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1.

図書
図書
1. Microelectronics manufacturability, yield, and reliability : 20-21 October 1994, Austin, Texas
Barbara Vasquez, Hisao Kawasaki, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash., USA : SPIE, c1994  ix, 348 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 2334
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2.

図書
図書
2. Microelectronics manufacturing and reliability : 21-22 September 1992, San Jose, California
Barbara Vasquez ... [et al.], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash. : SPIE, c1993  x, 258 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 1802
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