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1.

図書
図書
1. Diffraction physics. 2nd, rev. ed
by John M. Cowley
出版情報: Amsterdam ; New York : North-Holland Pub. Co. , New York : Sole distributors for the U.S.A. and Canada, Elsevier North-Holland, c1981  xiv, 430 p. ; 23 cm
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2.

図書
図書
2. Modulated structures--1979 (Kailua Kona, Hawaii)
editors, J.M. Cowley ... [et al.]
出版情報: New York : American Institute of Physics, 1979  433 p. (p. 433 blank) ; 25 cm
シリーズ名: AIP conference proceedings ; no. 53
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3.

図書
図書
3. Diffraction physics (: American Elsevier ; : North-Holland)
by John M. Cowley
出版情報: Amsterdam : North-Holland Pub. Co. , New York : American Elsevier, 1975  xiii, 410 p. ; 23 cm
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4.

図書
図書
4. Electron diffraction techniques (v. 1 ; v. 2)
edited by John M. Cowley
出版情報: [Chester, England] : International Union of Crystallography , Oxford ; New York : Oxford University Press, 1992-1993  2 v. ; 24 cm
シリーズ名: International Union of Crystallography monographs on crystallography ; 3-4
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目次情報: 続きを見る
EM imaging and diffraction contrast / S. Amelinckx ; D. van Dyck
Rheed and REM3 / K. Yagi
Disorder and defect scattering / J. Gj°nnes
Electron diffraction effects due to modulated structures
Identifications of unknowns / M. Carr ; C. Lyman
Index
EM imaging and diffraction contrast / S. Amelinckx ; D. van Dyck
Rheed and REM3 / K. Yagi
Disorder and defect scattering / J. Gj°nnes
5.

図書
図書
5. High-resolution transmission electron microscopy and associated techniques
editors, Peter R. Buseck, John M. Cowley, Leroy Eyring
出版情報: New York : Oxford University Press, 1988  xix, 645 p. ; 25 cm
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目次情報: 続きを見る
Recommended Symbols, Sign Conventions, and Acronyms
Contributors
Imaging / 1.：
Introduction / 1.1：
Electron-scattering and -imaging geometry / 1.1.1：
Electron-microscopy specimens / 1.1.2：
The imaging process / 1.2：
Image formation / 1.2.1：
Aberrations / 1.2.2：
Phase contrast / 1.3：
Thin specimens as phase objects / 1.3.1：
The weak-phase-object approximation / 1.3.2：
Imaging of weak phase objects / 1.3.3：
The effects of partial coherence / 1.3.4：
Images of periodic objects / 1.4：
Dark-field images / 1.5：
Scanning transmission electron microscopy (STEM) / 1.6：
Resolution / 1.7：
Imaging Theory / 2.：
Waves and Scattering / 2.1：
Scattering approximations / 2.1.1：
Transmission of electron waves through matter / 2.1.2：
Abbe theory / 2.2：
Imaging of phase objects / 2.2.2：
Imaging with partial coherence / 2.2.4：
Imaging of periodic objects / 2.3：
Dark-field imaging / 2.4：
Scanning transmission electron microscopy / 2.5：
Conclusion / 2.6：
Elastic Scattering of Electrons by Crystals / 3.：
General dynamical scattering / 3.1：
Kinematical scattering / 3.2：
Kinematical diffraction from crystals: geometry / 3.2.1：
Convergent-beam diffraction / 3.2.2：
Kinematical diffraction from crystals: intensities / 3.2.3：
Intensities for amorphous or microcrystalline specimens / 3.2.4：
Limitations of the simple approximations / 3.3：
Kinematical-approximation limitations / 3.3.1：
Phase-object-approximation limitation / 3.3.2：
Dynamical diffraction / 3.4：
The Bloch-wave formulation / 3.4.1：
The two-beam approximation / 3.4.2：
The multislice formulation / 3.4.3：
Dynamical-diffraction symmetries / 3.5：
Detection of symmetry elements / 3.5.1：
The imaging of crystals / 3.6：
Imaging in the two-beam approximation / 3.6.1：
Axial imaging of simple crystals / 3.6.2：
Diffraction and imaging of crystal defects and disorder / 3.7：
The column approximation / 3.7.1：
Local atom displacements: thermal vibrations / 3.7.2：
Atomic disorder in crystals / 3.7.3：
Stacking faults and twins: extended defects / 3.7.4：
Elastic-Scattering Theory / 4.：
Dynamical scattering / 4.1：
The kinematical approximation / 4.2：
Diffraction by crystals / 4.2.1：
Kinematical-diffraction intensities / 4.2.2：
Formulations for dynamical diffraction / 4.3：
Bethe theory / 4.3.1：
Progression of a wave through a crystal / 4.3.2：
Basis for the multislice method / 4.3.3：
Images of crystals / 4.4：
Inelastic Electron Scattering: Part I / 5.：
Kinematics, single-event inelastic scattering, and the dielectric-response function / 5.1：
Plasmons, phonons, and single-electron excitations / 5.3：
Dynamical inelastic scattering / 5.4：
Inelastic Electron Scattering: Part II / 6.：
Localization in inelastic scattering / 6.1：
Inelastic electron imaging / 6.2：
Absorption effects and parameters in HRTEM / 6.3：
Multiple energy-loss effects and their removal / 6.4：
Radiation damage in HRTEM / 6.5：
Techniques Closely Related to High-Resolution Electron Microscopy / 7.：
Extended electron-loss fine structure (EXELFS) / 7.1：
Electron-loss, near-edge structure (ELNES) / 7.3：
Orientation effects in EELS / 7.4：
ALCHEMI / 7.5：
Cathodoluminescence in STEM / 7.6：
Microdiffraction / 7.7：
Specimen preparation / 7.8：
Real-time image acquisition and videorecording in HRTEM / 7.9：
Calculation of Diffraction Patterns and Images for Fast Electrons / 8.：
Calculation of diffracted amplitudes and phases using multislice / 8.1：
The transmission function / 8.2.1：
The propagation function / 8.2.2：
Multislice iteration / 8.2.3：
Consistency tests / 8.2.4：
Special systems / 8.3：
Higher-order Laue zones / 8.3.1：
Periodic continuation / 8.3.2：
CBED and STEM / 8.3.3：
HRTEM imaging / 8.4：
Linear imaging / 8.4.1：
Nonlinear imaging / 8.4.2：
Limitations of the envelope functions / 8.4.3：
Display techniques / 8.4.4：
HRTEM-image processing / 8.4.5：
The fast Fourier transform / Appendix A：
Mineralogy / 9.：
Reaction mechanisms / 9.1：
Biopyriboles / 9.2.1：
Graphite crystallization / 9.2.3：
Cordierite transformation / 9.2.4：
Biotite-chlorite reaction / 9.2.5：
Stacking disorder and polytypism / 9.3：
Micas / 9.3.1：
Chlorites / 9.3.3：
Pyroxenes / 9.3.4：
Pyrosmalite / 9.3.5：
Other polytypic minerals / 9.3.6：
Intergrowth disorder and nonstoichiometry / 9.4：
Sheet silicates / 9.4.1：
Pyroxenoids / 9.4.3：
Bastnaesite-synchysite / 9.4.4：
Humites and leucophoenicite / 9.4.5：
Oxysulfides / 9.4.6：
Oxyborates and chemical twinning / 9.4.7：
Modulated structures and nonstoichiometry / 9.5：
Antigorite and pyrrhotite / 9.5.1：
Feldspars / 9.5.3：
Other minerals / 9.5.4：
Characterization of minerals and structure determination / 9.6：
Manganese oxides: fine-grained minerals / 9.6.1：
Carlosturanite: a new type of chain silicate / 9.6.3：
Other minerals (sursassite, takeuchiite, etc.) / 9.6.4：
Mineral definition and nomenclature / 9.7：
Structural disorder and intergrowth structures / 9.7.1：
Ordered structures / 9.7.3：
Phases / 9.7.4：
Experimental techniques / 9.8：
Special imaging to improve resolution (pyrrhotite) / 9.8.1：
Radiation damage (biopyriboles, serpentines, and zeolites) / 9.8.3：
"Controlled" heating by the electron beam (Cu-Fe sulfides) / 9.8.4：
ALCHEMI and chemical disorder in minerals / 9.8.5：
Imaging artifacts and the role of calculations / 9.9：
Solid-State Chemistry / 10.：
Solid-state chemistry / 10.1：
Historical aside / 10.1.2：
Application of HRTEM to solid-state chemistry / 10.2：
The role of HRTEM in solid-state synthesis / 10.2.1：
High-resolution microscopical analysis / 10.2.2：
Nonstoichiometry and solid-state reactions / 10.2.3：
Recommended Symbols, Sign Conventions, and Acronyms
Contributors
Imaging / 1.：
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