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1.

図書

図書
Qiming Xin, Robert E. Parks, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, COS--Chinese Optical Society, [and] COEMA--China Optics & Optoelectronic Manufacturers Association ; cooperating organizations, National Natural Science Foundation of China ... [et al]
出版情報: Bellingham, Wash., USA : SPIE, c1998  ix, 354 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3557
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2.

図書

図書
Daxiong Xu, John H. Hong, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, COS--Chinese Optical Society, [and] COEMA--China Optics & Optoelectronic Manufacturers Association ; cooperating organizations, National Natural Science Foundation of China ... [et al.]
出版情報: Bellingham, Wash., USA : SPIE, c1998  v, 130 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3559
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3.

図書

図書
Kam Tai Chan, Shuisheng Jian, Franklin K. Tong, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, COEMA--China Optics & Optoelectronic Manufacturers Association, COS--Chinese Optical Society ; cooperating organizations, National Natural Science Foundation of China ... [et al.]
出版情報: Bellingham, Wash. : SPIE--the International Society for Optical Engineering, c1996  xi, 576 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 2893
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4.

図書

図書
Shuisheng Jian, Franklin K. Tong, Reinhard März, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, COEMA--China Optics & Optoelectronic Manufacturers Association, COS--Chinese Optical Society ; cooperating organizations, National Natural Science Foundation of China ... [et al.]
出版情報: Bellingham, Washington : SPIE, c1998  vii, 354 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3552
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5.

図書

図書
Suning Tang, Xiaomin Ren, chairs/editors ; sponsored and organized by SPIE--the International Society for Optical Engineering, SEU--Southeast University (China), [and] COEMA--China Optics and Optoelectronics Manufacturers Association ; cooperating organizations, Electronic Society, Jiangsu Province (China) [and] Laser and Optical Engineering Society, Jiangsu Province (China)
出版情報: Bellingham, Wash., USA : SPIE, c2001  ix, 270 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4604
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6.

図書

図書
Qin-Yi Tong, Ulrich M. Goesele, chairs/editors ; sponsored and organized by SPIE--the International Society for Optical Engineering, SEU--Southeast University (China), [and] COEMA--China Optics and Optoelectronics Manufacturers Association ; cooperating organizations, Electronic Society, Jiangsu Province (China) [and] Laser and Optical Engineering Society, Jiangsu Province (China)
出版情報: Bellingham, Wash. : SPIE, c2001  xi, 212 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4600
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7.

図書

図書
Junheng Li, James A. Harrington, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, COS--Chinese Optical Society, [and] COEMA--China Optics & Optoelectronic Manufacturers Association ; cooperating organizations, National Natural Science Foundation of China ... [et al.]
出版情報: Bellingham, Wash., USA : SPIE, c1998  vii, 242 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3548
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8.

図書

図書
Hong Liu, Qingming Luo, chairs/editors ; sponsored by China Optics & Optoelectronic Manufacturer's Association [and] Chinese Physical Society [and] SPIE--the International Society for Optical Engineers
出版情報: Bellingham, Wash., USA : SPIE, c2000  xx, 410 p. ; 30 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4224
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9.

図書

図書
Eric G. Lean, Zhiren Tian, Bao Gang Wu, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, COEMA--China Optics & Optoelectronic Manufacturers Association, COS--Chinese Optical Society ; cooperating organizations, National Natural Science Foundation of China ... [et al.]
出版情報: Bellingham, Wash. : SPIE--the International Society for Optical Engineering, c1996  vii, 284 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 2892
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10.

図書

図書
Shou-Qian Ding, Bao Gang Wu, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, COEMA--China Optics & Optoelectronic Manufacturers Association, COS--Chinese Optical Society ; cooperating organizations, National Natural Science Foundation of China ... [et al.]
出版情報: Bellingham, Washington : SPIE, c1998  vii, 250 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3560
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11.

図書

図書
Chuangtian Chen, chair/editor ; sponsored by SPIE--The International Society for Optical Engineering, COS--Chinese Optical Society, COEMA--China Optics & Optoelectronic Manufacturers Association ; cooperating organizations, National Natural Science Foundation of China ... [et al.]
出版情報: Bellingham, Washington : SPIE, c1998  vii, 240 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3556
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12.

図書

図書
Chung-Sheng Li, Robert L. Stevenson, Liwei Zhou, chairs/editors ; sponsored by SPIE--The International Society for Optical Engineering, COEMA--China Optics & Optoelectronic Manufacturers Association, [and] COS--Chinese Optical Society ; cooperating organizations, National Natural Science Foundation of China ... [et al.]
出版情報: Bellingham, Wash. : SPIE, c1996  viii, 328 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 2898
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13.

図書

図書
Liwei Zhou, Chung-Sheng Li, chairs/editors ; sponsored by SPIE--The International Society for Optical Engineering, COS--Chinese Optical Society, COEMA--China Optics & Optoelectronic Manufacturers Association ; cooperating organizations, National Natural Science Foundation of China ... [et al.]
出版情報: Bellingham, Wash. : SPIE, c1998  ix, 460 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3561
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14.

図書

図書
William G.D. Frederick, Junhong Su, Marc Wigdor, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, COEMA--China Optics & Optoelectronic Manufacturers Association, COS--Chinese Optical Society ; cooperating organizations, National Natural Science Foundation of China ... [et al.]
出版情報: Bellingham, Wash., USA : SPIE, c1996  x, 312 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 2894
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目次情報: 続きを見る
Double-band infrared image processing system using rosette scanning / Haifeng Wan ; Zhi Liang ; Qing Zhang ; Xinzhi Su
Real-time measurement of temperature field by colorimetric method / Hua Zhang ; Baojian Liao ; Jiluan Pan
CCD camera application in the investigation of optical materials damage processing / Fei Chen ; Shaoxian Meng
High-sensitivity photoelectric pressure sensor based on a monolithic dual photodiode / Weimin Zheng ; Tianning Cao ; Junxia Qian
High-speed imaging by use of a photoswitch array / Anshi Chen ; Jing Zu
Pseudorandom encoding of fully complex modulation to biamplitude phase modulators / Robert W. Cohn ; Wenyao Liu
Optically coupled quantum well infrared detectors / Wengang Wu ; Liqiu Cui ; De Sheng Jiang ; Wei Liu ; Chunying Song
Study of GaAs/GaAlAs infrared photodectors with novel characteristics / Chun-Xia Du ; Jun Deng ; Qun Li ; Rui Kong ; Dong-Feng Wang ; Chen Xu ; Guang-Di Shen ; Jie Yin
Numerical simulation and analysis of the new 8- to 14-um GaAs/GaAlAs quantum well infrared photodetectors / Bao-Quan Liu
Photoelectric properties of a voltage-tunable two-color quantum well infrared photodetector / Yaohui Zhang ; Ruozhen Wang
Size restrictions of radiation detecting with semiconductor photodetectors / Evgenij A. Salkov ; George S. Svechnikov ; Nikolai M. Krolevets
Research on P+-GexSi1-x/p-Si heterojunction internal photoemission long-wavelength infrared detector / Ruizhong Wang ; Peiyi Chen ; Peihsin Tsien ; Guangli Luo ; Kangli Zheng ; Junming Zhou
Theory of optical transfer function for photodetector arrays / Dazun Zhao ; Yong Zhang ; Hua-Kuang Liu
HgCdTe detector technology at Kunming Institute of Physics / Junhong Su ; Gehong Zeng
Second-generation infrared detectors: present situation and prospects in France / Daniel Amingual ; Francis Bertrand
Influence of growth conditions on the qualities of CdxHg1-xTe (0 x 1) layers grown by MOVPE / Chaowang Liu ; Bingwen Song ; Yue Wang ; Jingyu Wang ; Yudong Mo
Interface properties of HgCdTe passivated with the combination of CdS and ZnS / Jingshao Zhang ; Tianzhu Shen
Collective flip-chip technology for HgCdTe IRFPA / Jean-Luc Tissot ; F. Marion
High-integration CMOS vision chips / Guoyu Wang
Reflectivities and electronic band structure of Hg0.8Cd0.2Te / Runqing Jiang ; Xierong Hu ; Jiaxiong Fang ; Jie Ma
Thermal analysis of thin film resistor arrays for dynamic IR scene simulation / Bin Liu ; Liping Wang ; Baomin Zhang
New type of multijunction thermopile IR detector / Tietun Sun ; Lihui Guo
Uncooled multispectral detectors and their applications / Volkmar Norkus ; Guenter Hofmann ; Christian Schiewe
Improved interconnect circuit for high Tc superconducting microbolometer / Fang Q. Zhou ; Zhihong Mai ; Xin J. Yi
High Tc superconducting microbolometer detector arrays / Xing R. Zhao ; Luqin Liu
Experimental investigation on thermal imaging by a high Tc super conducting microbolometer / Jing Ju
Measurement of noise of photovoltaic HgCdTe and InSb infrared detector / Zhongyun Tian ; Ruoxi Ji ; Shengqiong Lei ; Bo-Qi Gu
Characterization of infrared detectors for space applications / Didier Dantes
Method of using pulse laser to calibrate transient surface temperature detectors / Lieguo Liang ; Hanchang Zhou ; Deheng Pan
Measurement of peak power of laser pulses using avalanche photodiodes / Qianqian Wang ; Jinghai Liu ; Rongfu Xu ; Youna Lin ; Zhiyong Sun
Applications of a new time-frequency analysis in high-G accelerometer dynamic calibration by laser differential Doppler technique / Zhijie Zhang
Gain performance research and analysis of aluminized MCP in third-generation image tube / Jinliang Yan
Study of thermo-optical tunable reflecting filter based on dual interference effect / Bing Zheng ; Zheng Chen
Improving the measuring resolution of CCD by curve fitting / Li Ding ; Songcan Lai ; Xinyi Wu
Influence of reverse bias voltage and light intensity on some properties of position-sensitive detector (PSD) / Ai-Min Lu ; Hong-Xing Yuan ; Anzhi He ; Feng Gao ; Jiaoshu Wang
Characterization of HgCdTe epilayers grown on GaAs(211)B by molecular beam epitaxy / Shida Chen ; Xianzhong He ; Li Lin
Four-unit composite thin film IR detector / Zhen Pang ; Ben-He Jiang ; Huanjun Qi ; Yuejin Ma
Performance prediction and computer simulation of staring thermal imaging systems with OTL96 / Hongbing Fang ; Jian Jiao ; Defu Pi ; Guowei Yan
Bridgman growth and assessment of CdTe and Cd1-yZnyTe crystals / Quanling Yue ; Hua Chen ; Gang Wu
8x8 silicon photodiode matrix module / Dawei He ; Jinggui Lu ; Fuwen Zhang
Experiment and research on the TDI CCD camera / Haining Wang ; Zhonghui Wei
Imaging approach of pyroelectric FPAs using LCDs
Coupling efficiency of metal gratings in a normal incident GaAs/AlGaAs quantum well infrared detector / Yu Yang ; Guanqun Xia ; Shichang Zou ; Xun Wang
Surface pretreatment of LPE HgCdTe epilayer for passivation technology of photodiode array / Yi Li ; Song He
Ultraweak bioluminescence imaging and image processing / Tianming Chen ; Susheng Wang ; Qin Li ; Xin Yu
Digital CMOS active pixel image sensor for multimedia applications / Zhimin Zhou ; Bedabrata Pain ; Jason C. Woo ; Eric R. Fossum
Complete range of lightweight cryocoolers for integrated Dewar assembly (IDA) / Patrick Curlier
Detectivity limit of the LWIR photoconductive HgCdTe detector / Wei-Jian Zheng
Double-band infrared image processing system using rosette scanning / Haifeng Wan ; Zhi Liang ; Qing Zhang ; Xinzhi Su
Real-time measurement of temperature field by colorimetric method / Hua Zhang ; Baojian Liao ; Jiluan Pan
CCD camera application in the investigation of optical materials damage processing / Fei Chen ; Shaoxian Meng
15.

図書

図書
Frederick Y. Wu, Shenghua Ye, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, COEMA--China Optics & Optoelectronic Manufacturers Association, COS--Chinese Optical Society ; cooperating organizations, National Natural Science Foundation of China ... [et al.]
出版情報: Bellingham, Wash. : SPIE, c1996  xi, 716 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 2899
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目次情報: 続きを見る
Application of laser diode fiber alignment in measuring large-scale perpendicularity and parallelism / Qun Hao ; Rong Liang ; Mang Cao ; Dacheng Li
Dynamic error compensation of coordinate measuring machines for fast probing / Yuhai Mu ; Chensong Dong ; Jingbin Guo ; Guoxiong Zhang
Development of an optical probe for profile inspection of mirror surfaces / Wei Gao ; Satoshi Kiyono
Study on profile measurement of extruding tire tread by laser / Liangcai Wang ; Wanping Zhang ; Weihu Zhu
Detection of random motion of the spherical object center by the photoelectric method / Jie Sun ; Shanru Guo
System analysis of bar code laser scanner / Jian Wang ; Zhaofeng Chen ; Zukang Lu
Measurement of geometrical aberration by holographic gratings / Guilin Sun ; Xiaoxing Zhang ; Ling Du
Study of measurement method for gear contact patterns / Duogang Ran ; Zhimin Lu ; Xusheng Zhai
High-precision static and dynamic angular measurements with a ring laser gyro / Ludi Zheng ; Quanan Tang ; Xinyu Ma ; Yanshen Zhang
Free-form registration for 3D shape comparison / K. H. Lau ; Kim Chew Ng
Uniqueness of shape recovery of a polyhedron from a single shading image / Jun Yang ; Dili Zhang ; Noboru Ohnishi ; Noboru Sugie
High-speed computer color testing and matching system online / Jianbai Li ; Anging Zao ; Changyu Lei ; Xuegen Chan ; Xiaoyue Li ; Xiaoling Zhang ; Aihan Ying ; Xiong Wan
Scanning mirror uniformity optimum control / Congliang Guo
Study on an optolectronic type of electric-current transducer system: for measuring primary electric current in a power system / Fuying Li ; Xiaochun Liang ; Xianwei Dai ; Lingxue Kong ; Zhonghua Wang ; Changyin Wang
Problem of phase unwrapping for fringe pattern overlaid with random noise and segmented discontinuity / X. Peng ; S. M. Zhu ; S. H. Ye ; Hans J. Tiziani
Computer-simulative calculation and display for illumination system / Weibin Shi ; Xiangxi Chen ; Peili Zhu
Novel quantitative test method of laser range finder for range measurement: computerized instrument test method / Zhibin Chen
Measurement of gear-tooth instantaneous deformation by optical method / Jianfeng Li ; Wenxin Liu ; Chuanmin Zhu ; Zhiren Tian ; Junqing Zhao
Television image transmission from close quarters of a high-temperature object / Zhao-Xiang Ge ; Jingni Su ; Qingfeng Min
Photoelectric automatic three-dimensional straightness instrument / Ziling Jiao ; Xin Zeng
New concept for roughness measurement: mean surface / Chunlong Wei ; Ming-Yi Chen ; Zhijiang Wang
Passive IR remote sensing system for atmospheric pollution monitoring / Xiaolin Zhang ; Yuwen Shu ; Jun Yan
Industrial online measuring system for the length and width of steel plates with CCD cameras / Saixian He ; Duiyan He ; Sidong Zhong ; Xinhua Wang
New method of real-time measurement of displacement and vibration for engineering structures / Junsheng Feng ; Zhengyuan Cao
Automatic 360-deg profilometry of a 3D object using a shearing interferometer and virtual grating / Yonglin Zhang ; Guixue Bu
Rotating-mirror high-speed-camera control system / Ping Gao ; Deben Liu ; Jichang Zhang
Improved signal processing method for dynamically measuring radius of large precision centrifuge / Hongzhi Zhao ; Lin Wang ; Yang Zhao
Brief introduction of straightness curvature measurement system for straight tube using tangent method and error analysis / Ai-Min Lu ; Hong-Xing Yuan ; Cheng-Yao Qian ; Anzhi He ; Feng Liu
Study of resolution improvement of dimension measurement by linear CCD image sensor / Wenge Zhang ; Hangchang Zhou
Tracking of carrier-coded fringe pattern for the automatic measurement of 3D object shapes / Jinggang Zhong ; Ming Wang
Automated fringe analysis profilometry of 3D diffuse objects
Intelligent neural network classifier for automatic testing / Baoxing Bai ; Heping Yu
Advancement of black-spot method for testing veiling glare / Fengchun Li ; Guoyu Zhang ; Yujin Gao
Measurements of vector displacement and its derivatives for composite materials by laser holographic interferometry / Guoheng Chen ; Longjing Yu ; Fengmin Liu
Selective image extraction by synthesis of the coherence function using two-dimensional optical lock-in amplifier with microchannel spatial light modulator / Zuyuan He ; Toru Okugawa ; Naohisa Mukohzaka ; Kazuo Hotate
Automatic inspection of nonsmooth surface displacements by interferometer with low-coherent illumination / Igor P. Gurov ; Gang Li
Heterodyne interferometry with surface selectivity and fast response / Junjiang Zhang
Absolute calibration of interpolation errors in interferometers / Zongato Ge
New method for measuring the properties of optical systems with micro-optic components / Wei-Jian Tian ; Jianwen Yang ; Zhengkang Bao ; Hedong Zhang ; Bo Chen ; Lurong Guo
Laser application in measuring the dynamic deformation of gear teeth / Qi Gao ; Zhao-Tong Wu
Laser scanning dynamic measurement of the curved surface / Xin Hong ; Wenxue Zheng
System of measuring micrographs with high accuracy / Huijie Zhao
Laser-generated ultrasound for measuring mechanical properties of materials / Xingeng Zhou ; Cunfu He
Compensation for periodic errors in laser interferometer of phase subdivision model / Shuan Qi ; Wenyi Deng ; Gang Liu
Complementary of phase compensation method to measure gap of twist nematic cells / Xibin Shao ; Zongkai Wang ; Ruipeng Sun ; Tao Yu ; Zhenjun Ma ; Ximin Huang
Research of the technology for edge checkout using laser half focus / Haibao Lu ; Tingzheng Shen ; Yueke Wang ; Rui Huang
Fourier transform moire deflectometry for the automatic measurement of phase objects
Nonlinear control of double Fabry-Perot interferometer / Ruogu Zhu ; Xuwu Chen
Researching the technology of high-accuracy camshaft measurement / Wei Chen ; Yong-Le Chen ; Hong Wang ; Hai-Yang Liao
Intellectualization tendency and its method of optical measuring equipment / Shou-Cheng Cheng ; Jinyu Wang
Theoretical analysis of the characteristics of a laser-scanned measuring system / Zhiyong An ; Congzhou Zhang ; Chengzhi Li
Research on a laser position and dimension online inspection system / Tiejun Zhao ; Xiaoman Wang
Research on a noncontact steel product dynamic online inspection instrument / Song Lu
Theoretical research on an infrared dynamic autodetecting system / Huilin Jiang
Research on noncontact photoelectric integrated flexible synthetic measuring technology
Research on flywheel and gear-ring assembly photoautomatic measuring machine
Research on the application of laser inspection in a three-coordinate measuring machine
Research on a semiconductor laser-scanned multifunctional online inspection system / Gouyu Zhang ; Xiping Xu
Application of a semiconductor laser in an optoelectronic system
Research on photoelectric autoinspecting system of formal and positional errors / Lu Song
Research on photoelectric displacement online measuring technology / Jandong Yang
Research on a photoelectronic two-dimensional autoinspecting system / Jiandong Yang
Bidirectional shearing interferometer for collimation testing / Zhiwen Yang ; Wei An
Measurement of scanning prism by laser Haidinger interference / Xianglan Xue
Choice of best double-ringed aperture diaphragm by measurement of optical transfer function / Jue Wang ; Yanying Zhu ; Dexin Zhao
Online optical measurement and monitoring of yarn density in woven fabrics / Hamed Sari-Sarraf ; James S. Goddard
Mathematical model for optoelectronic detection of the property of common axis of active-following axles / Jiaxiong Ye ; Youbin Fang ; Rongfeng Guan
Real-time signal processing system for noncontact measurement of liquid-level position / Lei Zhu ; Zhangou Li
Research on optoelectronic technology for detecting rifling of artillery online / Hong Ma ; Ying Che ; Yuzhi Shen
Real-time scheme of online measurement of screw-thread steel bars / Bingrong Zhang ; Zhiying Liu ; Wenyi Chen
Quality assurance of texture web materials using cellular neural networks / Predrag R. Bakic ; Nenad S. Vujovic ; Dragana P. Brzakovic
Wear and breakage monitoring of cutting tools by an optical method: theory / Yongqing Zhang ; Fangrong Chen ; Yao Wang
Laser-scanning device used in a space-encoding range finder / Xiao-Yang Yu ; Jian Zhang ; Liying Wu ; Xifu Qiang
Using focused light to determine the refractive index of materials by total internal reflection / Hui Li ; Shusen Xie ; Yishen Qiu
Neural-network-based noncontact measurement system / Limin Zhou ; Abdul Waheed ; Bingheng Lu
Automatic correction of the dividing errors of radial grating by photoelectric technology / Yongcai Yang ; Lin Cheng ; Yongsheng He
Study on vision recognition, position, and orientation in a flexible automatic coordinate measuring system / Yi-Zhong Wang ; Xiang-Jun Wang ; Shenghua Ye
Homogeneity measurement using an infrared interferometer / Lei Chen ; Jinbang Chen ; Shenwang Huang ; Guoyou Jin
Infrared phase-shifting digital interferometer
Studies on system and measuring method of far-field beam divergency in near field by Ronchi ruling / Chenbo Zhou ; Li Yang ; Wenli Ma ; Peiying Yan ; Tianquan Fan ; Shangfeng He
Particle-field measurement in flame flow and data processing / Ge Yuan ; Shunli Ma ; Zhaowen Zhang ; Yuan Jin
Comprehensive test of low-level-light image intensifiers / Yu Liu ; Yueqin Ma ; Junyan Jiang ; Jifang Shi
Research about CCD infrared three-color temperature sensor / Xinmin Qi ; Juning Zhou ; Gongxin Yu
Analysis of a new piezoelectric multiple-beam-scanning method / Bing Ye ; Yi Hu
Optical pulse with time-space asymmetry in saturable self-focusing Kerr medium / Jianqing Li ; Guosheng Zhou ; Bojun Yang
Analysis of light pulse transmission and dispersion compensation with p parameter / Zhiua Zhang ; Tao Zeng
Laser interference real-time measurement of large attack angle of wind-tunnel model / Hua Deng ; Bing Liu ; Shi-Jie Zhao ; Guoxi Fang
Optical method for measuring electric power / Junliang Zhao ; Jidong Chen ; Song Qiao
Composite optical modulation of electro-optical effect with magneto-optical effect and application / Xia Zhao
Principle of AOM laser heterodyne measuring and its instrument / Fengzhou Fang ; Yiqun Zhang ; Dingwen Zhou
Modulation transfer function measuring of charge-coupled devices using laser speckle / Minghua Liu ; Wenlong Zhen ; Yinzhong Liang ; Mozhi Yu ; Pingan He ; Changjun Cheng
High-speed cinematography in the investigation of nonlinear oscillation of vibration mill / Shulin Wang ; Yiqing Hu ; Dongsheng Chu ; Meiqing Liu ; Qiuzhi Gao
Particle sizing of coal mine dust by pattern recognition of laser diffraction / Yonglin Zhao ; Zhengchao Dong
Topographic inspection of the soft and smooth surface: topographic inspection of the cornea / Liqing He ; Song-Lin Zhuang ; Xiangning Li ; Mengchao Li ; Zijian Zhou
High-speed autoverifying technology for printed wiring boards / Moritoshi Ando ; Hiroshi Oka ; Hideo Okada ; Yorihiro Sakashita ; Nobumi Shibutani
Agricultural produce grading and sorting system using color CCD and new color identification algorithm / Dongsheng Wang ; Jizuo Zou ; Yunping Yang ; Jianhua Dong ; Yuanxiang Zhang
Water-quality inspection by analyzing motionality of fish / Sae-Jin Park ; Kyung-Soo Kim ; Hyung-Il Choi ; Hyung-Ki Lee ; Young-Ho Lee
Pulse-heating infrared thermography nondestructive testing technique / Mingcheng Zong ; Jianxin Zhang ; Yan Zhao
Method of establishing a general mathematical model of structured light 3D vision / Guang-Jun Zhang
Three-dimensional rigid body line displacement and 3D rigid body angle displacement measurements / Jian Zhou ; Hong Zhao ; Feng Tian ; Yushan Tan
Free-form object modeling and inspection / Zhibin Lei ; Hakan Civi ; David B. Cooper
Volumetric segmentation of range images for printed circuit board inspection / Erik R. van Dop ; P. P. Regtien
Calibration method of parallel projection beams for 3D profile measurement / Shuo-Jen Lee ; Tienjung Fan
Solder-paste inspection by structured light methods based on phase measurement / Luigi di Stefano ; Frank Boland
Application of laser diode fiber alignment in measuring large-scale perpendicularity and parallelism / Qun Hao ; Rong Liang ; Mang Cao ; Dacheng Li
Dynamic error compensation of coordinate measuring machines for fast probing / Yuhai Mu ; Chensong Dong ; Jingbin Guo ; Guoxiong Zhang
Development of an optical probe for profile inspection of mirror surfaces / Wei Gao ; Satoshi Kiyono
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