Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A. / editors, Noble M. Johnson, Stephen G. Bishop, George D. Watkins
- 資料種別:
- 図書
- 出版情報:
- Pittsburgh, Pa. : Materials Research Society, c1985
- 形態:
- xv, 604 p. ; 24 cm
- シリーズ名:
- Materials Research Society symposium proceedings ; v. 46 <BA00013775>
- 著者名:
- ISBN:
- 9780931837111 [0931837111]
- 書誌ID:
- BA03908080
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Materials Research Society | |
Materials Research Society | |
Materials Research Society |
Materials Research Society |