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1.

図書
図書
1. ITC : International Test Conference : Meeting the tests of time, August 29-31, 1989, Sheraton Washington Hotel, Washington, DC
Sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section
出版情報: Washington, D.C. ; Tokyo : IEEE Computer Society Press , New York, N.Y. : Institute of Electrical and Electronics Engineers, c1989  xxxiv, 959 p. ; 28 cm
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2.

図書
図書
2. The changing philosophy of test : International Test Conference 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC (: paper ; : microfiche ; : case)
sponsored by the IEEE Computer Society, Test Technology Technical Committee and IEEE Philadelphia Section
出版情報: Los Alamitos, Calif. : Tokyo : IEEE Computer Society Press, c1990  xvi, 1083 p. ; 29 cm
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3.

図書
図書
3. New frontiers in testing : International Test Conference, 1988 proceedings, September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, DC (paper ; microfiche ; case)
sponsored by the Computer Society of the IEEE, Test Technology Technical Committee and IEEE Philadelphia Section
出版情報: Washington, D.C. : Computer Society Press of the IEEE, c1988  xxx, 1005 p. ; 28 cm
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