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Image quality and system performance V : 28-30 January 2008, San Jose, California, USA / Susan P. Farnand, Frans Gaykema, editors ; sponsored and published by IS&T--The Society for Imaging and Science and Technology, [and] SPIE

資料種別:
図書
出版情報:
Bellingham, Wash. : SPIE
Springfield, Va. : IST&T, c2008
形態:
1 v. (various pagings) ; 28 cm
シリーズ名:
Proceedings of Electronic Imaging Science and Technology <BA86017226>
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 6808 <BA0022700X>
著者名:
ISBN:
9780819469809 [0819469807]
書誌ID:
BC08221930
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