| Selected articles |
| Atomic ordering and phase separation |
| Bonding theories |
| Chalcopyrite semiconductors |
| Characterization of compound semiconductors by etching |
| Chemical vapor deposition of dielectric and metal films |
| Connector materials |
| Defects in epitaxial layers |
| Defects in silicon: fundamentals |
| Defects in silicon: processing |
| Diluted magnetic semiconductors |
| Dislocations in semiconductors |
| Electrical laminates |
| Electronic and optical minerals |
| Epitaxial metal - semiconductor interfaces |
| Fine-line lithography |
| Fine-line metrology |
| Flip-chip interconnections |
| Fluorescence properties of materials |
| Grain boundaries in semiconductors |
| Growth of semiconductor bulk single crystals |
| Hydrogen in crystalline semiconductors |
| Interlevel dielectrics and passivating films |
| Laser glass |
| Laser materials |
| Liquid crystals |
| Liquid phase epitaxy |
| Local vibrational mode spectroscopy of semiconductors |
| Mechanical properties of semiconductors |
| Molecular beam epitaxy |
| Multilevel metallization |
| Organic "soft" thin-film transistor |
| Organometallic vapor phase epitaxy |
| Oxygen in Czochralski silicon |
| Quantum wells |
| Quantum wells: intrinsic optical properties |
| Schottky barriers |
| Semiconductor heterostructures: formation of defects and their reduction |
| Silicon carbide |
| Silicon dioxide: bulk properties |
| Silicon nitride: bulk properties |
| Silicon-on-insulator film growth |
| Silicon: properties and materials specifications |
| Silicon semiconductor devices and integrated circuit processing |
| Solid conductors |
| Sputtering |
| Stress- and current-induced damage in thin-film conductors |
| Thermoelectric semiconductors |
| Transmission electron microscopy of semiconductors |
| Selected articles |
| Atomic ordering and phase separation |
| Bonding theories |
図書
