| 1.
図書 |
図書
|
Autotestcon ; IEEE Aerospace and Electronic Systems Society ; Institute of Electrical and Electronics Engineers
|
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| 2.
図書 |
図書
|
editor, John S. Jackson ; publishing edotor, R. William de Vore ; sponsored by College of Engineering, University of Kentucky, Department of Electrical Engineering ... [et al.] ; incorporation with, Technical Groups of the Institute of Electrical and Electronics Engineers ... [et al.]
|
||||||
| 3.
図書 |
図書
|
sponsored by the Institute of Electrical and Electronics Engineers ... [et al.]
|
||||||
| 4.
図書 |
図書
|
editor, John S. Jackson ; publishing edotor, R. William de Vore ; sponsored by College of Engineering, University of Kentucky, Department of Electrical Engineering ... [et al.] ; incorporation with, Technical Groups of the Institute of Electrical and Electronics Engineers ... [et al.]
|
||||||
| 5.
図書 |
図書
|
sponsored by the Institute of Electrical and Electronics Engineers ... [et al.]
|
||||||
| 6.
図書 |
図書
|
editor, John S. Jackson ; publishing edotor, R. William de Vore ; sponsored by College of Engineering, University of Kentucky, Department of Electrical Engineering ... [et al.] ; incorporation with, Technical Groups of the Institute of Electrical and Electronics Engineers ... [et al.]
|
||||||
| 7.
図書 |
図書
|
editor, John S. Jackson ; publishing edotor, R. William de Vore ; sponsored by College of Engineering, University of Kentucky, Department of Electrical Engineering ... [et al.] ; incorporation with, Technical Groups of the Institute of Electrical and Electronics Engineers ... [et al.]
|
||||||
| 8.
図書 |
図書
|
editor, John S. Jackson ; publishing editor, R. William de Vore ; sponsored by College of Engineering, University of Kentucky, Department of Electrical Engineering ... [et al.] ; incorporation with Technical Groups of the Institute of Electrical and Electronics Engineers, Electromagnetic Compatibility ... [et al.]
|
||||||
| 9.
図書 |
図書
|
sponsored by the Institute of Electrical and Electronics Engineers ... [et al.]
|
||||||
| 10.
図書 |
図書
|
sponsored by IEEE AES Society
|
