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1.

図書

図書
[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section]
出版情報: Washington, D.C. : International Test Conference, c1999  xiv, 1163 p. ; 29 cm
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2.

図書

図書
[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]
出版情報: Washington, D.C. : International Test Conference, c1998  xvi, 1179 p. ; 29 cm
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3.

図書

図書
International Test Conference
出版情報: Altoona, PA : International Test Conference, c1994  xii, 1033 p. ; 29 cm
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4.

図書

図書
International Test Conference
出版情報: Altoona, PA : International Test Conference, c1995  xii, 1011 p. ; 29 cm
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5.

図書

図書
[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]
出版情報: Altoona, PA : International Test Conference, c1993  xii, 1065 p. ; 29 cm
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6.

図書

図書
[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]
出版情報: Washington, D.C. : International Test Conference, c1997  xiv, 1054 p. ; 29 cm
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7.

図書

図書
[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]
出版情報: Altoona, PA : International Test Conference, c1996  xii, 951 p. ; 29 cm
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8.

図書

図書
[sponsored by the IEEE Computer Society Test Technology Techinical Committee and IEEE Philadelphia Section]
出版情報: Altoona, PA : International Test Conference, c1992  xii, 1012 p. ; 28 cm
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9.

図書

図書
sponsored by the Computer Society of the IEEE, Test Technology Technical Committee and IEEE Philadelphia Section
出版情報: Washington, D.C. : Computer Society Press of the IEEE, c1988  xxx, 1005 p. ; 28 cm
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10.

図書

図書
sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section
出版情報: Washington, D.C. : International Test Conference, c2001  xiv, 1201 p. ; 29 cm
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11.

図書

図書
sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section
出版情報: Washington, D.C. : International Test Conference, c2002  xvi, 1250 p. ; 29 cm
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12.

図書

図書
[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]
出版情報: Washington, D.C. : International Test Conference, c2000  xiv, 1158 p. ; 29 cm
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13.

図書

図書
sponsored by the IEEE Computer Society, IEEE Philadelphia Section
出版情報: Washington, D.C. : Computer Society Press of the IEEE , Los Angeles, CA : Order from Computer Society of the IEEE, c1987  xxxi, 1151 p. ; 28 cm
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