High-resolution transmission electron microscopy and associated techniques

>> Google Books

所蔵情報QRコード

High-resolution transmission electron microscopy and associated techniques / editors, Peter R. Buseck, John M. Cowley, Leroy Eyring

資料種別:

図書

出版情報:

New York : Oxford University Press, 1988

形態:

xix, 645 p. ; 25 cm

著者名:

ISBN:

9780195042757 [0195042751]

書誌ID:

BA06804864

子書誌情報

フルテキスト

所蔵情報

他の版・巻

書誌詳細

注記:

Includes bibliographical references and index

主題:

Electron microscope, Transmission

言語:

英語

目次情報:

Recommended Symbols, Sign Conventions, and Acronyms

Contributors

Imaging / 1.：

Introduction / 1.1：

Electron-scattering and -imaging geometry / 1.1.1：

Electron-microscopy specimens / 1.1.2：

The imaging process / 1.2：

Image formation / 1.2.1：

Aberrations / 1.2.2：

Phase contrast / 1.3：

Thin specimens as phase objects / 1.3.1：

The weak-phase-object approximation / 1.3.2：

Imaging of weak phase objects / 1.3.3：

The effects of partial coherence / 1.3.4：

Images of periodic objects / 1.4：

Dark-field images / 1.5：

Scanning transmission electron microscopy (STEM) / 1.6：

Resolution / 1.7：

Imaging Theory / 2.：

Waves and Scattering / 2.1：

Scattering approximations / 2.1.1：

Transmission of electron waves through matter / 2.1.2：

Abbe theory / 2.2：

Imaging of phase objects / 2.2.2：

Imaging with partial coherence / 2.2.4：

Imaging of periodic objects / 2.3：

Dark-field imaging / 2.4：

Scanning transmission electron microscopy / 2.5：

Conclusion / 2.6：

Elastic Scattering of Electrons by Crystals / 3.：

General dynamical scattering / 3.1：

Kinematical scattering / 3.2：

Kinematical diffraction from crystals: geometry / 3.2.1：

Convergent-beam diffraction / 3.2.2：

Kinematical diffraction from crystals: intensities / 3.2.3：

Intensities for amorphous or microcrystalline specimens / 3.2.4：

Limitations of the simple approximations / 3.3：

Kinematical-approximation limitations / 3.3.1：

Phase-object-approximation limitation / 3.3.2：

Dynamical diffraction / 3.4：

The Bloch-wave formulation / 3.4.1：

The two-beam approximation / 3.4.2：

The multislice formulation / 3.4.3：

Dynamical-diffraction symmetries / 3.5：

Detection of symmetry elements / 3.5.1：

The imaging of crystals / 3.6：

Imaging in the two-beam approximation / 3.6.1：

Axial imaging of simple crystals / 3.6.2：

Diffraction and imaging of crystal defects and disorder / 3.7：

The column approximation / 3.7.1：

Local atom displacements: thermal vibrations / 3.7.2：

Atomic disorder in crystals / 3.7.3：

Stacking faults and twins: extended defects / 3.7.4：

Elastic-Scattering Theory / 4.：

Dynamical scattering / 4.1：

The kinematical approximation / 4.2：

Diffraction by crystals / 4.2.1：

Kinematical-diffraction intensities / 4.2.2：

Formulations for dynamical diffraction / 4.3：

Bethe theory / 4.3.1：

Progression of a wave through a crystal / 4.3.2：

Basis for the multislice method / 4.3.3：

Images of crystals / 4.4：

Inelastic Electron Scattering: Part I / 5.：

Kinematics, single-event inelastic scattering, and the dielectric-response function / 5.1：

Plasmons, phonons, and single-electron excitations / 5.3：

Dynamical inelastic scattering / 5.4：

Inelastic Electron Scattering: Part II / 6.：

Localization in inelastic scattering / 6.1：

Inelastic electron imaging / 6.2：

Absorption effects and parameters in HRTEM / 6.3：

Multiple energy-loss effects and their removal / 6.4：

Radiation damage in HRTEM / 6.5：

Techniques Closely Related to High-Resolution Electron Microscopy / 7.：

Extended electron-loss fine structure (EXELFS) / 7.1：

Electron-loss, near-edge structure (ELNES) / 7.3：

Orientation effects in EELS / 7.4：

ALCHEMI / 7.5：

Cathodoluminescence in STEM / 7.6：

Microdiffraction / 7.7：

Specimen preparation / 7.8：

Real-time image acquisition and videorecording in HRTEM / 7.9：

Calculation of Diffraction Patterns and Images for Fast Electrons / 8.：

Calculation of diffracted amplitudes and phases using multislice / 8.1：

The transmission function / 8.2.1：

The propagation function / 8.2.2：

Multislice iteration / 8.2.3：

Consistency tests / 8.2.4：

Special systems / 8.3：

Higher-order Laue zones / 8.3.1：

Periodic continuation / 8.3.2：

CBED and STEM / 8.3.3：

HRTEM imaging / 8.4：

Linear imaging / 8.4.1：

Nonlinear imaging / 8.4.2：

Limitations of the envelope functions / 8.4.3：

Display techniques / 8.4.4：

HRTEM-image processing / 8.4.5：

The fast Fourier transform / Appendix A：

Mineralogy / 9.：

Reaction mechanisms / 9.1：

Biopyriboles / 9.2.1：

Graphite crystallization / 9.2.3：

Cordierite transformation / 9.2.4：

Biotite-chlorite reaction / 9.2.5：

Stacking disorder and polytypism / 9.3：

Micas / 9.3.1：

Chlorites / 9.3.3：

Pyroxenes / 9.3.4：

Pyrosmalite / 9.3.5：

Other polytypic minerals / 9.3.6：

Intergrowth disorder and nonstoichiometry / 9.4：

Sheet silicates / 9.4.1：

Pyroxenoids / 9.4.3：

Bastnaesite-synchysite / 9.4.4：

Humites and leucophoenicite / 9.4.5：

Oxysulfides / 9.4.6：

Oxyborates and chemical twinning / 9.4.7：

Modulated structures and nonstoichiometry / 9.5：

Antigorite and pyrrhotite / 9.5.1：

Feldspars / 9.5.3：

Other minerals / 9.5.4：

Characterization of minerals and structure determination / 9.6：

Manganese oxides: fine-grained minerals / 9.6.1：

Carlosturanite: a new type of chain silicate / 9.6.3：

Other minerals (sursassite, takeuchiite, etc.) / 9.6.4：

Mineral definition and nomenclature / 9.7：

Structural disorder and intergrowth structures / 9.7.1：

Ordered structures / 9.7.3：

Phases / 9.7.4：

Experimental techniques / 9.8：

Special imaging to improve resolution (pyrrhotite) / 9.8.1：

Radiation damage (biopyriboles, serpentines, and zeolites) / 9.8.3：

"Controlled" heating by the electron beam (Cu-Fe sulfides) / 9.8.4：

ALCHEMI and chemical disorder in minerals / 9.8.5：

Imaging artifacts and the role of calculations / 9.9：

Solid-State Chemistry / 10.：

Solid-state chemistry / 10.1：

Historical aside / 10.1.2：

Application of HRTEM to solid-state chemistry / 10.2：

The role of HRTEM in solid-state synthesis / 10.2.1：

High-resolution microscopical analysis / 10.2.2：

Nonstoichiometry and solid-state reactions / 10.2.3：

Recommended Symbols, Sign Conventions, and Acronyms

Contributors

Imaging / 1.：

Introduction / 1.1：

Electron-scattering and -imaging geometry / 1.1.1：

Electron-microscopy specimens / 1.1.2：

続きを見る

東工大ブックレビュー

類似資料:

1 図書 Experimental high-resolution electron microscopy Spence, John C. H. Oxford University Press	7 図書 Modulated structures--1979 (Kailua Kona, Hawaii) International Conference on Modulated Structures, Cowley, J. M. (John Maxwell), 1923- American Institute of Physics
2 図書 Electron diffraction techniques (v. 1 ; v. 2) Cowley, J. M. (John Maxwell), 1923- International Union of Crystallography, Oxford University Press	8 図書 Fundamentals of high-resolution transmission electron microscopy 堀内, 繁雄 North-Holland
3 図書 Transmission electron microscopy : physics of image formation and microanalysis (: gw ; : us) Reimer, Ludwig, 1928- Springer-Verlag	9 電子ブック Scanning Transmission Electron Microscopy Stephen J. Pennycook, Peter D. Nellist, Nellist, Peter D., Pennycook, Stephen J. SpringerLink Books - AutoHoldings, Springer New York
4 図書 Diffraction physics Cowley, J. M. (John Maxwell), 1923- North-Holland Pub. Co., Sole distributors for the U.S.A. and Canada, Elsevier North-Holland	10 図書 Transmission electron microscopy of materials Thomas, Gareth, Goringe, M. J. Wiley
5 図書 Diffraction physics (: American Elsevier ; : North-Holland) Cowley, J. M. (John Maxwell), 1923- North-Holland Pub. Co., American Elsevier	11 図書 High voltage electron microscopy : proceedings of the third International Conference International Conference on High Voltage Electron Microscopy, Swann, Peter Roland, 1935-, Humphreys, Colin John, … Academic Press
6 図書 Biological electron microscopy Gabriel, Barbra L. Van Nostrand Reinhold	12 図書 Advances in high temperature chemistry (v. 1 - v. 4) Eyring, LeRoy Academic Press