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1.

図書

図書
International Symposium on Software Testing and Analysis ; ACM Sigsoft
出版情報: New York, N.Y. : Association for Computing Machinery, c2010  282 p. ; 28 cm
2.

図書

図書
International Symposium on Software Testing and Analysis ; ACM Sigsoft
出版情報: New York, N.Y. : Association for Computing Machinery, c2009  295 p. ; 28 cm
3.

図書

図書
ESEC/FSE Doctoral Symposium ; International Symposium on Software Testing and Analysis
出版情報: New York : Association for Computing Machinery, c2009  40 p. ; 28 cm
4.

図書

図書
International Symposium on Software Testing and Analysis ; ACM Sigsoft
出版情報: New York, N.Y. : Association for Computing Machinery, c2008  287 p. ; 28 cm
5.

図書

図書
Workshop on Defects in Large Software Systems ; International Symposium on Software Testing and Analysis
出版情報: New York : Association for Computing Machinery, c2008  44 p. ; 28 cm
6.

図書

図書
International Symposium on Software Testing and Analysis ; ACM Sigsoft
出版情報: New York, N.Y. : Association for Computing Machinery, c2007  249 p. ; 28 cm
7.

図書

図書
edited by Steven J. Zeil
出版情報: New York, N.Y. : ACM Press, c1996  vii, 294 p. ; 28 cm
シリーズ名: ACM SIGSOFT software engineering notes ; vol.21, no.3 1996
8.

図書

図書
edited by Gregg Rothermel
出版情報: New York, N.Y. : ACM Press, c2004  [10], 285 p. ; 28 cm
9.

図書

図書
International Symposium on Software Testing and Analysis ; ACM Sigsoft
出版情報: New York, N.Y. : ACM Press, c2006  [10], 265, [10] p. ; 28 cm
10.

図書

図書
Workshop on Parallel and Distributed Systems : Testing and Debugging ; International Symposium on Software Testing and Analysis ; ACM Sigsoft
出版情報: New York : Association for Computing Machinery, c2006  78 p. ; 28 cm
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