| 1.
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図書
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sponsored by IEEE Computer Society Technical Committee on Simulation, IEEE Computer Society Technical Committee on Test Technology, Association for Computing Machinery SIGSIM
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| 2.
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図書
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edited by Carol Tong, Anura Jayasumana ; sponsored by IEEE Computer Society Technical Committee on Test Technology
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| 3.
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図書
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sponsored by the IEEE Computer Society Technical Committee on Test Technology, National Tsing Hua University
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| 4.
図書 |
図書
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edited by Anura P. Jayasumana ; sponsored by IEEE Computer Society Technical Committee on Test Technology
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| 5.
図書 |
図書
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sponsored by IEEE Computer Society Test Technology Technical Committee ; in cooperation with Technical Group on Fault Tolerant Systems, IEICE ... [et al.]
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| 6.
図書 |
図書
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sponsored by IEEE Computer Society Test Technology Technical Committee, Computer Chapter of IEEE Singapore Section, Singapore Polytechnic ; in cooperation with National University of Singapore, Nanyang Technological University
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| 7.
図書 |
図書
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sponsored by IEEE Computer Society Technical Committee on Design Automation, IEEE Computer Society Technical Committee on Simulation, IEEE Computer Society Technical Committee on Test Technology
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| 8.
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図書
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sponsored by IEEE Computer Society Technical Committee on Simulation, IEEE Computer Society Technical Committee on Test Technology, ACM SIGSIM ; proceedings editor, Jürgen Becker ; program chair, Mangred Glesner ; workshop char, Rudy Lauwereins
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| 9.
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図書
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sponsored by the IEEE Computer Society's Technical Committee on Test Technology and the VLSI Society of India (VSI)
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| 10.
図書 |
図書
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sponsored by IEEE Computer Society Technical Committee on Simulation, IEEE Computer Society Technical Committee on Test Technology, ACM SIGSIM
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