| Preface |
| Structure and Topology |
| Defect-free vitreous networks: The idealised structure of SiO2 and related glasses / A.C. Wright |
| Topology and topological disorder in silica / L.W. Hobbs ; X. Yuan |
| Bulk Defects |
| Optical properties of defects in silica / L. Skuja |
| The natures of point defects in amorphous silicon dioxide / D.L. Griscom |
| Ab initio theory of point defects in SiO2 / G. Pacchioni |
| A demi-century of magnetic defects in alpha-quartz / J.A. Weil |
| Interaction of SiO2 glasses with high energy ion beams and vacuum UV excimer laser pulses / H. Hosono ; K. Kawamura |
| Excitons, localized states in silicon dioxide and related crystals and glasses / A.N. Trukhin |
| Gamma rays induced conversion of native defects in natural silica / F.M. Gelardi ; S. Agnello |
| Ge and Sn doping in silica: structural changes, optically active defects, paramagnetic sites / A. Paleari |
| Computational studies of self-trapped excitons in silica / L.R. Corrales, et al |
| Surface Defects |
| Defects on activated silica surface / V.A. Radzig |
| Ab-initio molecular dynamics simulation of amorphous silica surface / M. Bernasconi |
| Bragg Grating |
| periodic UV-induced index modulations in doped-silica optical fibers: formation and properties of the fiber Bragg grating / C.G. Askins |
| Bulk silicas prepared by low presssure plasma CVD: formation of structure and point defects / K.M. Golant |
| Change of spectroscopic and structural properties of germanosilicate glass uner mechanical compression and UV irradiation / V.M. Machinsky |
| UV photoinduced phenomena in oxygen-deficient silica glasses / A. Rybaltovskii |
| One- and two-quantum UV photo-reactions in pure and doped silica glasses |
| 2. Germanium oxygen deficient centers (GODC) / V.N. Bagratashvili, et al |
| Photoinduced refractive index change and second harmonic generation in MCVD germanosilicate core fibers fabricated in reduced (nitrogen and helium) atmospheres / E.M. Dianov, et al |
| Si/SiO2 Interface and Gate Dielectrics |
| Molecular hydrogen interaction kinetics of interfacial Si dangling bonds in thermal (111)Si/SiO2 |
| An electron spin resonance saga / A.L. Stesmans |
| Ultrathin oxide films for advanced gate dielectrics applications Current progress and future challenges / E.P. Gusev |
| SiC/SiO2 interface defects / V.V. Afanas'ev |
| Point defects in Si-SiO2 systems: current understanding / S.P. Karna, et al |
| Index |
| Preface |
| Structure and Topology |
| Defect-free vitreous networks: The idealised structure of SiO2 and related glasses / A.C. Wright |
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