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1.

図書
図書
1. Proceedings : International Test Conference 2003
[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]
出版情報: Washington, D.C. : International Test Conference, c2003  xvi, 1334 p. ; 28 cm
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2.

図書
図書
2. Proceedings : International Test Conference 2004
[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]
出版情報: Washington, D.C. : International Test Conference, c2004  xvi, 1459 p. ; 28 cm
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3.

図書
図書
3. International Test Conference 2001 : proceedings, October 30 - November 1, 2001, Baltimore Convention Center, Baltimore, MD, USA
sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section
出版情報: Washington, D.C. : International Test Conference, c2001  xiv, 1201 p. ; 29 cm
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4.

図書
図書
4. International Test Conference 2002 : proceedings, October 7-10, 2002, Baltimore Convention Center, Baltimore, MD, USA
sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section
出版情報: Washington, D.C. : International Test Conference, c2002  xvi, 1250 p. ; 29 cm
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5.

図書
図書
5. Proceedings : International Test Conference 2000, [October 3-5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA] (: soft ; : case ; : microfiche)
[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]
出版情報: Washington, D.C. : International Test Conference, c2000  xiv, 1158 p. ; 29 cm
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6.

図書
図書
6. 2005 IEEE International Test Conference (ITC), 8-10 Novermber, 2005, Austin, TX (: [set] ; v. 1 ; v. 2)
International Test Conference ; IEEE Computer Society. Test Technology Technical Council ; Institute of Electrical and Electronics Engineers
出版情報: [Piscataway] : Institute of Electrical and Electronics Engineers, c2005  2 v. ; 28 cm
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