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1.

図書

図書
[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section]
出版情報: Washington, D.C. : International Test Conference, c1999  xiv, 1163 p. ; 29 cm
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2.

図書

図書
[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]
出版情報: Washington, D.C. : International Test Conference, c1998  xvi, 1179 p. ; 29 cm
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3.

図書

図書
[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]
出版情報: Altoona, PA : International Test Conference, c1996  xii, 951 p. ; 29 cm
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4.

図書

図書
International Test Conference
出版情報: Altoona, PA : International Test Conference, c1995  xii, 1011 p. ; 29 cm
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5.

図書

図書
International Test Conference
出版情報: Altoona, PA : International Test Conference, c1994  xii, 1033 p. ; 29 cm
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6.

図書

図書
[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]
出版情報: Altoona, PA : International Test Conference, c1993  xii, 1065 p. ; 29 cm
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7.

図書

図書
International Test Conference
出版情報: Altoona, PA : International Test Conference, c1991  xiv, 1135 p. ; 28 cm
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8.

図書

図書
[sponsored by the IEEE Computer Society Test Technology Techinical Committee and IEEE Philadelphia Section]
出版情報: Altoona, PA : International Test Conference, c1992  xii, 1012 p. ; 28 cm
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9.

図書

図書
[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]
出版情報: Washington, D.C. : International Test Conference, c1997  xiv, 1054 p. ; 29 cm
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10.

図書

図書
sponsored by the IEEE Computer Society, Test Technology Technical Committee and IEEE Philadelphia Section
出版情報: Los Alamitos, Calif. : Tokyo : IEEE Computer Society Press, c1990  xvi, 1083 p. ; 29 cm
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