Fringe pattern analysis : 8-9 August 1989, San Diego, California | 東京工業大学附属図書館蔵書検索

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Fringe pattern analysis : 8-9 August 1989, San Diego, California / Graeme T. Reid, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University

資料種別:

図書

出版情報:

Bellingham, Wash., USA : SPIE, c1989

形態:

vi, 260 p. ; 28 cm

シリーズ名:

Proceedings / SPIE -- the International Society for Optical Engineering ; v. 1163 <BA0022700X>

著者名:

ISBN:

9780819401991 [0819401994]

書誌ID:

BA24342840

子書誌情報

フルテキスト

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書誌詳細

注記:	"Papers presented at the First SPIE Conference on Fringe Pattern Analysis"--Introd Includes bibliographical references and index
主題:	Diffraction patterns--Congresses; Image processing--Congresses; Interferometry--Congresses
言語:	英語

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