Proceedings : International Test Conference 2000, [October 3-5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA]

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Proceedings : International Test Conference 2000, [October 3-5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA] / [sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]

資料種別:

図書

出版情報:

Washington, D.C. : International Test Conference, c2000

形態:

xiv, 1158 p. ; 29 cm

著者名:

ISBN:

9780780365469 [0780365461] (: soft)
9780780365476 [078036547X] (: case)
9780780365483 [0780365488] (: microfiche)

書誌ID:

BA49486625

子書誌情報

フルテキスト

所蔵情報

他の版・巻

書誌詳細

その他の標題:	ITC : International Test Conference 2000 : proceedings
ISSN:	10893539
注記:	"IEEE Catalog Number 00CH37159"--T.p. verso Includes bibliographies and index
主題:	Automatic checkout equipment--Congresses; Integrated circuits--Testing--Congresses
言語:	英語

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