ray Structure Determination / Chapter 6：
Analysis of the Unit-Cell Contents / 6.1：
Interpretation of Electron Density Distributions / 6.3：
Methods of Solving the Phase Problem / 6.4：
Anomalous Scattering / 6.5：
Neutron Diffraction / 6.6：
Direct Methods and Refinement / Chapter 7：
Direct Methods of Phase Determination / 7.1：
Patterson Search Methods / 7.3：
Least-Squares Refinement / 7.4：
Molecular Geometry / 7.5：
Precision / 7.6：
Correctness of a Structure Analysis / 7.7：
Limitations of X-ray Structure Analysis / 7.8：
Disorder in Single Crystals / 7.9：
Computer Prediction of Crystal Structures / 7.10：
Examples of Crystal Structure Determination / Chapter 8：
Crystal Structure of 2-Bromobenzo[b]indeno[1,2-e]pyran / 8.1：
Crystal Structure of Potassium 2-Hydroxy-3,4-dioxocyclobut-1-ene-1-olate Monohydrate KHSO / 8.3：
Structure Analysis by X-ray and Neutron Diffraction / 8.4：
Determination of an Intermediate Size Crystal Structure Using Direct Methods / 8.5：
Concluding Remarks / 8.6：
X-ray Structure Determination with Powders / Chapter 9：
Basis of the Powder Method / 9.1：
Data Collection / 9.3：
Indexing Powder Patterns / 9.4：
Extracting Integrated Intensities from a Powder Pattern / 9.5：
Rietveld Refinement / 9.6：
Examples of Solved Structures / 9.7：
Powder Diffraction with Proteins / 9.8：
Proteins and Macromolecular X-ray Analysis / 9.9：
Crystallization of Proteins and Complexes for X-ray Analysis / 10.1：
Crystal Mounting for X-ray Data Collection / 10.3：
Macromolecular Crystallography / 10.4：
Types of Fourier Synthesis for Protein Analysis / 10.5：
Determination of the Phases for Protein Crystals / 10.6：
Siras and MAD Phasing / 10.7：
Use of Phase Information and Density Modification / 10.8：
Macromolecular Structure Refinement and Solvent and Ligand Fitting / 10.9：
Structure Validation: Final Checks / 10.10：
Geometry Validation: Final Checks / 10.11：
Computer-Aided Crystallography / Chapter 11：
Derivation of Point Groups (EULR*) / 11.1：
Point-Group Recognition (SYMM*) / 11.3：
Structure Determination Simulation (XRAY*) / 11.4：
Crystal Structure Analysis Problems / 11.5：
General Crystal Structure and Other Programs / 11.6：
Automatic Powder Indexing (ITO12*) / 11.7：
Automatic Powder Structure Solving (ESPOIR*) / 11.8：
Appendices
Stereoviews and Crystal Models / A1：
Analytical Geometry of Direction Cosines / A2：
Schonflies' Symmetry Notation / A3：
Rotation Matrices / A4：
Spherical Trigonometry / A5：
Trigonometrical Formulae / A6：
Cartesian Coordinates / A7：
The integral [function of superscript infinity subscript 0 (sin x)/x] dx / A8：
Gamma Function / A9：
Crystallographic Software / A10：
Tutorial Solutions
Index / Solutions 1：
Physical Constants and Other Numerical Data
Notation
Crystal Morphology and Crystal Symmetry / Chapter 1：
10.

図書
図書
10. X-ray structure determination : a practical guide
[by] George H. Stout [and] Lyle H. Jensen
出版情報: New York : Macmillan, [1968]  xi, 467 p. ; 24 cm
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11.

図書
図書
11. X-ray methods in the study of defects in single crystals
by J. Auleytner. Translated from the Polish by Janusz Leciejewicz
出版情報: Oxford ; New York : Pergamon Press, c1967  x, 264 p. ; 23 cm
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12.

図書
図書
12. Crystal structure determination : the role of the cosine seminvariants
Herbert A. Hauptman
出版情報: New York ; London : Plenum Press, 1972  xii, 407 p. ; 26 cm
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13.

図書
図書
13. X-ray diffraction. Facsimile ed. / by UMI
by B.E. Warren
出版情報: Reading (Mass) ; London : Addison-Wesley, c1969  [10], 381p ; 24cm
シリーズ名: Addison-Wesley series in metallurgy and materials
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14.

図書
図書
14. X-ray crystallography : an introduction to the investigation of crystals by their diffraction of monochromatic X-radiation
by M.J. Buerger
出版情報: New York : John Wiley, c1942  xxii, 531 p., [4] leaves of plates: ill. ; 24 cm
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15.

図書
図書
15. X-Ray powder photography in inorganic chemistry
by R.W.M. D'Eye, E. Wait ; sponsored by the United Kingdom Atomic Energy Authority, Harwell
出版情報: London : Butterworthes Scientific , New Yrok : Academic Press, 1960  viii, 222 p. ; 23 cm
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16.

図書
図書
16. Diffraction methods
[by] John Wormald
出版情報: Oxford : Clarendon Press, 1973  xii, 100 p ; 22 cm
シリーズ名: Oxford chemistry series ; no. 10
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17.

図書
図書
17. The Laue method
José Luis Amorós, Martin J. Buerger, Marisa Canut de Amorós
出版情報: New York : Academic Press, 1975  xi, 375 p. ; 24 cm
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18.

図書
図書
18. X-ray crystallography : an introduction to the theory and practice of single-crystal structure analysis
[by] G. H. W. Milburn
出版情報: London : Butterworths, 1973  [9], 217 p ; 23 cm
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19.

図書
図書
19. Fourier methods in crystallography
[by] G.N. Ramachandran [and] R. Srinivasan
出版情報: New York : Wiley-Interscience, [1970]  xiii, 259 p. ; 24 cm
シリーズ名: Wiley monographs in crystallography
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20.

図書
図書
20. Structure determination by X-ray crystallography
M. F. C. Ladd and R. A. Palmer
出版情報: New York : Plenum Press, c1977  xvi, 393 p. ; 24 cm
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21.

図書
図書
21. X-ray diffraction
B.E. Warren
出版情報: Reading, Mass. : Addison-Wesley Pub. Co, c1969  vii, 381 p ; 24 cm
シリーズ名: Addison-Wesley series in metallurgy and materials
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22.

図書
図書
22. X-ray crystal structure
Dan McLachlan, Jr.
出版情報: New York : McGraw-Hill, 1957  xiii, 416 p. ; 24 cm
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23.

図書
図書
23. Methods in x-ray crystallography
[by] J. W. Jeffery
出版情報: London ; New York : Academic Press, 1971  xxix, 571 p ; 24 cm
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24.

図書
図書
24. Elements of X-ray crystallography
[by] Leonid V. Azároff
出版情報: New York : McGraw-Hill, [1968]  xvi, 610 p. ; 23 cm
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25.

図書
図書
25. An introduction to X-ray crystallography
[by] M. M. Woolfson
出版情報: Cambridge : Cambridge University Press, 1970  ix, 380 p ; 24 cm
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目次情報: 続きを見る
Preface to the first edition
Preface to the second edition
The geometry of the crystalline state / 1：
The scattering of X-rays / 2：
Diffraction from a crystal / 3：
The Fourier transform / 4：
The experimental collection of diffraction data / 5：
The factors affecting X-ray intensities / 6：
The determination of space groups / 7：
The determination of crystal structures / 8：
Accuracy and refinement processes / 9：
References
Appendices
Physical constants and tables
Solutions to examples
Bibliography
Index
Preface to the first edition
Preface to the second edition
The geometry of the crystalline state / 1：
26.

図書
図書
26. X-ray scattering of synthetic polymers
F.J. Baltá-Calleja, C.G. Vonk
出版情報: Amsterdam [Netherlands] ; Tokyo : Elsevier, c1989  xi, 317 p. ; 25 cm
シリーズ名: Polymer science library ; 8
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27.

図書
図書
27. X-ray analysis and the structure of organic molecules
by Jack D. Dunitz
出版情報: Ithaca : Cornell University Press, c1979  514 p. ; 24 cm
シリーズ名: The George Fisher Baker non-resident lectureship in chemistry at Cornell University
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目次情報: 続きを見る
Crystal Structure Analysis: Diffraction of X-Rays by Crystals / Part One：
Internal Symmetry of Crystals Methods of Crystal
Structure Analysis Methods of Crystal
Structure Refinement Treatment of the Results
Experimental Aspects of X-Ray Analysis
Molecular Structure: Crystal Structure Analysis and Chemistry / Part Two：
Electron-Density Distributions in Molecules
Geometric Constraints in Cyclic
Molecules Conformational Maps and Space Groups
Crystal Structure Analysis: Diffraction of X-Rays by Crystals / Part One：
Internal Symmetry of Crystals Methods of Crystal
Structure Analysis Methods of Crystal
28.

図書
図書
28. X-ray analysis of organic structures
by S.C. Nyburg
出版情報: New York : Academic Press, 1961  xii, 434 p. ; 24 cm
シリーズ名: Organic and biological chemistry : a series of monographs ; 4
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29.

図書
図書
29. Structure determination by X-ray crystallography. 3rd ed
M.F.C. Ladd and R.A. Palmer
出版情報: New York : Plenum Press, c1993  xxiv, 586 p. ; 24 cm
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目次情報: 続きを見る
Physical Constants and Other Numerical Data
Notation
Crystal Morphology and Crystal Symmetry / Chapter 1：
Introduction / 1.1：
The Crystalline State / 1.2：
Stereographic Projection / 1.3：
External Symmetry of Crystals / 1.4：
Bibliography
Problems
Lattices and Space-Group Theory / Chapter 2：
Lattices / 2.1：
Families of Planes and Interplanar Spacings / 2.3：
Reciprocal Lattice-Geometrical Treatment / 2.4：
Unit-Cell Transformation / 2.5：
Rotational Symmetries of Lattices / 2.6：
Space Groups / 2.7：
Matrix Representation of Symmetry Operations / 2.8：
Diffraction Symbols / 2.9：
I X-rays, X-ray Diffraction, and Structure Factors II Intensities and Intensity Statistics / Chapter 3：
X-rays, X-ray Diffraction, and Structure Factors / I：
Generation and Properties of X-rays / 3.1：
X-ray Scattering / 3.2：
Scattering by Regular Arrays of Atoms / 3.3：
Reciprocal Lattice-Analytical Treatment / 3.4：
Scattering by a Crystal Structure / 3.5：
Using the Structure Factor Equation / 3.6：
Limiting Conditions and Systematic Absences / 3.7：
Practical Determination of Space Groups from Diffraction Data / 3.8：
Intensities and Intensity Statistics / II：
Intensity Expressions and Factors Affecting Intensities / 3.9：
Intensity Statistics / 3.10：
I Optical and X-ray Examination of Crystals II Measurement of Intensity Data from Single Crystals / Chapter 4：
Optical and X-ray Examination of Crystals
Polarized Light / 4.1：
Optical Classification of Crystals / 4.3：
Single-Crystal X-ray Techniques / 4.4：
Recognition of Crystal System / 4.5：
Measurement of Intensity Data from Single Crystals
Intensity Measurements on Photographs / 4.6：
Single-Crystal X-ray Diffractometry / 4.7：
Area Detectors (Position-Sensitive Detectors) / 4.8：
Monochromators / 4.9：
Focusing Mirrors / 4.10：
Twinning / 4.11：
Fourier Series and Fourier Transforms / Chapter 5：
Image Formation and Focusing / 5.1：
Fourier Series / 5.2：
Fourier Series in X-ray Crystallography / 5.3：
Holes and Atoms / 5.4：
Generalized Fourier Transform / 5.5：
Practice with Transforms / 5.6：
Some General Properties of Transforms / 5.7：
Convolution / 5.8：
Structure Solution in Brief / 5.9：
Fourier Techniques in X-ray Structure Determination / Chapter 6：
Analysis of the Unit-Cell Contents / 6.1：
Interpretation of Electron Density Distributions / 6.3：
Methods of Solving the Phase Problem / 6.4：
Anomalous Scattering / 6.5：
Neutron Diffraction / 6.6：
Direct Methods and Refinement / Chapter 7：
Direct Methods of Phase Determination / 7.1：
Patterson Search Methods / 7.3：
Least-Squares Refinement / 7.4：
Molecular Geometry / 7.5：
Precision / 7.6：
Correctness of a Structure Analysis / 7.7：
Limitations of X-ray Structure Analysis / 7.8：
Disorder in Single Crystals / 7.9：
Computer Prediction of Crystal Structures / 7.10：
Examples of Crystal Structure Determination / Chapter 8：
Crystal Structure of 2-Bromobenzo[b]indeno[1,2-e]pyran / 8.1：
Crystal Structure of Potassium 2-Hydroxy-3,4-dioxocyclobut-1-ene-1-olate Monohydrate KHSO / 8.3：
Structure Analysis by X-ray and Neutron Diffraction / 8.4：
Determination of an Intermediate Size Crystal Structure Using Direct Methods / 8.5：
Concluding Remarks / 8.6：
X-ray Structure Determination with Powders / Chapter 9：
Basis of the Powder Method / 9.1：
Data Collection / 9.3：
Indexing Powder Patterns / 9.4：
Extracting Integrated Intensities from a Powder Pattern / 9.5：
Rietveld Refinement / 9.6：
Examples of Solved Structures / 9.7：
Powder Diffraction with Proteins / 9.8：
Proteins and Macromolecular X-ray Analysis / 9.9：
Crystallization of Proteins and Complexes for X-ray Analysis / 10.1：
Crystal Mounting for X-ray Data Collection / 10.3：
Macromolecular Crystallography / 10.4：
Types of Fourier Synthesis for Protein Analysis / 10.5：
Determination of the Phases for Protein Crystals / 10.6：
Siras and MAD Phasing / 10.7：
Use of Phase Information and Density Modification / 10.8：
Macromolecular Structure Refinement and Solvent and Ligand Fitting / 10.9：
Structure Validation: Final Checks / 10.10：
Geometry Validation: Final Checks / 10.11：
Computer-Aided Crystallography / Chapter 11：
Derivation of Point Groups (EULR*) / 11.1：
Point-Group Recognition (SYMM*) / 11.3：
Structure Determination Simulation (XRAY*) / 11.4：
Crystal Structure Analysis Problems / 11.5：
General Crystal Structure and Other Programs / 11.6：
Automatic Powder Indexing (ITO12*) / 11.7：
Automatic Powder Structure Solving (ESPOIR*) / 11.8：
Appendices
Stereoviews and Crystal Models / A1：
Analytical Geometry of Direction Cosines / A2：
Schonflies' Symmetry Notation / A3：
Rotation Matrices / A4：
Spherical Trigonometry / A5：
Trigonometrical Formulae / A6：
Cartesian Coordinates / A7：
The integral [function of superscript infinity subscript 0 (sin x)/x] dx / A8：
Gamma Function / A9：
Crystallographic Software / A10：
Tutorial Solutions
Index / Solutions 1：
Physical Constants and Other Numerical Data
Notation
Crystal Morphology and Crystal Symmetry / Chapter 1：
30.

図書
図書
30. Resonant anomalous X-ray scattering : theory and applications
edited by G. Materlik, C.J. Sparks, K. Fischer
出版情報: Amsterdam ; New York : North-Holland, 1994  xii, 675 p. ; 25 cm
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目次情報: 続きを見る
Preface
X-Ray Scattering Factors / Part I：
X-ray resonance, then and now / D.H. Templeton
New relativistic S-matrix results for scattering-beyond the usual anomalous factors/beyond impulse approximation / R.H. Pratt ; L. Kissel ; P.M. Bergstrom, Jr
Experimental determination of the dispersion correction f''(E) to the atomic scattering factor / B. Lengeler
Towards improved form factor tables / C.T. Chantler
Optical constants and scattering factors from reflectivity measurements: 50 eV to 5 keV / R.L. Blake et al
Resonant x-ray diffraction and polarization analysis at the iron K-edge / K.D. Finkelstein ; M. Hamrick ; Q. Shen
Electrical quadrupole contributions to x-ray absorption and anomalous scattering / G. Drauml;ger ; W. Czolbe
Polarizing x-ray optics and anomalous dispersion in chiral systems / M. Hart
Crystal Structures / Part II：
X-ray standing waves in noncentrosymmetric crystals and the phase problem in crystallography / B.N. Dev ; G. Materlik
Developments in anomalous scattering for structure determination / J. Karle
MAD phasing for macromolecular crystal structures / W.A. Hendrickson
Anomalous dispersion of X-ray scattering from low-z elements / H.B. Stuhrmann ; M.S. Lehmann
Powder diffraction studies using anomalous dispersion / D.E. Cox ; A.P. Wilkinson
Phase and sign determination from multiple wavelength powder diffraction data using anomalous scattering techniques and synchrotron radiation / W. Limper ; W. Prandl
Anisotropy of anomalous scattering in single crystals / A. Kirfel
Computing kinematic diffraction intensities with anisotropic anomalous scatterers - "forbidden" axial reflections in space groups up to orthorhombic symmetry / W. Morgenroth ; K. Fischer
Short-Range Correlations / Part III：
Chemical and displacement atomic pair correlations in crystalline solid solutions recovered by resonant (anomalous) x-ray scattering / G.E. Ice ; C.J. Sparks ; L.B. Shaffer
Structural characterization of compositional and density inhomogeneities by ASAXS / H.-G. Haubold et al
Anomalous small angle x-ray scattering in materials science / J.P. Simon ; O. Lyon
Short- and medium-range order in noncrystalline materials by using anomalous scattering at large angles / D. Raoux
Structural studies of oxide thin films, solutions and quasicrystals by anomalous x-ray scattering method / E. Matsubara ; Y. Waseda
Anomalous crystal truncation rod intensity: a chemical and structural probe / F.J. Walker ; E.D. Specht
Diffraction anomalous fine structure: unifying x-ray diffraction and x-ray absorption with DAFS / L.B. Sorensen et al
Anomalous reflectivity methods for determining the density profiles of thin films / S.K. Sinha et al
Resonant Raman Scattering / Part IV：
Radiative and radiationless resonant Raman scattering / T. Aberg ; B. Crasemann
Resonant x-ray Raman scattering from atoms and molecules / P.L. Cowan
Experimental study of non-radiative resonant Raman scattering at the L 3 -edge of 4d-transition metals / W. Drube ; A. Lessmann
High resolution near edge x-ray spectroscopy / K. Hauml;mauml;lauml;inen et al
Magnetic X-Ray Scattering / Part V：
Magnetic effects in anomalous dispersion / M. Blume
Resonant magnetic x-ray scattering / C. Vettier
Magnetic form factor measurements using x-rays / D. Laundy ; S.P. Collins
X-ray magnetic circular dichroism and its relation to local magnetic structures / G. Schuuml;tz ; M. Knuuml;lle ; H. Ebert
First measurement of site-specific normal and magnetic XANES by using a standing wave field / H. Kawata et al
Nuclear Resonant Scattering
Resonant ggr;-ray scattering and coherent excitations of nuclei / J.P. Hannon ; G.T. Trammell
Nuclear resonant diffraction of synchrotron radiation - on the way from an exotic experiment to established spectroscopy / E. Gerdau ; U. van Buuml;rck
Nuclear resonant scattering with conventional sources / G.V. Smirnov ; A.I. Chumakov
Suppression of charge scattering in Mouml;ssbauer experiments using synchrotron radiation / U. Bergmann ; D.P. Siddons ; J.B. Hastings
Nuclear resonant scattering using synchtrotron radiation from an x-ray undulator / S. Kikuta
Development of neV scattering spectroscopy using resonant nuclear Bragg scattering / J.Z. Tischler et al
Guide to some crystallographic symbols and definitions with discussions on short-range correlations / J.L. Robertson
Subject index
Substance index
Preface
X-Ray Scattering Factors / Part I：
X-ray resonance, then and now / D.H. Templeton
31.

図書
図書
31. X-ray diffraction methods
E. W. Nuffield
出版情報: New York : Wiley, c1966  xii, 409 p. ; 24 cm
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32.

図書
図書
32. The development of x-ray analysis
by Sir Lawrence Bragg ; edited by D.C. Phillips and H. Lipson
出版情報: London : G. Bell, 1975  viii, 270 p. ; 23 cm
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33.

図書
図書
33. Crystal structure analysis for chemists and biologists
Jenny P. Glusker with Mitchell Lewis, Miriam Rossi
出版情報: New York : VCH, c1994  xvii, 854 p. ; 25 cm
シリーズ名: Methods in stereochemical analysis
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34.

図書
図書
34. Chemical crystallography : an introduction to optical and X-ray methods
by C.W. Bunn
出版情報: Oxford : The Clarendon Press, 1945  xii, 422 p., xiii lieaves of plates, [1] folded leaf of plates ; 25 cm
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35.

図書
図書
35. X-Ray crystallographic technology
by André Guinier ; with a preface by Charles Mauguin ; English translation by T.L. Tippell ; edited by Kathleen Lonsdale
出版情報: London : Hilger and Watts, Hilger Division, 1952  xiii, 330 p., [18] p. of plates ; 26 cm
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36.

図書
図書
36. Crystallography made crystal clear : a guide for users of macromolecular models (: pbk)
Gale Rhodes
出版情報: San Diego ; Tokyo : Academic Press, c1993  xiii, 202 p. ; 23 cm
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目次情報: 続きを見る
Preface to the Second Edition
Preface to the First Edition
Model and Molecule / 1.：
An Overview of Protein Crystallography / 2.：
Introduction / I.：
Obtaining an image of a microscopic object / A.：
Obtaining images of molecules / B.：
A thumbnail sketch of protein crystallography / C.：
Crystals / II.：
The nature of crystals
Growing crystals
Collecting X-ray data / III.：
Diffraction / IV.：
Simple objects
Arrays of simple objects: Real and reciprocal lattices
Intensities of reflections
Arrays of complex objects / D.：
Three-dimensional arrays / E.：
Coordinate systems in crystallography / V.：
The mathematics of crystallography: A brief description / VI.：
Wave equations: Periodic functions
Complicated periodic functions: Fourier series
Structure factors: Wave descriptions of X-ray reflections
Electron-density maps
Electron density from structure factors
Electron density from measured reflections / F.：
Obtaining a model / G.：
Protein Crystals / 3.：
Properties of protein crystals
Size, structural integrity, and mosaicity
Multiple crystalline forms
Water content
Evidence that solution and crystal structures are similar
Proteins retain their function in the crystal
X-ray structures are compatible with other structural evidence
Other evidence
Growing protein crystals
Growing crystals: Basic procedure
Growing derivative crystals
Finding optimal conditions for crystal growth
Judging crystal quality
Mounting crystals for data collection
Collecting Diffraction Data / 4.：
Geometric principles of diffraction
The generalized unit cell
Indices of the atomic planes in a crystal
Conditions that produce diffraction: Bragg's law
The reciprocal lattice
Bragg's law in reciprocal space
The number of measurable reflections
Unit-cell dimensions
Unit-cell symmetry / H.：
Collecting X-ray diffraction data
X-ray sources
Detectors
Diffractometers and cameras
Scaling and postrefinement of intensity data
Determining unit-cell dimensions
Symmetry and the strategy of collecting data
Summary
From Diffraction Data to Electron Density / 5.：
Fourier series and the Fourier transform
One-dimensional waves
Three-dimensional waves
The Fourier transform: General features
Fourier this and Fourier that: Review
Fourier mathematics and diffraction
Stucture factor as a Fourier series
Electron density as a Fourier series
Computing electron density from data
The phase problem
The meaning of the Fourier equations
Reflections as Fourier terms: Equation (5.18)
Computing structure factors from a model: Equations (5.15) and (5.16)
Systematic absences in the diffraction pattern: Equation (5.15)
Summary: From data to density
Obtaining Phases / 6.：
Two-dimensional representation of structure factors
Complex numbers in two dimensions
Structure factors as complex vectors
Electron density as a function of intensities and phases
The heavy-atom method (isomorphous replacement)
Preparing heavy-atom derivatives
Obtaining phases from heavy-atom data
Locating heavy atoms in the unit cell
Anomalous scattering
The measurable effects of anomalous scattering
Extracting phases from anomalous scattering data
Multiwavelength anomalous diffraction phasing
Anomalous scattering and the hand problem
Direct phasing: Application of methods from small-molecule crystallography
Molecular replacement: Related proteins as phasing models
Isomorphous phasing models
Nonisomorphous phasing models
Separate searches for orientation and location
Monitoring the search
Iterative improvement of phases (preview of Chapter 7)
Obtaining and Judging the Molecular Model / 7.：
Iterative improvement of maps and models: Overview
First maps
Resources for the first map
Displaying and examining the map
Improving the map
The model becomes molecular
New phases from the molecular model
Minimizing bias from the model
Map fitting
Structure refinement
Least-squares methods
Crystallographic refinement
Additional refinement parameters
Local minima and radius of convergence
Molecular energy and motion in refinement
Convergence to a final structure
Producing the final map and model
Guides to convergence
Sharing the model / VII.：
A User's Guide to Crystallographic Models / 8.：
Judging the quality and usefulness of the refined model
Structural parameters
Resolution and precision of atomic positions
Vibration and disorder
Other limitations of crystallographic models
Reading a crystallography paper
Annotated excerpts of the preliminary (8/91) paper
Annotated excerpts from the full structure determination (4/92) paper
Other Diffraction Methods / 9.：
Fiber diffraction
Diffraction by amorphous materials (scattering)
Neutron diffraction
Electron diffraction
Lane diffraction and time-resolved crystallography
Conclusion
Other Kinds of Macromolecular Models / 10.：
NMR models
Principles
Assigning resonances
Determining conformation
PDB files for NMR models
Judging model quality
Homology models
Databases of homology models
Other theoretical models
Tools for Studying Macromolecules / 11.：
Computer models of molecules
Two-dimensional images from coordinates
Into three dimensions: Basic modeling operations
Three-dimensional display and perception
Types of graphical models
Touring a typical molecular modeling program
Importing and exporting coordinates files
Loading and saving models
Viewing models
Editing and labeling the display
Coloring
Measuring
Exploring structural change
Exploring the molecular surface
Exploring intermolecular interactions: Multiple models
Displaying crystal packing / J.：
Building models from scratch / K.：
Other tools for studying structure
Tools for structure analysis
Tools for modeling protein action
A final note
Index
Preface to the Second Edition
Preface to the First Edition
Model and Molecule / 1.：
37.

図書
図書
37. Organic crystals and molecules : theory of X-ray structure analysis with applications to organic chemistry
J. Monteath Robertson
出版情報: Ithaca, N.Y. : Cornell University Press, 1953  xi, 340 p. ; 24 cm
シリーズ名: The George Fisher Baker non-resident lectureship in chemistry at Cornell University
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38.

図書
図書
38. Modern X-ray analysis on single crystals
Peter Luger
出版情報: Berlin ; New York : W. de Gruyter, 1980  xiii, 312 p. ; 25 cm
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39.

図書
図書
39. Crystal structure analysis : principles and practice. 2nd ed (: hbk. ; : pbk.)
Alexander J. Blake ... [et al.] ; edited by William Clegg
出版情報: Oxford : Oxford University Press, 2009  xvii, 387 p. ; 26 cm
シリーズ名: International Union of Crystallography texts on crystallography ; 13
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40.

図書
図書
40. Crystal structure analysis : a primer. 3rd ed (: pbk ; : hard)
Jenny Pickworth Glusker, Kenneth N. Trueblood
出版情報: Oxford ; New York : Oxford University Press, 2010  xxii, 276 p. ; 25 cm
シリーズ名: International Union of Crystallography texts on crystallography ; 14
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41.

図書
図書
41. Fundamentals of powder diffraction and structural characterization of materials. 2nd ed
Vitalij K. Pecharsky, Peter Y. Zavalij
出版情報: New York : Springer, c2009  xxiii, 741 p. ; 24 cm
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目次情報: 続きを見る
Fundamentals of Crystalline State and Crystal Lattice / 1：
Crystalline State / 1.1：
Crystal Lattice and Unit Cell / 1.2：
Shape of the Unit Cell / 1.3：
Crystallographic Planes, Directions, and Indices / 1.4：
Crystallographic Planes / 1.4.1：
Crystallographic Directions / 1.4.2：
Reciprocal Lattice / 1.5：
Additional Reading / 1.6：
Problems / 1.7：
Finite Symmetry Elements and Crystallographic Point Groups / 2：
Content of the Unit Cell / 2.1：
Asymmetric Part of the Unit Cell / 2.2：
Symmetry Operations and Symmetry Elements / 2.3：
Finite Symmetry Elements / 2.4：
Onefold Rotation Axis and Center of Inversion / 2.4.1：
Twofold Rotation Axis and Mirror Plane / 2.4.2：
Threefold Rotation Axis and Threefold Inversion Axis / 2.4.3：
Fourfold Rotation Axis and Fourfold Inversion Axis / 2.4.4：
Sixfold Rotation Axis and Sixfold Inversion Axis / 2.4.5：
Interaction of Symmetry Elements / 2.5：
Generalization of Interactions Between Finite Symmetry Elements / 2.5.1：
Symmetry Groups / 2.5.2：
Fundamentals of Group Theory / 2.6：
Crystal Systems / 2.7：
Stereographic Projection / 2.8：
Crystallographic Point Groups / 2.9：
Laue Classes / 2.10：
Selection of a Unit Cell and Bravais Lattices / 2.11：
Infinite Symmetry Elements and Crystallographic Space Groups / 2.12：
Glide Planes / 3.1：
Screw Axes / 3.2：
Interaction of Infinite Symmetry Elements / 3.3：
Crystallographic Space Groups / 3.4：
Relationships Between Point Groups and Space Groups / 3.4.1：
Full International Symbols of Crystallographic Space Groups / 3.4.2：
Visualization of Space-Group Symmetry in Three Dimensions / 3.4.3：
Space Groups in Nature / 3.4.4：
International Tables for Crystallography / 3.5：
Equivalent Positions (Sites) / 3.6：
General and Special Equivalent Positions / 3.6.1：
Special Sites with Points Located on Mirror Planes / 3.6.2：
Special Sites with Points Located on Rotation and Inversions Axes / 3.6.3：
Special Sites with Points Located on Centers of Inversion / 3.6.4：
Formalization of Symmetry / 3.7：
Symbolic Representation of Symmetry / 4.1：
Finite Symmetry Operations / 4.1.1：
Infinite Symmetry Operations / 4.1.2：
Algebraic Treatment of Symmetry Operations / 4.2：
Transformation of Coordinates of a Point / 4.2.1：
Rotational Transformations of Vectors / 4.2.2：
Translational Transformations of Vectors / 4.2.3：
Combined Symmetrical Transformations of Vectors / 4.2.4：
Augmentation of Matrices / 4.2.5：
Algebraic Representation of Crystallographic Symmetry / 4.2.6：
Interaction of Symmetry Operations / 4.2.7：
Nonconventional Symmetry / 4.3：
Commensurate Modulation / 5.1：
Incommensurate Modulation / 5.2：
Composite Crystals / 5.3：
Symmetry of Modulated Structures / 5.4：
Quasicrystals / 5.5：
Properties, Sources, and Detection of Radiation / 5.6：
Nature of X-Rays / 6.1：
Production of X-Rays / 6.2：
Conventional Sealed X-Ray Sources / 6.2.1：
Continuous and Characteristic X-Ray Spectra / 6.2.2：
Rotating Anode X-Ray Sources / 6.2.3：
Synchrotron Radiation Sources / 6.2.4：
Other Types of Radiation / 6.3：
Detection of X-Rays / 6.4：
Detector Efficiency, Linearity, Proportionality and Resolution / 6.4.1：
Classification of Detectors / 6.4.2：
Point Detectors / 6.4.3：
Line and Area Detectors / 6.4.4：
Fundamentals of Diffraction / 6.5：
Scattering by Electrons, Atoms and Lattices / 7.1：
Scattering by Electrons / 7.1.1：
Scattering by Atoms and Atomic Scattering Factor / 7.1.2：
Scattering by Lattices / 7.1.3：
Geometry of Diffraction by Lattices / 7.2：
Laue Equations / 7.2.1：
Braggs' Law / 7.2.2：
Reciprocal Lattice and Ewald's Sphere / 7.2.3：
The Powder Diffraction Pattern / 7.3：
Origin of the Powder Diffraction Pattern / 8.1：
Representation of Powder Diffraction Patterns / 8.2：
Understanding of Powder Diffraction Patterns / 8.3：
Positions of Powder Diffraction Peaks / 8.4：
Peak Positions as a Function of Unit Cell Dimensions / 8.4.1：
Other Factors Affecting Peak Positions / 8.4.2：
Shapes of Powder Diffraction Peaks / 8.5：
Peak-Shape Functions / 8.5.1：
Peak Asymmetry / 8.5.2：
Intensity of Powder Diffraction Peaks / 8.6：
Integrated Intensity / 8.6.1：
Scale Factor / 8.6.2：
Multiplicity Factor / 8.6.3：
Lorentz-Polarization Factor / 8.6.4：
Absorption Factor / 8.6.5：
Preferred Orientation / 8.6.6：
Extinction Factor / 8.6.7：
Structure Factor / 8.7：
Structure Amplitude / 9.1：
Population Factor / 9.1.1：
Temperature Factor (Atomic Displacement Factor) / 9.1.2：
Atomic Scattering Factor / 9.1.3：
Phase Angle / 9.1.4：
Effects of Symmetry on the Structure Amplitude / 9.2：
Friedel Pairs and Friedel's Law / 9.2.1：
Friedel's Law and Multiplicity Factor / 9.2.2：
Systematic Absences / 9.3：
Lattice Centering / 9.3.1：
Space Groups and Systematic Absences / 9.3.2：
Solving the Crystal Structure / 9.5：
Fourier Transformation / 10.1：
Phase Problem / 10.2：
Patterson Technique / 10.2.1：
Direct Methods / 10.2.2：
Structure Solution from Powder Diffraction Data / 10.2.3：
Total Scattering Analysis Using Pair Distribution Function / 10.3：
Powder Diffractometry / 10.4：
Brief History of the Powder Diffraction Method / 11.1：
Beam Conditioning in Powder Diffractometry / 11.2：
Collimation / 11.2.1：
Monochromatization / 11.2.2：
Principles of Goniometer Design in Powder Diffractometry / 11.3：
Goniostats with Strip and Point Detectors / 11.3.1：
Goniostats with Area Detectors / 11.3.2：
Nonambient Powder Diffractometry / 11.4：
Variable Temperature Powder Diffractometry / 11.4.1：
Principles of Variable Pressure Powder Diffractometry / 11.4.2：
Powder Diffractometry in High Magnetic Fields / 11.4.3：
Collecting Quality Powder Diffraction Data / 11.5：
Sample Preparation / 12.1：
Powder Requirements and Powder Preparation / 12.1.1：
Powder Mounting / 12.1.2：
Sample Size / 12.1.3：
Sample Thickness and Uniformity / 12.1.4：
Sample Positioning / 12.1.5：
Effects of Sample Preparation on Powder Diffraction Data / 12.1.6：
Data Acquisition / 12.2：
Wavelength / 12.2.1：
Incident Beam Aperture / 12.2.2：
Diffracted Beam Aperture / 12.2.4：
Variable Aperture / 12.2.5：
Power Settings / 12.2.6：
Classification of Powder Diffraction Experiments / 12.2.7：
Step Scan / 12.2.8：
Continuous Scan / 12.2.9：
Scan Range / 12.2.10：
Quality of Experimental Data / 12.3：
Quality of Intensity Measurements / 12.3.1：
Factors Affecting Resolution / 12.3.2：
Preliminary Data Processing and Phase Analysis / 12.4：
Interpretation of Powder Diffraction Data / 13.1：
Preliminary Data Processing / 13.2：
Background / 13.2.1：
Smoothing / 13.2.2：
Peak Search / 13.2.3：
Profile Fitting / 13.2.5：
Phase Identification and Quantitative Analysis / 13.3：
Crystallographic Databases / 13.3.1：
Phase Identification / 13.3.2：
Quantitative Analysis / 13.3.3：
Phase Contents from Rietveld Refinement / 13.3.4：
Determination of Amorphous Content or Degree of Crystallinity / 13.3.5：
Determination and Refinement of the Unit Cell / 13.4：
The Indexing Problem / 14.1：
Known Versus Unknown Unit Cell Dimensions / 14.2：
Indexing: Known Unit Cell / 14.3：
High Symmetry Indexing Example / 14.3.1：
Other Crystal Systems / 14.3.2：
Reliability of Indexing / 14.4：
Introduction to Ab Initio Indexing / 14.4.1：
Cubic Crystal System / 14.6：
Tetragonal and Hexagonal Crystal Systems / 14.6.1：
Automatic Ab Initio Indexing Algorithms / 14.7.1：
Indexing in Direct Space / 14.8.1：
Indexing in Reciprocal Space / 14.8.2：
Unit Cell Reduction Algorithms / 14.9：
Delaunay-Ito Transformation / 14.9.1：
Niggli Reduction / 14.9.2：
Automatic Ab Initio Indexing: Computer Codes / 14.10：
TREOR / 14.10.1：
DICVOL / 14.10.2：
ITO / 14.10.3：
Selecting a Solution / 14.10.4：
Ab Initio Indexing Examples / 14.11：
Precise Lattice Parameters and Linear Least Squares / 14.11.1：
Linear Least Squares / 14.12.1：
Precise Lattice Parameters from Linear Least Squares / 14.12.2：
Concluding Remarks / 14.13：
Solving Crystal Structure from Powder Diffraction Data / 14.14：
Ab Initio Methods of Structure Solution / 15.1：
Conventional Reciprocal Space Methods / 15.1.1：
Conventional Direct Space Modeling / 15.1.2：
Unconventional Direct, Reciprocal, and Dual Space Methods / 15.1.3：
Validation and Completion of the Model / 15.1.4：
The Content of the Unit Cell / 15.2：
Pearson's Classification / 15.3：
Finding Structure Factors from Powder Diffraction Data / 15.4：
Nonlinear Least Squares / 15.5：
Quality of Profile Fitting / 15.6：
Visual Assessment of the Quality of Profile Fitting / 15.6.1：
Figures of Merit / 15.6.2：
The Rietveld Method / 15.7：
Fundamentals of the Rietveld Method / 15.7.1：
Classes of Rietveld Refinement Parameters / 15.7.2：
Restraints, Constraints, and Rigid-Bodies / 15.7.3：
Figures of Merit and Quality of Rietveld Refinement / 15.7.4：
Common Problems and How to Deal with Them / 15.7.5：
Termination of Rietveld Refinement / 15.7.6：
Full Pattern Decomposition / 15.8：
Scale Factor and Profile Parameters / 16.2：
Overall Atomic Displacement Parameter / 16.3.2：
Individual Parameters, Free and Constrained Variables / 16.3.3：
Anisotropic Atomic Displacement Parameters / 16.3.4：
Multiple Phase Refinement / 16.3.5：
Refinement Results / 16.3.6：
Combined Refinement Using Different Sets of Diffraction Data / 16.4：
Solving the Crystal Structure from X-Ray Data / 17：
Highest Symmetry Attempt / 17.2.1：
Low-Symmetry Model / 17.2.2：
Solving the Crystal Structure from Neutron Data / 17.3：
Rietveld Refinement / 17.4：
X-Ray Data, Correct Low Symmetry Model / 17.4.1：
X-Ray Data, Wrong High-Symmetry Model / 17.4.2：
Neutron Data / 17.4.3：
Empirical Methods of Solving Crystal Structures / 18：
Structure-Property Relationships / 19.1：
Observed Structure Factors from Experimental Data / 20：
A Few Notes About Using GSAS / 20.2：
Completion of the Model and Rietveld Refinement / 20.4：
Initial Refinement Steps / 20.4.1：
Where Is Mn and Where Is Ni? / 20.4.2：
Finalizing the Refinement of the Model Without Hydrogen / 20.4.3：
Locating Hydrogen / 20.4.4：
Combined Rietveld Refinement / 20.4.5：
Observed Structure Factors / 21：
Unrestrained Rietveld Refinement / 21.2：
Rietveld Refinement with Restraints / 21.3.2：
Possible Model of the Crystal Structure / 22：
Rietveld Refinement and Completion of the Model / 22.2：
Determining Chemical Composition / 23：
Building and Optimizing the Model of the Crystal Structure / 24：
Ab Initio Indexing and Le Bail Fitting / 24.2：
Creating a Model / 25.2：
Optimizing the Model (Solving the Structure) / 25.2.2：
Restrained Rietveld Refinement / 25.3：
Chapters 15-25: Additional Reading / 25.4：
Chapters 15-25: Problems / 25.5：
Index
Fundamentals of Crystalline State and Crystal Lattice / 1：
Crystalline State / 1.1：
Crystal Lattice and Unit Cell / 1.2：
42.

図書
図書
42. Multiple diffraction of x-rays in crystals (: us ; : gw)
Shih-Lin Chang
出版情報: Berlin ; Tokyo : Springer-Verlag, 1984  xi, 300 p. ; 24 cm
シリーズ名: Springer series in solid-state sciences ; 50
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43.

図書
図書
43. X-Ray diffraction
Leonid V. Azároff ... [et al.]
出版情報: New York : McGraw-Hill, c1974  xviii, 664 p. ; 24 cm
シリーズ名: International series in pure and applied physics
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44.

図書
図書
44. X-ray structure determination : a practical guide. 2nd ed
George H. Stout, Lyle H. Jensen
出版情報: New York : Wiley, c1989  xv, 453 p. ; 25 cm
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目次情報: 続きを見る
Preliminary Stages?
X-Rays?
Diffraction of X-Rays?
Crystals, Symmetry, and Space Groups?
Crystals and Their Properties?
Geometric Data Collection?
Intensity Data Collection?
Data Reduction?
Theory of Structure Factors and Fourier Syntheses?
Calculation of Structure Factors and Fourier Syntheses?
The Phase Problem?
Direct Methods?
Patterson Methods?
Heavy Atom Methods?
Search Methods?
Completing the Structure?
Refinement and Results?
Refinement of Crystal Structures?
Random and Systematic Errors?
Derived Results?
Ambiguities and Uncertainties?
Appendices?
Index
Preliminary Stages?
X-Rays?
Diffraction of X-Rays?
45.

図書
図書
45. Crystal structure determination (: pbk)
William Clegg
出版情報: Oxford ; New York : Oxford University Press, c1998  84 p. ; 25 cm
シリーズ名: Oxford chemistry primers ; 60
Oxford science publications
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目次情報: 続きを見る
The basis of the method / 1：
The method step by step / 2：
The method illustrated by examples / 3：
Further topics / 4：
Appendix (Answers to problems)
The basis of the method / 1：
The method step by step / 2：
The method illustrated by examples / 3：
46.

図書
図書
46. Crystals, X-rays, and proteins
Dennis Sherwood
出版情報: London : Longman, 1976  xxii, 702 p. ; 24 cm
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47.

図書
図書
47. X-ray diffraction topography. 1st ed
by B. K. Tanner
出版情報: Oxford ; New York : Pergamon Press, 1976  xiii, 174 p. ; 26 cm
シリーズ名: International series in the science of the solid state ; v. 10
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48.

図書
図書
48. X-ray and neutron diffraction in nonideal crystals (: gw ; : us)
Mikhail A. Krivoglaz ; [translator O.H. Glebov]
出版情報: Berlin ; Tokyo : Springer-Verlag, c1996  xix, 466 p. ; 24 cm
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49.

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49. Crystal structure analysis : a primer. 3rd ed (: electronic bk)
Jenny Pickworth Glusker, Kenneth N. Trueblood
出版情報: [Oxford] : Oxford University Press, [20--]  1 online resource
シリーズ名: International Union of Crystallography texts on crystallography ; 14
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50.

図書
図書
50. The powder method in X-Ray crystallography
Leonid V. Azároff, Martin J. Buerger
出版情報: New York : McGraw-Hill, 1958  xv, 342 p. ; 24 cm
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51.

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51. Protein crystallography
T. L. Blundell and L. N. Johnson
出版情報: London : Academic Press, 1976  xiv, 565 p. ; 24 cm
シリーズ名: Molecular biology : an international series of monographs and textbooks
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52.

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図書
52. Macromolecular crystallography with synchrotron radiation
John R. Helliwell
出版情報: Cambridge [England] ; New York : Cambridge University Press, 1992  xix, 595 p. ; 26 cm
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目次情報: 続きを見る
Preface
Introduction
Fundamentals of macromolecular crystallography / 1：
Fundamentals of macromolecular structure / 2：
Sources and properties of synchrotron radiation / 3：
Synchrotron radiation instrumentation / 4：
Monochromatic data collection / 5：
The Laue method / 6：
Diffuse X-ray scattering from macromolecular crystals / 7：
Variable wavelength anomalous dispersion methods and applications / 8：
More applications
Conclusions and future possibilities
Appendixes
Bibliography
References
Index
Preface
Introduction
Fundamentals of macromolecular crystallography / 1：
53.

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53. Elements of X-ray crystallography
[by] A. J. C. Wilson
出版情報: Reading, Mass. : Addison-Wesley, c1970  ix, 256 p. ; 24 cm
シリーズ名: Addison-Wesley series in metallurgy and materials
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54.

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図書
54. Tabellen zur Röntgenstrukturanalyse
von Konrad Sagel
出版情報: Berlin : Springer, 1958  viii, 204 p ; 23 cm
シリーズ名: Anleitungen für die chemische Laboratoriumspraxis ; Bd. 8
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55.

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55. X-ray diffraction. Dover ed
B.E. Warren
出版情報: New York : Dover Publications, 1990  vii, 381 p. ; 22 cm
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56.

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56. Synchrotron radiation crystallography
Philip Coppens with contributions from David Cox, Elias Vlieg and Ian K. Robinson
出版情報: London : Academic Press, c1992  xii, 316 p. ; 24 cm
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57. A journey into reciprocal space : a crystallographer's perspective. 2nd ed
Anthony Michael Glazer
出版情報: IOP science  1 online resource (various pagings)
シリーズ名: IOP ebooks
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58.

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58. Chemical crystallography : an introduction to optical and X-ray methods. 2nd ed
by C.W. Bunn
出版情報: Oxford, England : Clarendon Press, 1961  xiii, 509 p. ; 24 cm
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