close
1.

図書

図書
[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]
出版情報: Washington, D.C. : International Test Conference, c2004  xvi, 1459 p. ; 28 cm
所蔵情報: loading…
2.

図書

図書
[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]
出版情報: Washington, D.C. : International Test Conference, c2003  xvi, 1334 p. ; 28 cm
所蔵情報: loading…
3.

図書

図書
sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section
出版情報: Washington, D.C. : International Test Conference, c2002  xvi, 1250 p. ; 29 cm
所蔵情報: loading…
4.

図書

図書
sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section
出版情報: Washington, D.C. : International Test Conference, c2001  xiv, 1201 p. ; 29 cm
所蔵情報: loading…
5.

図書

図書
International Test Conference ; IEEE Computer Society. Test Technology Technical Council ; Institute of Electrical and Electronics Engineers
出版情報: [Piscataway] : Institute of Electrical and Electronics Engineers, c2005  2 v. ; 28 cm
所蔵情報: loading…
6.

図書

図書
[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]
出版情報: Washington, D.C. : International Test Conference, c2000  xiv, 1158 p. ; 29 cm
所蔵情報: loading…
文献の複写および貸借の依頼を行う
 文献複写・貸借依頼