X-ray imaging II : 21-22 August 1986, San Diego, California / Larry V. Knight, D. Keith Bowen, chairmen/editors ; cooperating organizations, Institute of Optics/University of Rochester ... [et al.]
- 資料種別:
- 図書
- 出版情報:
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1986
- 形態:
- vi, 149 p. ; 28 cm
- シリーズ名:
- Proceedings / SPIE -- the International Society for Optical Engineering ; v. 691 <BA0022700X>
- 著者名:
- ISBN:
- 9780892527267 [0892527269] (pbk.)
- 書誌ID:
- BA24031170
類似資料:
SPIE--the International Society for Optical Engineering |
SPIE--the International Society for Optical Engineering |
SPIE-the International Society for Optical Engineering | |
SPIE--International Society for Optical Engineering | |
S.P.I.E.-- International Society for Optical Engineering |