Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991 | 東京工業大学附属図書館蔵書検索

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Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991 / edited by Gordon Davies, Gary G. DeLeo and Michael Stavola

資料種別:

図書

出版情報:

Zürich, Switzerland : Trans Tech Publications, c1992

形態:

3 v. (1604 p.) ; 25 cm

シリーズ名:

Materials science forum ; v. 83-87 <BA00294222>

著者名:

ISBN:

9780878496280 [0878496289] (: set)

書誌ID:

BA13702321

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書誌詳細

その他の標題:	Defects in semiconductors 16
主題:	誘電体．半導体
言語:	英語

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