| Preface |
| Acknowledgments |
| Materials Research Society Symposium Proceedings |
| Mapping, Microprobes, and Imaging / Part I： |
| Expansive Reactions in Concrete Observed by Soft X-ray Transmission Microscopy / K.E. Kurtis ; P.J.M. Monteiro ; J.T. Brown ; W. Meyer-Ilse |
| The First Synchrotron Infrared Beamlines at the Advanced Light Source: Microspectroscopy and Fast Timing / Michael C. Martin ; Wayne R. McKinney |
| Applications of Synchrotron Infrared Microspectroscopy to the Study of Inorganic-Organic Interactions at the Bacterial-Mineral Interface / Hoi-Ying N. Holman ; Dale L. Perry |
| High-Resolution X-ray Photoemission Electron Microscopy at the Advanced Light Source / Thomas Stammler ; Simone Anders ; Howard A. Padmore ; Joachim Stohr ; Michael Scheinfein ; Harald Ade |
| Synchrotron Radiation Hard X-ray Microprobe by Multilayer Fresnel Zone Plate / S. Tamura ; K. Ohtani ; M. Yasumoto ; K. Murai ; N. Kamijo ; H. Kihara ; K. Yoshida ; Y. Suzuki |
| Micro-, Meso-, and Macrotexture and Fatigue Crack Roughness in Al-Li 2090 T8E41 / J.D. Haase ; A. Guvenilir ; J.R. Witt ; S.R. Stock |
| X-ray Microbeam Quantification of Grain Subdivision Accompanying Large Deformations of Copper / G.C. Butler ; D.L. McDowell |
| Automated Indexing of Laue Images From Polycrystalline Materials / Jin-Seok Chung ; Gene E. Ice |
| Grain Orientation Mapping of Passivated Aluminum Interconnect Lines With X-ray Microdiffraction / A.A. MacDowell ; C.H. Chang ; H.A. Padmore ; J.R. Patel ; A.C. Thompson |
| Synchrotron Radiation Diffraction Imaging Study of the Magnetoacoustically-Induced X-ray Focusing Effect in FeBO[subscript 3] / I. Matsouli ; V.V. Kvardakov ; J.I. Espeso ; L. Chabert ; J. Baruchel |
| The Mechanism of Twinning in Zinc-Blende Structure Crystals: New Insights on Polarity Effects From a Study of Magnetic-Liquid-Encapsulated Czochralski Grown InP Single Crystals / M. Dudley ; B. Raghothamachar ; Y. Guo ; X.R. Huang ; H. Chung ; D.J. Larson, Jr. ; D.T.J. Hurle ; D.F. Bliss ; V. Prasad ; Z. Huang |
| Contrast Mechanism in Superscrew Dislocation Images on Synchrotron Back-Reflection Topographs / W.M. Vetter ; W. Huang ; S. Wang ; C.H. Carter, Jr. |
| Twin and Grain Boundary in InP: A Synchrotron Radiation Study / Yujie Han ; Jianhua Jiang ; Zhouguang Wang ; Xunlang Liu ; Jinghua Jiao ; Yulian Tian ; Lanying Lin |
| Real-Time In Situ X-ray Topographic Observation of Deformation of Single Crystals and Thin Films / Z.B. Zhao ; J. Hershberger ; A. Chiaramonti ; Z.U. Rek ; J.C. Bilello |
| Diffraction and Scattering / Part II： |
| Strain and Shape in Self-Assembled Quantum Dots Studied by X-ray Grazing Incidence Diffraction / I. Kegel ; T.H. Metzger ; J. Peisl ; P. Fratzl ; A. Lorke ; J.P. Kotthaus ; J.M. Garcia ; P.M. Petroff |
| X-ray Diffuse Scattering Investigation of Defects in Ion-Implanted and Annealed Silicon / U. Beck |
| Growth and Structure of Nanometric Iron Oxide Films / E. Guiot ; S. Gota ; M. Henriot ; M. Gautier-Soyer ; S. Lefebvre |
| Degree of Crystallinity and Strain in B[subscript 4]C and SiC Thin Films as a Function of Processing Conditions / F. Kustas ; S.M. Yalisove |
| Probing Stress State and Phase Content in Ultrathin Ta Films / J.F. Whitacre |
| Crystallographic Analysis of CVD Films by Using X-ray Polychromatic Radiation / B. Lavelle ; L. Brissonneau ; E. Baggot ; C. Vahlas |
| In Situ Monitoring of the Electrochemical Absorption of Deuterium Into Palladium by X-ray Diffraction Using Synchrotron-Wiggler Radiation / D.D. Dominguez ; P.L. Hagans ; E.F. Skelton ; S.B. Qadri ; D.J. Nagel |
| High-Pressure Synchrotron Diffraction of KCa[subscript 2]Nb[subscript 3]O[subscript 10], a Layered Perovskite Compound / K.A. Steiner ; W.T. Petuskey |
| High-Temperature X-ray Diffraction in Transmission Under Controlled Environment / L. Margulies ; M.J. Kramer ; J.J. Williams ; E.M. Deters ; R.W. McCallum ; D.R. Haeffner ; J.C. Lang ; S. Kycia ; A.I. Goldman |
| Interfacial Effects in Multilayers / Troy W. Barbee, Jr. |
| Comparison of a Mosaic-Crystal Spectrometer to a High-Performance Solid-State Detector for X-ray Microfluorescence Analysis / J-S. Chung ; S. Isa ; C.J. Sparks ; G.E. Ice ; S. McHugo ; A. Thompson |
| Anisotropy of NH[subscript 4]AP Crystal X-ray Susceptibility for Bragg Reflection Near CK Absorption Edge / A.V. Okotrub ; G.S. Belikova ; T.N. Turskaya ; L.N. Mazalov |
| Photoemission and Microphotoemission: Fluorescence and Microfluorescence / Part III： |
| Spectroscopic Studies of Low-Dielectric-Constant Fluorinated Amorphous Carbon Films for ULSI Integrated Circuits / Yanjun Ma ; Hongning Yang ; J. Guo ; C. Sathe ; A. Agui ; J. Nordgren |
| Angle-Resolved Photoemission Study of the Electronic Structures of AuAl[subscript 2] and PtGa[subscript 2] / L-S. Hsu ; J.D. Denlinger ; J.W. Allen |
| Preliminary Results From a New Spin Spectrometer / J.G. Tobin ; P.J. Bedrossian ; T.R. Cummins ; G.D. Waddill ; S. Mishra ; P. Larson ; R. Negri ; M. Miller ; E. Peterson ; P. Boyd ; R. Gunion |
| The Spin-Polarized Band Structure of Strained Thin Films of Gadolinium / C. Waldfried ; E. Vescovo ; P.A. Dowben |
| Evidence for the Photoemission Nature of Gd 4f Resonant Photoemission / S.R. Mishra ; W.J. Gammon ; G. van der Laan ; K.W. Goodman |
| ESCA Microscopy on ELETTRA: Chemical Characterization of Surfaces and Interfaces With Submicron Spatial Resolution / M. Kiskinova ; L. Casalis ; L. Gregoratti ; S. Gunther ; M. Marsi |
| MAXIMUM AT ALS: A Powerful Tool to Investigate Open Problems in Micro- and Optoelectronics / G.F. Lorusso ; H. Solak ; S. Singh ; P.J. Batson ; J.H. Underwood ; F. Cerrina |
| State-of-the-Art X-ray Photoelectron Spectroscopy (XPS): Conventional and Synchrotron X-ray Sources for Micro-XPS / E.L. Principe ; R.W. Odom ; A.L. Johnson ; G.D. Ackermann ; Z. Hussain ; H. Padmore |
| Chemical Analysis of Particles and Semiconductor Microstructures by Synchrotron Radiation Soft X-ray Photoemission Spectromicroscopy / F. Gozzo ; B. Triplett ; H. Fujimoto ; R. Ynzunza ; P. Coon ; C. Ayre ; P.D. Kinney ; Y.S. Uritsky ; G. Ackermann ; A. Johnson ; T. Renner ; B. Sheridan ; W. Steele |
| X-ray Fluorescence Microtomography on a SiC Nuclear Fuel Shell / M. Naghedolfeizi ; W.B. Yun ; Z. Cai ; B. Lai |
| Application of Synchrotron X-ray Fluorescence Microscopy to the Study of Multi-Metal Oxide Ceramics / Scott McHugo ; Albert C. Thompson ; Joseph C. Farmer ; Bart B. Ebbinghaus ; Richard van Konynenburg ; William A. Brummond ; Guy Armentrout ; Thomas H. Gould ; Nancy Yang |
| Update on Synchrotron Radiation TXRF: New Results / S. Brennan ; P. Pianetta ; S. Ghosh ; N. Takaura ; C. Wiemer ; A. Fischer-Colbrie ; S. Laderman ; A. Shimazaki ; A. Waldhauer ; M.A. Zaitz |
| Characterizing Trace Metal Impurities in Optical-Waveguide Materials Using X-ray Absorption / P.H. Citrin ; P.A. Northrup ; R.M. Atkins ; P.F. Glodis ; L. Niu ; M.A. Marcus ; D.C. Jacobson |
| Materials Characterization with X-Ray Absorption / Part IV： |
| Anomalous X-ray Scattering Studies of Short-, Intermediate-, and Extended-Range Order in Glasses / David L. Price ; Marie-Louise Saboungi ; Pascale Armand ; David E. Cox |
| X-ray-Absorption-Fine-Structure (XAFS) Studies of Cobalt Silicide Thin Films / S.J. Naftel ; I. Coulthard ; Y. Hu ; T.K. Sham ; M. Zinke-Allmang |
| Electronic Effects at Interfaces in Cu/(Cr, Mo, W, Ta, Re) Multilayers / A.F. Bello ; T. Van Buuren ; J.E. Klepeis ; T.W. Barbee, Jr. |
| Interfacial Electronic-Charge Transfer and Density of States in Short-Period Cu/Cr Multilayers |
| Synchrotron X-ray-Absorption-Spectroscopy Studies of Pt/Si Systems |
| Direct Correlation of Solar Cell Performance With Metal Impurity Distributions in Polycrystalline Silicon Using Synchrotron-Based X-ray Analysis / S.A. McHugo ; G. Lamble ; A. MacDowell ; R. Celestre ; M. Imaizumi ; M. Yamaguchi|cI. Perichaud ; S. Martinuzzi ; M. Werner ; M. Rinio ; H.J. Moller ; B. Sopori ; H. Hieslmair ; C. Flink ; A. Istratov ; E.R. Weber |
| EXAFS Characterization of Amorphous GaAs / M.C. Ridgway ; C.J. Glover ; G.J. Foran ; K.M. Yu |
| Amorphous Semiconductor Sample Preparation for Transmission EXAFS Measurements / H.H. Tan ; A. Clark ; F. Karouta ; T.W. Lee ; Y. Moon ; E. Yoon ; J.L. Hansen ; A. Nylandsted-Larsen ; C. Clerc ; J. Chaumont |
| Kinetics of the Growth of Copper Clusters on the Alumina (0001) Surface: Influence of Surface Structure / L. Douillard ; P. Le Fevre ; H. Magnan ; J.P. Duraud |
| Temperature-Driven Oxidation Behavior of Pure Iron Surface Investigated by Time-Resolved EXAFS Measurements / S.J. Doh ; J.M. Lee ; D.Y. Noh ; J.H. Je |
| The Chemical Environment of Er[superscript 3+] in a-Si:Er:H and a-Si:Er:O:H / Leandro R. Tessler ; Cinthia Piamonteze ; Ana Carola Iniguez ; M.C. Martins Alves ; H. Tolentino |
| An EXAFS Study of Compositional Homogeneity in Sol-Gel Processed Potassium Tantalum Niobates / A.P. Wilkinson ; J. Xu ; S. Pattanaik |
| X-ray-Absorption-Spectroscopy Studies of Electrochemically Deposited Thin Oxide Films / M. Balasubramanian ; C.A. Melendres ; A.N. Mansour ; S. Mini |
| Synchrotron X-ray-Absorption-Studies of Atomic-Level Alloying in Immiscible Mixtures / J.H. He ; P.J. Schilling ; E. Ma |
| Characterization of Silver Binding in Cryptomelane by X-ray Absorption Spectroscopy / R. Ravikumar ; D.W. Fuerstenau ; G.A. Waychunas |
| Electronic- and Spatial-Structure Studies of Cadmium and Zinc Dialkyldithiocarbamate Molecules in Nonaqueous Solutions Used in the Processes Spray Pyrolysis / S.B. Erenburg ; N.V. Bausk ; S.M. Zemskova ; S.V. Tkachev |
| Surfaces of Semi-Fluorinated Block Copolymers Studied Using NEXAFS / J. Genzer ; E. Sivaniah ; E.J. Kramer ; J. Wang ; H. Korner ; M-L. Xiang ; S. Yang ; C.K. Ober ; K. Char ; M.K. Chaudhury ; B.M. DeKoven ; R.A. Bubeck ; D.A. Fischer ; S. Sambasivan |
| Structural Changes in Iron(II) Polymeric Complexes Upon Thermally and Optically-Induced Spin Transition Determined by EXAFS Spectroscopy / L.G. Lavrenova ; Yu.G. Shvedenkov |
| Author Index |
| Subject Index |
| Preface |
| Acknowledgments |
| Materials Research Society Symposium Proceedings |
図書
