Testing's changing role : International Test Conference, 1983 : proceedings, October 18-20, 1983 | 東京工業大学附属図書館蔵書検索

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Testing's changing role : International Test Conference, 1983 : proceedings, October 18-20, 1983 / sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section

資料種別:

図書

出版情報:

Silver Spring, MD : IEEE Computer Society Press, 1983

形態:

xxv, 806 p. ; 28 cm

著者名:

ISBN:

9780818605024 [0818605022]

書誌ID:

BB30101937

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書誌詳細

その他の標題:	International Test Conference 1983 proceedings 83CH1933-1 83CH19331
注記:	Spine title: International Test Conference 1983 proceedings "IEEE catalog no. 83CH1933-1." "Computer Society order no. 502." Includes bibliographical references and index
主題:	Automatic test equipment--Congresses; Electronic digital computers--Circuits--Testing--Congresses; Integrated circuits--Testing--Congresses
言語:	英語

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