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Image quality and system performance : 19-20 January, 2004, San Jose, California, USA / Yoichi Miyake, D. René Rasmussen ; sponsored ... by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering

資料種別:
図書
出版情報:
Bellingham, Wash., USA : SPIE, c2004
形態:
viii, 256 p. ; 28 cm
シリーズ名:
Proceedings of Electronic Imaging Science and Technology <BA86017226>
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 5294 <BA0022700X>
著者名:
ISBN:
9780819451972 [0819451975]
書誌ID:
BC08221828
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