Recommended Symbols, Sign Conventions, and Acronyms |
Contributors |
Imaging / 1.: |
Introduction / 1.1: |
Electron-scattering and -imaging geometry / 1.1.1: |
Electron-microscopy specimens / 1.1.2: |
The imaging process / 1.2: |
Image formation / 1.2.1: |
Aberrations / 1.2.2: |
Phase contrast / 1.3: |
Thin specimens as phase objects / 1.3.1: |
The weak-phase-object approximation / 1.3.2: |
Imaging of weak phase objects / 1.3.3: |
The effects of partial coherence / 1.3.4: |
Images of periodic objects / 1.4: |
Dark-field images / 1.5: |
Scanning transmission electron microscopy (STEM) / 1.6: |
Resolution / 1.7: |
Imaging Theory / 2.: |
Waves and Scattering / 2.1: |
Scattering approximations / 2.1.1: |
Transmission of electron waves through matter / 2.1.2: |
Abbe theory / 2.2: |
Imaging of phase objects / 2.2.2: |
Imaging with partial coherence / 2.2.4: |
Imaging of periodic objects / 2.3: |
Dark-field imaging / 2.4: |
Scanning transmission electron microscopy / 2.5: |
Conclusion / 2.6: |
Elastic Scattering of Electrons by Crystals / 3.: |
General dynamical scattering / 3.1: |
Kinematical scattering / 3.2: |
Kinematical diffraction from crystals: geometry / 3.2.1: |
Convergent-beam diffraction / 3.2.2: |
Kinematical diffraction from crystals: intensities / 3.2.3: |
Intensities for amorphous or microcrystalline specimens / 3.2.4: |
Limitations of the simple approximations / 3.3: |
Kinematical-approximation limitations / 3.3.1: |
Phase-object-approximation limitation / 3.3.2: |
Dynamical diffraction / 3.4: |
The Bloch-wave formulation / 3.4.1: |
The two-beam approximation / 3.4.2: |
The multislice formulation / 3.4.3: |
Dynamical-diffraction symmetries / 3.5: |
Detection of symmetry elements / 3.5.1: |
The imaging of crystals / 3.6: |
Imaging in the two-beam approximation / 3.6.1: |
Axial imaging of simple crystals / 3.6.2: |
Diffraction and imaging of crystal defects and disorder / 3.7: |
The column approximation / 3.7.1: |
Local atom displacements: thermal vibrations / 3.7.2: |
Atomic disorder in crystals / 3.7.3: |
Stacking faults and twins: extended defects / 3.7.4: |
Elastic-Scattering Theory / 4.: |
Dynamical scattering / 4.1: |
The kinematical approximation / 4.2: |
Diffraction by crystals / 4.2.1: |
Kinematical-diffraction intensities / 4.2.2: |
Formulations for dynamical diffraction / 4.3: |
Bethe theory / 4.3.1: |
Progression of a wave through a crystal / 4.3.2: |
Basis for the multislice method / 4.3.3: |
Images of crystals / 4.4: |
Inelastic Electron Scattering: Part I / 5.: |
Kinematics, single-event inelastic scattering, and the dielectric-response function / 5.1: |
Plasmons, phonons, and single-electron excitations / 5.3: |
Dynamical inelastic scattering / 5.4: |
Inelastic Electron Scattering: Part II / 6.: |
Localization in inelastic scattering / 6.1: |
Inelastic electron imaging / 6.2: |
Absorption effects and parameters in HRTEM / 6.3: |
Multiple energy-loss effects and their removal / 6.4: |
Radiation damage in HRTEM / 6.5: |
Techniques Closely Related to High-Resolution Electron Microscopy / 7.: |
Extended electron-loss fine structure (EXELFS) / 7.1: |
Electron-loss, near-edge structure (ELNES) / 7.3: |
Orientation effects in EELS / 7.4: |
ALCHEMI / 7.5: |
Cathodoluminescence in STEM / 7.6: |
Microdiffraction / 7.7: |
Specimen preparation / 7.8: |
Real-time image acquisition and videorecording in HRTEM / 7.9: |
Calculation of Diffraction Patterns and Images for Fast Electrons / 8.: |
Calculation of diffracted amplitudes and phases using multislice / 8.1: |
The transmission function / 8.2.1: |
The propagation function / 8.2.2: |
Multislice iteration / 8.2.3: |
Consistency tests / 8.2.4: |
Special systems / 8.3: |
Higher-order Laue zones / 8.3.1: |
Periodic continuation / 8.3.2: |
CBED and STEM / 8.3.3: |
HRTEM imaging / 8.4: |
Linear imaging / 8.4.1: |
Nonlinear imaging / 8.4.2: |
Limitations of the envelope functions / 8.4.3: |
Display techniques / 8.4.4: |
HRTEM-image processing / 8.4.5: |
The fast Fourier transform / Appendix A: |
Mineralogy / 9.: |
Reaction mechanisms / 9.1: |
Biopyriboles / 9.2.1: |
Graphite crystallization / 9.2.3: |
Cordierite transformation / 9.2.4: |
Biotite-chlorite reaction / 9.2.5: |
Stacking disorder and polytypism / 9.3: |
Micas / 9.3.1: |
Chlorites / 9.3.3: |
Pyroxenes / 9.3.4: |
Pyrosmalite / 9.3.5: |
Other polytypic minerals / 9.3.6: |
Intergrowth disorder and nonstoichiometry / 9.4: |
Sheet silicates / 9.4.1: |
Pyroxenoids / 9.4.3: |
Bastnaesite-synchysite / 9.4.4: |
Humites and leucophoenicite / 9.4.5: |
Oxysulfides / 9.4.6: |
Oxyborates and chemical twinning / 9.4.7: |
Modulated structures and nonstoichiometry / 9.5: |
Antigorite and pyrrhotite / 9.5.1: |
Feldspars / 9.5.3: |
Other minerals / 9.5.4: |
Characterization of minerals and structure determination / 9.6: |
Manganese oxides: fine-grained minerals / 9.6.1: |
Carlosturanite: a new type of chain silicate / 9.6.3: |
Other minerals (sursassite, takeuchiite, etc.) / 9.6.4: |
Mineral definition and nomenclature / 9.7: |
Structural disorder and intergrowth structures / 9.7.1: |
Ordered structures / 9.7.3: |
Phases / 9.7.4: |
Experimental techniques / 9.8: |
Special imaging to improve resolution (pyrrhotite) / 9.8.1: |
Radiation damage (biopyriboles, serpentines, and zeolites) / 9.8.3: |
"Controlled" heating by the electron beam (Cu-Fe sulfides) / 9.8.4: |
ALCHEMI and chemical disorder in minerals / 9.8.5: |
Imaging artifacts and the role of calculations / 9.9: |
Solid-State Chemistry / 10.: |
Solid-state chemistry / 10.1: |
Historical aside / 10.1.2: |
Application of HRTEM to solid-state chemistry / 10.2: |
The role of HRTEM in solid-state synthesis / 10.2.1: |
High-resolution microscopical analysis / 10.2.2: |
Nonstoichiometry and solid-state reactions / 10.2.3: |
Recommended Symbols, Sign Conventions, and Acronyms |
Contributors |
Imaging / 1.: |