Proceedings of the Symposia on Reliability of Semiconductor Devices/Interconnections, and Dielectric Breakdown, and Laser Process for Microelectronic Applications

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Proceedings of the Symposia on Reliability of Semiconductor Devices/Interconnections, and Dielectric Breakdown, and Laser Process for Microelectronic Applications / edited by Hazara S. Rathore, G.S. Mathad, Du B. Nguyen ; Dielectric Science & Technology and Electronics Divisions

資料種別:

図書

出版情報:

Pennington, NJ : Dielectric Science & Technology, and Electronics Divisions, Electrochemical Society, c1992

形態:

viii, 330 p.

シリーズ名:

Proceedings / [Electrochemical Society] ; v. 92-4 <BA01323290>

著者名:

ISBN:

9781566770033 [1566770033]

書誌ID:

BA14411619

子書誌情報

フルテキスト

所蔵情報

他の版・巻

書誌詳細

言語:

英語

東工大ブックレビュー

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