close
1.

図書

図書
[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]
出版情報: Washington, D.C. : International Test Conference, c2004  xvi, 1459 p. ; 28 cm
所蔵情報: loading…
2.

図書

図書
[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]
出版情報: Washington, D.C. : International Test Conference, c2003  xvi, 1334 p. ; 28 cm
所蔵情報: loading…
3.

図書

図書
sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section
出版情報: Washington, D.C. : International Test Conference, c2002  xvi, 1250 p. ; 29 cm
所蔵情報: loading…
4.

図書

図書
sponsored by IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Council
出版情報: Los Alamitos, Calif. : IEEE Computer Society, c2001  xiii, 468 p. ; 23 cm
所蔵情報: loading…
5.

図書

図書
sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section
出版情報: Washington, D.C. : International Test Conference, c2001  xiv, 1201 p. ; 29 cm
所蔵情報: loading…
6.

図書

図書
edited by Robert Aitken ... [et al.] ; sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC), the IEEE Computer Society Technical Committee on Fault-Tolerant Computing(TCFTC)
出版情報: Los Alamitos, Calif. : IEEE Computer Society, c2005  xii, 602 p. ; 23 cm
所蔵情報: loading…
7.

図書

図書
sponsored by Test Technology Technical Council of IEEE Computer Society ; in cooperation with Technical Committee on Fault Tolerant Computing of CCF National Natural Science Foundation of China (NSFC)
出版情報: Los Alamitos, Calif. : IEEE Computer Society, c2003  xxi, 517 p. ; 28 cm
所蔵情報: loading…
8.

図書

図書
edited by C. Metra ... [et al.] ; sponsored by IEEE Computer Society Test Technology Technical Council
出版情報: Los Alamitos, Calif. : IEEE Computer Society, 2003  xiii, 229 p. ; 28 cm
所蔵情報: loading…
9.

図書

図書
sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Council
出版情報: Los Alamitos, CA. ; Tokyo : IEEE Computer Society, c1998  xiii, 405 p. ; 23 cm
所蔵情報: loading…
10.

図書

図書
Asian Test Symposium ; IEEE Computer Society ; IEEE Computer Society. Test Technology Technical Council
出版情報: Los Alamitos, Calif. : IEEE Computer Society, c2005  xxxv, 476 p. ; 28 cm
所蔵情報: loading…
文献の複写および貸借の依頼を行う
 文献複写・貸借依頼