Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A. | 東京工業大学附属図書館蔵書検索

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Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A. / editors, Noble M. Johnson, Stephen G. Bishop, George D. Watkins

資料種別:

図書

出版情報:

Pittsburgh, Pa. : Materials Research Society, c1985

形態:

xv, 604 p. ; 24 cm

シリーズ名:

Materials Research Society symposium proceedings ; v. 46 <BA00013775>

著者名:

Johnson, Noble M. <DA02347450>

Bishop, Stephen G. <DA02695457>

Watkins, George D. <DA02695479>

Materials Research Society <DA00024949>

Materials Research Society. Meeting <DA00721013>

Symposium on Microscopic Identification of Electronic Defects in Semiconductors <DA0308225X>

さらに 1 件

ISBN:

9780931837111 [0931837111]

書誌ID:

BA03908080

子書誌情報

フルテキスト

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所蔵情報

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書誌詳細

注記:	Includes bibliographies and indexes
主題:	Microscope and microscopy--Congresses; Semiconductors--Defects--Congresses
言語:	英語

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