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1.

図書
図書
1. The future of test : International Test Conference, 1985 proceedings, November 19, 20, 21, 1985 (pbk. ; hard ; microfiche)
sponsored by the IEEE Computer Society, IEEE Philadelphia Section
出版情報: Washington, D.C. : IEEE Computer Society Press , Los Angeles, CA : Order from IEEE Computer Society, 1985  xxx, 988 p. ; 28 cm
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2.

図書
図書
2. Testing's impact on design & technology : International Test Conference, 1986, proceedings, September 8, 9, 10, 11, 1986 (pbk. ; microfiche ; hard)
sponsored by the IEEE Computer Society [and] IEEE Philadelphia Section
出版情報: Washington, D.C. : IEEE Computer Society Press, c1986  xxx, 1009 p. ; 28 cm
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3.

図書
図書
3. The three faces of test : design, characterization, production : International Test Conference, 1984 proceedings, October 16, 17, 18, 1984 (pbk. ; microfiche ; hard)
sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section
出版情報: Silver Spring, MD : IEEE Computer Society Press, c1984  xxxi, 886 p. ; 28 cm
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