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1.

図書
図書
1. New frontiers in testing : International Test Conference, 1988 proceedings, September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, DC (paper ; microfiche ; case)
sponsored by the Computer Society of the IEEE, Test Technology Technical Committee and IEEE Philadelphia Section
出版情報: Washington, D.C. : Computer Society Press of the IEEE, c1988  xxx, 1005 p. ; 28 cm
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2.

図書
図書
2. International Test Conference 2001 : proceedings, October 30 - November 1, 2001, Baltimore Convention Center, Baltimore, MD, USA
sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section
出版情報: Washington, D.C. : International Test Conference, c2001  xiv, 1201 p. ; 29 cm
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3.

図書
図書
3. International Test Conference 2002 : proceedings, October 7-10, 2002, Baltimore Convention Center, Baltimore, MD, USA
sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section
出版情報: Washington, D.C. : International Test Conference, c2002  xvi, 1250 p. ; 29 cm
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4.

図書
図書
4. Proceedings : International Test Conference 2000, [October 3-5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA] (: soft ; : case ; : microfiche)
[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]
出版情報: Washington, D.C. : International Test Conference, c2000  xiv, 1158 p. ; 29 cm
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5.

図書
図書
5. Integration of test with design and manufacturing : proceedings : International Test Conference, 1987, September 1,2,3, 1987, Sheraton Washington Hotel, Washington, D.C. (pbk. ; microfiche ; case)
sponsored by the IEEE Computer Society, IEEE Philadelphia Section
出版情報: Washington, D.C. : Computer Society Press of the IEEE , Los Angeles, CA : Order from Computer Society of the IEEE, c1987  xxxi, 1151 p. ; 28 cm
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