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1.

図書
図書
1. X-Ray diffraction procedures for polycrystalline and amorphous materials
Harold P. Klug, Leroy Elbert Alexander
出版情報: New York : Wiley , London : Chapman & Hall, c1954  xiii, 716 p., [1] folded leaf of plates ; 24 cm
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2.

図書
図書
2. 高分子のX線回折 (上 ; 下)
Leroy E. Alexander著 ; 浜田文将, 梶慶輔共訳
出版情報: 京都 : 化学同人, 1973  2冊 ; 22cm
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3.

図書
図書
3. X-Ray diffraction procedures for polycrystalline and amorphous materials. 2nd ed
Harold P. Klug, Leroy E. Alexander
出版情報: New York : Wiley, c1974  xxv, 966 p. ; 24 cm
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目次情報: 続きを見る
Elementary Crystallography / 1：
The Crystalline State / 1-1：
Crystalline and Amorphous Solids / 1-1.1：
Definition of a Crystal / 1-1.2：
Characteristics of the Crystalline and Vitreous States / 1-1.3：
Crystal Geometry / 1-2：
External Form and Habit of Crystals / 1-2.1：
Constancy of Interfacial Angles / 1-2.2：
Symmetry Elements of Crystals / 1-2.3：
Pseudosymmetry, 13 / 1-2.4：
Crystallographic Axes / 1-2.5：
Axial Ratios / 1-2.6：
The Six Crystal Symmetry Systems / 1-2.7：
Miller Indices / 1-2.8：
The Law of Rational Indices / 1-2.9：
Crystal Forms / 1-2.10：
Composite Crystals and Twinning / 1-2.11：
Equation for the Plane (hkl) / 1-2.12：
Zones and Zone Relationships / 1-2.13：
Space Lattices / 1-3：
Historical Introduction / 1-3.1：
Definition / 1-3.2：
The Unit Ceil / 1-3.3：
The 14 Bravais Lattices / 1-3.4：
Some Crystallographic Implications of Space Lattices / 1-3.5：
Distance between Neighboring Lattice Planes in the Series (hkl) / 1-3.6：
The Reciprocal Lattice / 1-3.7：
Point Groups and Space Groups / 1-4：
The Point Group or Crystal Symmetry Class / 1-4.1：
The Space Group / 1-4.2：
General References
Specific References
The Production and Properties of X-rays / 2：
X-Ray Safety and Protection / 2-1：
The Production of X-Rays / 2-2：
The Origin of X-Rays / 2-2.1：
X-Ray Tubes / 2-2.2：
Gas tubes / A：
Hot-cathode tubes / B：
Modern diffraction tube design / C：
Cold-cathode diffraction tubes / D：
High-intensity diffraction tubes / E：
Microfocus diffraction tubes / F：
Power Equipment for the Production of X-rays / 2-2.3：
Commercial X-ray Generators for Diffraction / 2-2.4：
Isotopic X-ray Sources / 2-2.5：
Properties of X-Rays and their Measurement / 2-3：
The X-ray Spectrum of an Element / 2-3.1：
The continuous x-ray spectrum
The characteristic x-ray spectrum
The Precise Determination of X-ray Wavelengths / 2-3.2：
Absorption of X-rays / 2-3.3：
Secondary Fluorescent and Scattered X-rays / 2-3.4：
Refraction of X-rays / 2-3.5：
Monochromatization of X-radiation / 2-3.6：
Single filter technique
Balanced-filter technique
Crystal monochromator techniques
Graphite monochromators
The Photographic Effects of X-rays / 2-3.7：
Fundamental Principles of X-ray Diffraction / 3：
Kinematical and Dynamical Diffraction Theory / 3-1：
The Geometry of Diffraction / 3-2：
Scattering of X-rays by Electrons and Atoms / 3-2.1：
Scattering by a Regularly Spaced Row of Atoms / 3-2.2：
Conditions for Diffraction by a Linear Lattice of Atoms / 3-2.3：
Diffraction by a Simple Cubic Lattice / 3-2.4：
Proof that the "Diffracting Plane" is a Lattice Plane / 3-2.5：
The Bragg Equation / 3-2.6：
Derivation of the Bragg Equation from the "Reflection" Analogy / 3-2.7：
The Geometrical Picture of Diffraction in Reciprocal Space / 3-2.8：
The Intensity of Diffraction / 3-3：
Perfect and Imperfect Crystals / 3-3.1：
Primary and Secondary Extinction / 3-3.2：
Relative and Absolute Intensities / 3-3.3：
Factors Affecting the Diffraction Intensities / 3-3.4：
The polarization factor
The Lorentz and "velocity" factors
The temperature factor
The atomic scattering factor
The structure factor
The multiplicity factor
The absorption factor / G：
Expressions for the Relative Intensity of Diffraction by the Various Techniques / 3-3.5：
Lattice-Centering and Space-Group Extinctions / 3-3.6：
Photographic Powder Techniques / 4：
The Debye-Scherrer Method / 4-1：
Introduction / 4-1.1：
Camera Design / 4-1.2：
General geometry
Details of camera construction
Camera support and alignment
Preparation of the Powder / 4-1.3：
Mounting the Powder / 4-1.4：
Making the Exposure / 4-1.5：
Processing the Film / 4-1.6：
Parafocusing Methods / 4-2：
Monochromatic-Pinhole Techniques / 4-3：
Forward-Reflection Method / 4-3.1：
Back-Reflection Method / 4-3.2：
Microcameras and Microbeam Techniques / 4-4：
High-Temperature Techniques / 4-5：
Low-Temperature Techniques / 4-6：
High-Pressure Techniques / 4-7：
Diffractometric Powder Technique
Geometry of the Powder Diffractometer / 5-1：
General Features / 5-1.1：
Details of the Optical Arrangement / 5-1.2：
The Seemann-Bohlin Diffractometer / 5-1.3：
Alignment and Angular Calibration of the Diffractometer / 5-1.4：
Operations appropriately performed in advance by the manufacturer
Further internal alignment of the goniometer
Alignment of the goniometer with respect to the x-ray tube
Calibration of the O? 2Theta; position
Calibration of angular registration between 0 and 180? 2Theta;
Profiles and positions of diffraction maxima / 5-2：
Convolution Synthesis of Line Profiles / 5-2.1：
X-ray source, g I
Flat specimen surface, g II
Axial divergence, g III
Specimen transparency, g IV
Receiving slit, g v
Comparison of calculated and experimental line profiles
Displacement and Breadth of Diffraction Maxima / 5-2.2：
Line position
Line breadth
The practical determination of the centroid and variance
Accurate Determination of Interplanar (d) Spacings / 5-2.3：
"Routine" Determination of Interplanar (d) Spacings / 5-2.4：
Electrical Characteristics of the Diffractometer / 5-3：
General Arrangement of Components / 5-3.1：
Radiation Detectors (Quantum Counters) / 5-3.2：
Gas-ionization counters
Geiger-Muller counters
Proportional counters
Scintillation counters
Solid-state (energy-dispersive) detectors
Nonlinearity of Detector Response / 5-3.3：
Monochromatizing Techniques / 5-3.4：
Pulse-height discrimination and analysis
Ross balanced filters
Crystal monochromators
Choice of Experimental Conditions and Procedures / 5-4：
Statistical Accuracy of Counter Measurements / 5-4.1：
The Specimen / 5-4.2：
Preparation of powders
Rotation of the specimen
Preferred orientation and the specimen mount
High-temperature techniques
Low-temperature techniques
Other special specimen techniques
Transmission Techniques / 5-4.3：
Continuous-Scan Techniques / 5-4.4：
Step-Scan Techniques and Automation / 5-4.5：
The Interpretation of Powder Diffraction Data / 6：
The Viewing and Precision Measurement of Powder Photographs / 6-1：
Determination of Interplanar (d) Spacings / 6-2：
Debye-Scherrer Patterns / 6-2.1：
Monochromatic-Pinhole (Flat-Film) Patterns / 6-2.2：
Indexing Cubic Powder Patterns / 6-3：
Reciprocal-Lattice Picture of Diffraction by a Cubic Powder / 6-3.1：
Indexing a Cubic Pattern by sin 2 Theta Ratios / 6-3.2：
Determination of the Unit-Cell Dimension a / 6-3.3：
Indexing a Cubic Pattern When a Is Known / 6-3.4：
Determination of Lattice Type / 6-4：
Indexing Noncubic Powder Patterns / 6-5：
Indexing Noncubic Patterns When the Unit-Cell Dimensions are Known / 6-5.1：
Graphical Methods of Indexing / 6-5.2：
Analytical Methods of Indexing: Tetragonal, Hexagonal, and Orthorhombic Patterns / 6-5.3：
Analytical Methods of Indexing: Monoclinic and Triclinic Patterns / 6-5.4：
Automated Computing Procedures for Indexing Powder Patterns / 6-6：
Programs for Patterns of Orthorhombic and Higher Symmetry / 6-6.1：
Programs for Patterns of Low Symmetry / 6-6.2：
The Measurement of Intensities from Photographic Blackening / 6-7：
Preparation of a Graded Intensity Scale / 6-7.1：
Visual Estimation of Intensities / 6-7.3：
Photometer Techniques / 6-7.4：
The Measurement of Intensities with the X-Ray Diffractometer / 6-8：
Putting Intensities on an Absolute Scale / 6-9：
Special Scattering and Diffraction Effects / 6-10：
Background Effects / 6-10.1：
Background due to lattice imperfections
Background due to general radiation
Absorption discontinuities
Air scatter
Secondary fluorescence radiation
Reflections of Unusual Char / 6-10.2：
Elementary Crystallography / 1：
The Crystalline State / 1-1：
Crystalline and Amorphous Solids / 1-1.1：
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