1.
図書 |
[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]
|
|||||
2.
図書 |
[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]
|
|||||
3.
図書 |
sponsored by IEEE Computer Society Technical Council on Test Technology , IEEE Computer Society Technical Committee on Design Automation
|
|||||
4.
図書 |
IEEE Computer Society Test Technology Technical Council ; co-sponsored by National Tsing Hua University
|
|||||
5.
図書 |
sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Council
|
|||||
6.
図書 |
sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section
|
|||||
7.
図書 |
sponsored by IEEE Computer Society Test Technology Technical Council
|
|||||
8.
図書 |
sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section
|
|||||
9.
図書 |
sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with IEEE Solid State Circuits Society ; [edited by Tom Wik, Adit Singh, and Rochit Rajsuman]
|
|||||
10.
図書 |
edited by R. Rajsuman, T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with The IEEE Solid-State Circuits Society
|
文献の複写および貸借の依頼を行う
文献複写・貸借依頼
文献複写・貸借依頼